| Statistical analysis of the impact of charge traps in p-type MOSFETs via particle-based Monte Carlo device simulations ACJ Rossetto, VVA Camargo, TH Both, D Vasileska, GI Wirth Journal of Computational Electronics 19, 648-657, 2020 | 10 | 2020 |
| Total dose effects on voltage references in 130-nm CMOS technology DM Colombo, A Rosseto, GI Wirth, S Bampi, OL Gonçalez IEEE Transactions on Device and Materials Reliability 18 (1), 27-36, 2017 | 10 | 2017 |
| 3-D Monte Carlo device simulator for variability modeling of p-MOSFETs VVA Camargo, ACJ Rossetto, D Vasileska, GI Wirth Journal of Computational Electronics 19, 668-676, 2020 | 6 | 2020 |
| Modeling quantum confinement in multi-gate transistors with effective potential CS Soares, PKR Baikadi, ACJ Rossetto, MA Pavanello, D Vasileska, ... 2022 36th Symposium on Microelectronics Technology (SBMICRO), 1-4, 2022 | 4 | 2022 |
| Performance analysis of a clock generator PLL under TID effects ACJ Rossetto, GI Wirth, RV Dallasen 2014 15th Latin American Test Workshop-LATW, 1-5, 2014 | 3 | 2014 |
| 3-D non-isothermal particle-based device simulator for p-type MOSFETs ACJ Rossetto, VVA Camargo, D Vasileska, GI Wirth Journal of Computational Electronics 20, 1644-1656, 2021 | 2 | 2021 |
| Modeling and simulation of self-heating effects in p-type MOS transistors ACJ Rossetto | 1 | 2018 |
| Análise dos efeitos de dose total ionizante em circuitos analógicos CMOS ACJ Rossetto | 1 | 2014 |
| Three-dimensional quantum-corrected Monte Carlo device simulator of n-FinFETs CS Soares, GF Furtado, ACJ Rossetto, GI Wirth, D Vasileska Journal of Computational Electronics, 1-10, 2024 | | 2024 |
| 3D Quantum-Corrected Monte Carlo Device Simulator of n-FinFETs C dos Santos Soares, G Furtado, ACJ Rossetto, GI Wirth, D Vasileska | | 2023 |
| Thermal Evaluation of 28-nm p-type FD-SOI MOSFETs A Rossetto, C Soares, G Wirth, M Pavanello, Z Wang, D Vasileska 2023 IEEE Latin American Electron Devices Conference (LAEDC), 1-4, 2023 | | 2023 |
| Análise do efeito de BTI sobre topologia PAR diferencial CC Gressler, ACJ Rossetto UFPel, 2022 | | 2022 |
| Ensemble Monte Carlo Simulation of Hole Transport in SiGe Alloys C dos Santos Soares, GI Wirth, A Rossetto, D Vasileska Journal of Integrated Circuits and Systems 16 (1), 1-5, 2021 | | 2021 |
| Análise do impacto do efeito de BTI em circuitos osciladores em anel MS Cardoso, ACJ Rossetto UFPel, 2021 | | 2021 |
| 3D Quantum Corrected Monte Carlo Simulation of n-FinFETs CS Soares, GF Furtado, ACJ Rossetto, GI Wirth, D Vasileska | | |
