| Eddy current probe parameters identification using a genetic algorithm and simultaneous perturbation stochastic approximation SA Chaiba, A Ayad, D Ziani, Y Le Bihan, M Javier Garcia Journal of Nondestructive Evaluation 37 (3), 55, 2018 | 4 | 2018 |
| Method for measuring a wall thickness of a hollow vane Y Le Bihan, O Lespinet, A Mourenko, FPDV Panizzoli, DMB Placko, ... US Patent 6,806,703, 2004 | 4 | 2004 |
| Measurement of wall thicknesses particularly of a blade, by eddy currents PY Joubert, Y Le Bihan, O Lespinet, A Mikic US Patent 7,550,968, 2009 | 3 | 2009 |
| Contactless measurement of the conductivity of semiconductors using a multicarrier frequency test signal D Mencaraglia, Y Le Bihan, F Loete US Patent 10,429,435, 2019 | | 2019 |
| 3D finite element method applied in nondestructive testing for multilayer plates CS Ahmed, A Ayad, Y Le Bihan 5ème Colloque sur l’Inductique, 3-4, 2017 | | 2017 |
