Xavier Colonna de Lega
Xavier Colonna de Lega
Zygo Corporation
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TítuloCitado porAño
Determination of fringe order in white-light interference microscopy
P de Groot, XC de Lega, J Kramer, M Turzhitsky
Applied optics 41 (22), 4571-4578, 2002
2402002
Signal modeling for low-coherence height-scanning interference microscopy
P de Groot, XC de Lega
Applied Optics 43 (25), 4821-4830, 2004
1732004
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,271,918, 2007
1662007
Interferometry method and system including spectral decomposition
XC De Lega, P De Groot
US Patent 7,636,168, 2009
1572009
Infrared scanning interferometry apparatus and method
XC De Lega, P De Groot, LL Deck
US Patent 6,195,168, 2001
1272001
Generating model signals for interferometry
XC De Lega
US Patent 7,619,746, 2009
1202009
Interpreting interferometric height measurements using the instrument transfer function
P de Groot, XC de Lega
Fringe 2005, 30-37, 2006
912006
Optical systems for measuring form and geometric dimensions of precision engineered parts
P De Groot, XC De Lega, D Grigg, J Biegen
US Patent 6,822,745, 2004
882004
Interferometric optical systems having simultaneously scanned optical path length and focus
PJ De Groot, XC De Lega, S Balasubramaniam
US Patent 7,012,700, 2006
862006
Interferometric optical systems having simultaneously scanned optical path length and focus
PJ De Groot, XC De Lega, S Balasubramaniam
US Patent 7,012,700, 2006
862006
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,106,454, 2006
852006
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,106,454, 2006
852006
Triangulation methods and systems for profiling surfaces through a thin film coating
PJ De Groot, XC De Lega
US Patent 7,292,346, 2007
832007
Scanning interferometry for thin film thickness and surface measurements
PJ De Groot, XC De Lega
US Patent 7,324,210, 2008
822008
Interferometer and method for measuring characteristics of optically unresolved surface features
P De Groot, MJ Darwin, RT Stoner, GM Gallatin, XC De Lega
US Patent 7,324,214, 2008
802008
Interferometer for determining characteristics of an object surface
XC De Lega, P De Groot
US Patent 7,446,882, 2008
792008
Interferometer for determining characteristics of an object surface, including processing and calibration
XC De Lega, P De Groot
US Patent 7,428,057, 2008
722008
Optical interferometry for measurement of the geometric dimensions of industrial parts
P de Groot, J Biegen, J Clark, XC de Lega, D Grigg
Applied Optics 41 (19), 3853-3860, 2002
712002
Processing of Non-stationary Interference Patterns: Adapted Phase-shifting Algorithms and Wavelet Analysis: Application to Dynamic Deformation Measurements by Holographic and …
XC de Lega
Verlag nicht ermittelbar, 1997
71*1997
Interferometer with multiple modes of operation for determining characteristics of an object surface
XC De Lega, P De Groot
US Patent 7,616,323, 2009
682009
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