| Modulation measuring profilometry with auto-synchronous phase shifting and vertical scanning M Zhong, X Su, W Chen, Z You, M Lu, H Jing Optics express 22 (26), 31620-31634, 2014 | 43 | 2014 |
| Application of two-dimensional S-Transform in fringe pattern analysis M Zhong, W Chen, T Wang, X Su Optics and Lasers in Engineering 51 (10), 1138-1142, 2013 | 36 | 2013 |
| 3-D surface profilometry based on modulation measurement by applying wavelet transform method M Zhong, F Chen, C Xiao, Y Wei Optics and Lasers in Engineering 88, 243-254, 2017 | 29 | 2017 |
| Application of S-transform profilometry in eliminating nonlinearity in fringe pattern M Zhong, W Chen, M Jiang Applied Optics 51 (5), 577-587, 2012 | 27 | 2012 |
| Modulation measuring profilometry with cross grating projection and single shot for dynamic 3D shape measurement M Lu, X Su, Y Cao, Z You, M Zhong Optics and Lasers in Engineering 87, 103-110, 2016 | 26 | 2016 |
| Autofocusing method for a digital fringe projection system with dual projectors M Zhong, X Hu, F Chen, C Xiao, D Peng, S Zhang Optics express 28 (9), 12609-12620, 2020 | 25 | 2020 |
| Optical 3D shape measurement profilometry based on 2D S-Transform filtering method M Zhong, W Chen, X Su, Y Zheng, Q Shen Optics Communications 300, 129-136, 2013 | 23 | 2013 |
| Experimental study of temporal-spatial binary pattern projection for 3D shape acquisition P Zhou, J Zhu, X Su, Z You, H Jing, C Xiao, M Zhong Applied Optics 56 (11), 2995-3003, 2017 | 21 | 2017 |
| Fringe pattern analysis by S-transform M Jiang, W Chen, Z Zheng, M Zhong Optics Communications 285 (3), 209-217, 2012 | 18 | 2012 |
| Uniaxial three-dimensional phase-shifting profilometry using a dual-telecentric structured light system in micro-scale devices M Zhong, J Cui, JS Hyun, L Pan, P Duan, S Zhang Measurement Science and Technology 31 (8), 085003, 2020 | 13 | 2020 |
| Comparison of 2D S-transform profilometry and 2D windowed Fourier transform profilometry W Chen, Q Shen, M Zhong Optik 124 (24), 6732-6736, 2013 | 10 | 2013 |
| A comparison of one and two-dimensional S-transform in fringe pattern demodulation M Zhong, W Chen, X Su Optics and Lasers in Engineering 55, 212-220, 2014 | 9 | 2014 |
| Noise reduction in modulation measurement profilometry based on the wavelet transform method M Zhong, F Chen, C Xiao, Y Yang, Y Wei Optical Engineering 57 (5), 054102-054102, 2018 | 8 | 2018 |
| 3D surface profilometry based on 2D S-Transform method with optimized window M Zhong, F Chen, C Xiao, Y Wei Optik 139, 87-94, 2017 | 7 | 2017 |
| An improving fringe analysis method based on the accuracy of S-transform profilometry Q Shen, W Chen, M Zhong, X Su Optics Communications 322, 8-15, 2014 | 7 | 2014 |
| Elimination of nonlinearity in modulation measurement profilometry by wavelet transform M Zhong, F Chen, C Xiao, Y Yang Optik 168, 488-502, 2018 | 6 | 2018 |
| Error caused by sampling in S-Transform Profilometry M Zhong, W Chen, X Su Optics Communications 313, 276-284, 2014 | 5 | 2014 |
| Two-dimensional S-transform profilometry with an asymmetry Gaussian window M Zhong, F Chen, C Xiao, J Zhu Optics Communications 402, 430-436, 2017 | 4 | 2017 |
| A frequency-based window width optimized two-dimensional S-Transform profilometry M Zhong, F Chen, C Xiao Optics Communications 402, 1-8, 2017 | 4 | 2017 |
| Study of profilometry measurement precision improvement based on morlet wavelet transform Y Zheng, WJ Chen, M Zhong Laser & Optoelectronics Progress 51 (11), 148-155, 2014 | 4 | 2014 |
