Xavier Colonna de Lega
Xavier Colonna de Lega
Zygo Corporation
Verified email at zygo.com - Homepage
TitleCited byYear
Determination of fringe order in white-light interference microscopy
P de Groot, XC de Lega, J Kramer, M Turzhitsky
Applied optics 41 (22), 4571-4578, 2002
2412002
Signal modeling for low-coherence height-scanning interference microscopy
P de Groot, XC de Lega
Applied Optics 43 (25), 4821-4830, 2004
1752004
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,271,918, 2007
1692007
Interferometry method and system including spectral decomposition
XC De Lega, P De Groot
US Patent 7,636,168, 2009
1612009
Infrared scanning interferometry apparatus and method
XC De Lega, P De Groot, LL Deck
US Patent 6,195,168, 2001
1282001
Generating model signals for interferometry
XC De Lega
US Patent 7,619,746, 2009
1272009
Interpreting interferometric height measurements using the instrument transfer function
P De Groot, XC de Lega
Fringe 2005, 30-37, 2006
942006
Interferometric optical systems having simultaneously scanned optical path length and focus
PJ De Groot, XC De Lega, S Balasubramaniam
US Patent 7,012,700, 2006
892006
Interferometric optical systems having simultaneously scanned optical path length and focus
PJ De Groot, XC De Lega, S Balasubramaniam
US Patent 7,012,700, 2006
892006
Optical systems for measuring form and geometric dimensions of precision engineered parts
P De Groot, XC De Lega, D Grigg, J Biegen
US Patent 6,822,745, 2004
892004
Triangulation methods and systems for profiling surfaces through a thin film coating
PJ De Groot, XC De Lega
US Patent 7,292,346, 2007
852007
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,106,454, 2006
852006
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,106,454, 2006
852006
Scanning interferometry for thin film thickness and surface measurements
PJ De Groot, XC De Lega
US Patent 7,324,210, 2008
832008
Interferometer for determining characteristics of an object surface
XC De Lega, P De Groot
US Patent 7,446,882, 2008
822008
Processing of Non-stationary Interference Patterns: Adapted Phase-shifting Algorithms and Wavelet Analysis: Application to Dynamic Deformation Measurements by Holographic and …
XC de Lega
Verlag nicht ermittelbar, 1997
82*1997
Interferometer and method for measuring characteristics of optically unresolved surface features
P De Groot, MJ Darwin, RT Stoner, GM Gallatin, XC De Lega
US Patent 7,324,214, 2008
802008
Processing of Non-stationary Interference Patterns: Adapted Phase-shifting Algorithms and Wavelet Analysis: Application to Dynamic Deformation Measurements by Holographic and …
XC de Lega
Verlag nicht ermittelbar, 1997
77*1997
Processing of Non-stationary Interference Patterns: Adapted Phase-shifting Algorithms and Wavelet Analysis: Application to Dynamic Deformation Measurements by Holographic and …
XC de Lega
Verlag nicht ermittelbar, 1997
77*1997
Interferometer for determining characteristics of an object surface, including processing and calibration
XC De Lega, P De Groot
US Patent 7,428,057, 2008
732008
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