Xavier Colonna de Lega
Xavier Colonna de Lega
Zygo Corporation
Verified email at zygo.com - Homepage
Title
Cited by
Cited by
Year
Determination of fringe order in white-light interference microscopy
P de Groot, XC de Lega, J Kramer, M Turzhitsky
Applied optics 41 (22), 4571-4578, 2002
2452002
Signal modeling for low-coherence height-scanning interference microscopy
P de Groot, XC de Lega
Applied Optics 43 (25), 4821-4830, 2004
1882004
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,271,918, 2007
1682007
Interferometry method and system including spectral decomposition
XC De Lega, P De Groot
US Patent 7,636,168, 2009
1572009
Infrared scanning interferometry apparatus and method
XC De Lega, P De Groot, LL Deck
US Patent 6,195,168, 2001
1302001
Generating model signals for interferometry
XC De Lega
US Patent 7,619,746, 2009
1232009
Interpreting interferometric height measurements using the instrument transfer function
P De Groot, XC de Lega
Fringe 2005, 30-37, 2006
1042006
Interferometric optical systems having simultaneously scanned optical path length and focus
PJ De Groot, XC De Lega, S Balasubramaniam
US Patent 7,012,700, 2006
1002006
Interferometric optical systems having simultaneously scanned optical path length and focus
PJ De Groot, XC De Lega, S Balasubramaniam
US Patent 7,012,700, 2006
1002006
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,106,454, 2006
872006
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,106,454, 2006
872006
Optical systems for measuring form and geometric dimensions of precision engineered parts
P De Groot, XC De Lega, D Grigg, J Biegen
US Patent 6,822,745, 2004
862004
Scanning interferometry for thin film thickness and surface measurements
PJ De Groot, XC De Lega
US Patent 7,324,210, 2008
852008
Processing of Non-stationary Interference Patterns: Adapted Phase-shifting Algorithms and Wavelet Analysis: Application to Dynamic Deformation Measurements by Holographic and …
XC de Lega
Verlag nicht ermittelbar, 1997
85*1997
Interferometer and method for measuring characteristics of optically unresolved surface features
P De Groot, MJ Darwin, RT Stoner, GM Gallatin, XC De Lega
US Patent 7,324,214, 2008
842008
Triangulation methods and systems for profiling surfaces through a thin film coating
PJ De Groot, XC De Lega
US Patent 7,292,346, 2007
812007
Processing of Non-stationary Interference Patterns: Adapted Phase-shifting Algorithms and Wavelet Analysis: Application to Dynamic Deformation Measurements by Holographic and …
XC de Lega
Verlag nicht ermittelbar, 1997
80*1997
Processing of Non-stationary Interference Patterns: Adapted Phase-shifting Algorithms and Wavelet Analysis: Application to Dynamic Deformation Measurements by Holographic and …
XC de Lega
Verlag nicht ermittelbar, 1997
80*1997
Interferometer for determining characteristics of an object surface
XC De Lega, P De Groot
US Patent 7,446,882, 2008
772008
Interferometer for determining characteristics of an object surface, including processing and calibration
XC De Lega, P De Groot
US Patent 7,428,057, 2008
772008
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