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Samuel Chef
Samuel Chef
Temasek Laboratories @ Nanyang Technological University
Dirección de correo verificada de ntu.edu.sg
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Optical probing (EOFM/TRI): a large set of complementary applications for ultimate VLSI
P Perdu, G Bascoul, S Chef, G Celi, K Sanchez
Proceedings of the 20th IEEE International Symposium on the Physical and …, 2013
222013
Frequency mapping in dynamic light emission with wavelet transform
S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak
Microelectronics Reliability 53 (9-11), 1387-1392, 2013
92013
Filtering and emission area identification in the Time Resolved Imaging data
S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak
Proceedings of the 38th International Symposium for Testing and Failure …, 2012
82012
Descrambling of embedded SRAM using a laser probe
S Chef, CT Chua, JY Tay, YW Siah, S Bhasin, J Breier, CL Gan
2018 IEEE International Symposium on the Physical and Failure Analysis of …, 2018
72018
Extensive laser fault injection profiling of 65 nm FPGA
J Breier, W He, S Bhasin, D Jap, S Chef, HG Ong, CL Gan
Journal of Hardware and Systems Security 1, 237-251, 2017
72017
Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location
S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak
Journal of Electronic Imaging 24 (1), 013019-013019, 2015
72015
New statistical post processing approach for precise fault and defect localization in TRI database acquired on complex VLSI
S Chef, P Perdu, G Bascoul, S Jacquir, K Sanchez, S Binczak
Proceedings of the 20th IEEE International Symposium on the Physical and …, 2013
72013
VLSI for Space Applications—Single Event Effect Investigation and Optical Analysis on an Integrated Laser Platform
S Chef, CT Chua, YW Siah, P Perdu, CL Gan, SH Tan, LS Koh
ISTFA 2017, 621-630, 2017
62017
Quantitative study of photoelectric laser stimulation for logic state imaging in embedded SRAM
S Chef, CT Chua, JY Tay, CL Gan
ISTFA 2021, 154-162, 2021
52021
Unsupervised learning for signal mapping in dynamic photon emission
S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak, CL Gan
Microelectronics Reliability 55 (9-10), 1564-1568, 2015
52015
Automatic emission spots identification in static and dynamic imaging by research of local maxima
A Boscaro, S Chef, S Jacquir, K Sanchez, P Perdu, S Binczak
ISTFA 2014, 322-326, 2014
42014
Cluster matching in time resolved imaging for VLSI analysis
S Chef, S Jacquir, P Perdu, K Sanchez, S Binczak
Proceedings of the 21th International Symposium on the Physical and Failure …, 2014
42014
Pattern image enhancement by extended depth of field
S Chef, B Billiot, S Jacquir, K Sanchez, P Perdu, S Binczak
Microelectronics Reliability 54 (9-10), 2099-2104, 2014
32014
Spatial correction in dynamic photon emission by affine transformation matrix estimation
S Chef, S Jacquir, P Perdu, K Sanchez, S Binczak
Proceedings of the 21th International Symposium on the Physical and Failure …, 2014
22014
Integrating pulsed laser for a galvo mirror based SEE scanning microscope with optical failure analysis capabilities
CT Chua, S Chef, K Sanchez, G Bascoul, P Perdu, SH Tan, CL Gan
2018 International Conference on Radiation Effects of Electronic Devices …, 2018
12018
Investigation on Data Retrieval in Emerging Non-Volatile Memory Devices Using Conductive Probe Atomic Force Microscopy
JY Tay, J Cheah, S Chef, XM Zeng, Q Liu, CL Gan
2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023
2023
Security Evaluation of Microcontrollers: A Case Study in Smart Watches
X Zeng, Q Liu, CT Chua, S Chef, CL Gan
2023 IEEE International Symposium on the Physical and Failure Analysis of …, 2023
2023
Embedded-EEPROM descrambling via laser-based techniques–A case study on AVR MCU
S Chef, CC Tah, JY Tay, J Cheah, CL Gan
2022 Workshop on Fault Detection and Tolerance in Cryptography (FDTC), 1-8, 2022
2022
A study of clustering for the enhancement of image resolution in dynamic photon emission
S Chef, CT Chua, CL Gan
ISTFA 2019, 68-78, 2019
2019
Automated Profiling Method for Laser Fault Injection in FPGAs
J Breier, W He, S Bhasin, D Jap, S Chef, HG Ong, CL Gan
Automated Methods in Cryptographic Fault Analysis, 301-325, 2019
2019
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Artículos 1–20