| Silicon surface morphologies after femtosecond laser irradiation BR Tull, JE Carey, E Mazur, JP McDonald, SM Yalisove MRS bulletin 31 (8), 626-633, 2006 | 227 | 2006 |
| Femtosecond laser micromachining of a single-crystal superalloy Q Feng, YN Picard, H Liu, SM Yalisove, G Mourou, TM Pollock Scripta Materialia 53 (5), 511-516, 2005 | 172 | 2005 |
| Surface and grain boundary segregation in relation to intergranular fracture: boron and sulfur in Ni/sub 3/Al CL White, CT Liu, RA Padgett, SM Yalisove Scr. Metall.;(United States) 18 (12), 1984 | 172 | 1984 |
| Multilayer rippled structure of the nial (110) surface: a medium energy ion scattering study SM Yalisove, WR Graham Surface Science 183 (3), 556-564, 1987 | 117 | 1987 |
| Epitaxial orientation and morphology of thin CoSi2 films grown on Si(100): Effects of growth parameters SM Yalisove, RT Tung, D Loretto Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 7 (3 …, 1989 | 104 | 1989 |
| Medium-energy ion-scattering analysis of the Cu (110) surface M Copel, T Gustafsson, WR Graham, SM Yalisove Physical Review B 33 (12), 8110, 1986 | 85 | 1986 |
| Effect of hydrogen on surface roughening during Si homoepitaxial growth DP Adams, SM Yalisove, DJ Eaglesham Applied physics letters 63 (26), 3571-3573, 1993 | 83 | 1993 |
| Evidence for a dimer reconstruction at a metal-silicon interface D Loretto, JM Gibson, SM Yalisove Physical review letters 63 (3), 298, 1989 | 82 | 1989 |
| Femtosecond laser machining of single-crystal superalloys through thermal barrier coatings Q Feng, YN Picard, JP McDonald, PA Van Rompay, SM Yalisove, ... Materials Science and Engineering: A 430 (1-2), 203-207, 2006 | 81 | 2006 |
| Femtosecond laser ablation regimes in a single-crystal superalloy S Ma, JP McDonald, B Tryon, SM Yalisove, TM Pollock Metallurgical and materials transactions A 38 (13), 2349-2357, 2007 | 79 | 2007 |
| Growth anisotropy and self-shadowing: A model for the development of in-plane texture during polycrystalline thin-film growth OP Karpenko, JC Bilello, SM Yalisove Journal of applied physics 82 (3), 1397-1403, 1997 | 79 | 1997 |
| Analysis of thin film stress measurement techniques SG Malhotra, ZU Rek, SM Yalisove, JC Bilello Thin Solid Films 301 (1-2), 45-54, 1997 | 79 | 1997 |
| Pulsed laser ignition of reactive multilayer films YN Picard, DP Adams, JA Palmer, SM Yalisove Applied Physics Letters 88 (14), 2006 | 76 | 2006 |
| Surface roughening during low temperature Si (100) epitaxy OP Karpenko, SM Yalisove, DJ Eaglesham Journal of applied physics 82 (3), 1157-1165, 1997 | 73 | 1997 |
| Ion scattering study of the lithium induced reconstruction of Cu (110) M Copel, WR Graham, T Gustafsson, S Yalisove Solid state communications 54 (8), 695-699, 1985 | 73 | 1985 |
| Multilayer relaxations of Ni (110): New medium energy ion scattering results SM Yalisove, WR Graham, ED Adams, M Copel, T Gustafsson Surface Science 171 (2), 400-414, 1986 | 72 | 1986 |
| Femtosecond pulsed laser direct write production of nano-and microfluidic channels JP McDonald, VR Mistry, KE Ray, SM Yalisove Applied Physics Letters 88 (18), 2006 | 67 | 2006 |
| Microstructure and residual stress of very thin Mo films DP Adams, LJ Parfitt, JC Bilello, SM Yalisove, ZU Rek Thin Solid Films 266 (1), 52-57, 1995 | 64 | 1995 |
| Nanostructured chromium nitride films with a valley of residual stress ZB Zhao, ZU Rek, SM Yalisove, JC Bilello Thin Solid Films 472 (1-2), 96-104, 2005 | 59 | 2005 |
| Interfacial and surface energetics of CoSi2 DP Adams, SM Yalisove, DJ Eaglesham Journal of applied physics 76 (9), 5190-5194, 1994 | 58 | 1994 |
