| Tutorial: Crystal orientations and EBSD—Or which way is up? TB Britton, J Jiang, Y Guo, A Vilalta-Clemente, D Wallis, LN Hansen, ... Materials Characterization 117, 113-126, 2016 | 190 | 2016 |
| Heavy Alkali Treatment of Cu(In,Ga)Se2 Solar Cells: Surface versus Bulk Effects S Siebentritt, E Avancini, M Bär, J Bombsch, E Bourgeois, S Buecheler, ... Advanced Energy Materials 10 (8), 1903752, 2020 | 135 | 2020 |
| Rubidium distribution at atomic scale in high efficient Cu (In, Ga) Se2 thin-film solar cells A Vilalta-Clemente, M Raghuwanshi, S Duguay, C Castro, E Cadel, ... Applied Physics Letters 112 (10), 2018 | 76 | 2018 |
| On the composition of microtwins in a single crystal nickel-based superalloy D Barba, S Pedrazzini, A Vilalta-Clemente, AJ Wilkinson, MP Moody, ... Scripta Materialia 127, 37-40, 2017 | 71 | 2017 |
| Controlling the crystal structure of Ni nanoparticles by the use of alkylamines S Mourdikoudis, K Simeonidis, A Vilalta-Clemente, F Tuna, I Tsiaoussis, ... Journal of magnetism and magnetic materials 321 (18), 2723-2728, 2009 | 71 | 2009 |
| A mechanistic study of the temperature dependence of the stress corrosion crack growth rate in SUS316 stainless steels exposed to PWR primary water M Meisnar, A Vilalta-Clemente, M Moody, K Arioka, S Lozano-Perez Acta Materialia 114, 15-24, 2016 | 67 | 2016 |
| Influence of RbF post deposition treatment on heterojunction and grain boundaries in high efficient (21.1%) Cu (In, Ga) Se2 solar cells M Raghuwanshi, A Vilalta-Clemente, C Castro, S Duguay, E Cadel, ... Nano Energy 60, 103-110, 2019 | 49 | 2019 |
| Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain mapping and dislocation distributions in InAlN … A Vilalta-Clemente, G Naresh-Kumar, M Nouf-Allehiani, P Gamarra, ... Acta Materialia 125, 125-135, 2017 | 49 | 2017 |
| Using transmission Kikuchi diffraction to study intergranular stress corrosion cracking in type 316 stainless steels M Meisnar, A Vilalta-Clemente, A Gholinia, M Moody, AJ Wilkinson, ... Micron 75, 1-10, 2015 | 46 | 2015 |
| Principles of Atomic Force Microscopy A Vilalta-Clemente, A Gloystein Physics if Advanced Materials Winter School, 1-8, 2008 | 43* | 2008 |
| Measurement of probability distributions for internal stresses in dislocated crystals AJ Wilkinson, E Tarleton, A Vilalta-Clemente, J Jiang, TB Britton, ... Applied Physics Letters 105 (18), 2014 | 39 | 2014 |
| Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets AJ Wilkinson, DM Collins, Y Zayachuk, R Korla, A Vilalta-Clemente Ultramicroscopy 196, 88-98, 2019 | 32 | 2019 |
| The structure of InAlN/GaN heterostructures for high electron mobility transistors A Vilalta‐Clemente, MA Poisson, H Behmenburg, C Giesen, M Heuken, ... physica status solidi (a) 207 (5), 1105-1108, 2010 | 31 | 2010 |
| Understanding Corrosion and Hydrogen Pickup of Zirconium Fuel Cladding Alloys: The Role of Oxide Microstructure J Hu, B Setiadinata, T Aarholt, A Garner, A Vilalta-Clemente, J Partezana, ... Porosity, Suboxides, and Second-Phase Particles, Zirconium in the Nuclear …, 2018 | 30 | 2018 |
| Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction G Naresh-Kumar, A Vilalta-Clemente, H Jussila, A Winkelmann, G Nolze, ... Scientific Reports 7 (1), 10916, 2017 | 27 | 2017 |
| Imaging and identifying defects in nitride semiconductor thin films using a scanning electron microscope G Naresh‐Kumar, B Hourahine, A Vilalta‐Clemente, P Ruterana, ... physica status solidi (a) 209 (3), 424-426, 2012 | 25 | 2012 |
| Optical properties of InN grown on Si (111) substrate E Sakalauskas, P Schley, J Räthel, TA Klar, R Müller, J Pezoldt, K Tonisch, ... physica status solidi (a) 207 (5), 1066-1069, 2010 | 21 | 2010 |
| Multicharacterization approach for studying InAl (Ga) N/Al (Ga) N/GaN heterostructures for high electron mobility transistors G Naresh-Kumar, A Vilalta-Clemente, S Pandey, D Skuridina, ... AIP Advances 4 (12), 2014 | 20 | 2014 |
| Diffraction effects and inelastic electron transport in angle‐resolved microscopic imaging applications A Winkelmann, G Nolze, S Vespucci, G Naresh‐Kumar, C Trager‐Cowan, ... Journal of Microscopy 267 (3), 330-346, 2017 | 17 | 2017 |
| Electrical properties of extended defects in III-nitrides A Minj, D Cavalcoli, GRM Popuri, A Vilalta-Clemente, P Ruterana, ... Acta Materialia 89, 290-297, 2015 | 15 | 2015 |
