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Stefano Selci
Stefano Selci
Senior scientist at IFN-CNR
Verified email at cnr.it - Homepage
Title
Cited by
Cited by
Year
Differential reflectivity of Si (111) 2× 1 surface with polarized light: a test for surface structure
P Chiaradia, A Cricenti, S Selci, G Chiarotti
Physical review letters 52 (13), 1145, 1984
2641984
Classification of M1/M2-polarized human macrophages by label-free hyperspectral reflectance confocal microscopy and multivariate analysis
AR Francesca R. Bertani, Pamela Mozetic, Marco Fioramonti, Michele Iuliani ...
Scientific Reports 7 (8965), 8965-1 8965-9, 2017
2292017
Surface differential reflectivity spectroscopy of semiconductor surfaces
S Selci, F Ciccacci, G Chiarotti, P Chiaradia, A Cricenti
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 5 (3 …, 1987
1211987
Molecular structure of DNA by scanning tunneling microscopy
A Cricenti, S Selci, AC Felici, R Generosi, E Gori, W Djaczenko, ...
Science 245 (4923), 1226-1227, 1989
1001989
Polarization-dependent reflectivity of Si (111)-(2× 1) surface above the gap
S Selci, P Chiaradia, F Ciccacci, A Cricenti, N Sparvieri, G Chiarotti
Physical Review B 31 (6), 4096, 1985
841985
Surface states in Si (111) 2× 1 and Ge (111) 2× 1 by optical reflectivity
S Nannarone, P Chiaradia, F Ciccacci, R Memeo, P Sassaroli, S Selci, ...
Solid State Communications 33 (6), 593-595, 1980
821980
Electron-phonon interaction in optical absorption at the Si (111) 2× 1 surface
F Ciccacci, S Selci, G Chiarotti, P Chiaradia
Physical review letters 56 (22), 2411, 1986
801986
Preparation and characterization of tungsten tips for scanning tunneling microscopy
A Cricenti, E Paparazzo, MA Scarselli, L Moretto, S Selci
Review of scientific instruments 65 (5), 1558-1560, 1994
511994
Nanolithography: a borderland between STM, EB, IB, and X-ray lithographies
M Gentili, C Giovannella, S Selci, ( Eds.)
Springer, 1994
43*1994
Optical detection of surface states in GaAs (110) and GaP (110)
P Chiaradia, G Chiarotti, F Ciccacci, R Memeo, S Nannarone, P Sassaroli, ...
Surface Science 99 (1), 70-75, 1980
421980
The effect of surface states and band bending change on reflectivity of cleaved GaAs (110) and GaP (110)
F Ciccacci, S Selci, G Chiarotti, P Chiaradia, A Cricenti
Surface Science 168 (1-3), 28-34, 1986
411986
SERENA: particle instrument suite for determining the Sun-Mercury interaction from BepiColombo
S Orsini, SA Livi, H Lichtenegger, S Barabash, A Milillo, E De Angelis, ...
Space science reviews 217, 1-107, 2021
372021
Optical reflectance spectroscopy of ancient papers with discoloration or foxing
M Missori, M Righini, S Selci
Optics communications 231 (1-6), 99-106, 2004
372004
Polarization dependence of optical transitions in GaP (1 1 0) and GaAs (1 1 0) surfaces studied with surface differential reflectivity
S Selci, F Ciccacci, A Cricenti, AC Felici, C Goletti, P Chiaradia
Solid state communications 62 (12), 833-834, 1987
361987
Dielectric properties of the Si (111) 2× 1 surface: Optical constants and the energy-loss spectrum
S Nannarone, S Selci
Physical Review B 28 (10), 5930, 1983
341983
Position of the empty surface-state band on Si (111) 2× 1
A Cricenti, S Selci, KO Magnusson, B Reihl
Physical Review B 41 (18), 12908, 1990
321990
Si (100) 1× 1-Sb and Si (100) 2× 1-Sb surfaces studied with angle-resolved photoemission and surface differential reflectivity
A Cricenti, S Selci, AC Felici, L Ferrari, G Contini, G Chiarotti
Physical Review B 47 (23), 15745, 1993
311993
Determination of the complex dielectric function of Si (111) 2× 1, GaAs (110) and GaP (110) surfaces by polarized surface differential reflectivity
A Cricenti, S Selci, F Ciccacci, AC Felici, C Goletti, Z Yong, G Chiarotti
Physica Scripta 38 (2), 199, 1988
301988
Imaging of single‐stranded DNA with the scanning tunneling microscope
A Cricenti, S Selci, G Chiarotti, F Amaldi
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1991
271991
Dielectric functions of Si (111) 2× 1, Ge (111) 2× 1, GaAs (110) and GaP (110) surfaces obtained by polarized surface differential reflectivity
S Selci, A Cricenti, F Ciccacci, AC Felici, C Goletti, Z Yong, G Chiarotti
Surface Science 189, 1023-1027, 1987
251987
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