Intelligent methods for test and reliability H Amrouch, J Anders, S Becker, M Betka, G Bleher, P Domanski, ... 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), 969-974, 2022 | 6 | 2022 |
Automating Greybox System-Level Test Generation D Schwachhofer, M Betka, S Becker, S Wagner, M Sauer, I Polian 2023 IEEE European Test Symposium (ETS), 1-4, 2023 | 2 | 2023 |
A survey of recent developments in testability, safety and security of risc-v processors J Anders, P Andreu, B Becker, S Becker, R Cantoro, NI Deligiannis, ... 2023 IEEE European Test Symposium (ETS), 1-10, 2023 | 2 | 2023 |
Large Language Models to Generate System-Level Test Programs Targeting Non-functional Properties D Schwachhofer, P Domanski, S Becker, S Wagner, M Sauer, D Pflüger, ... arXiv preprint arXiv:2403.10086, 2024 | | 2024 |
P5: Automated Generation of System-Level Test Programs for Characterization of Parametric Device Properties D Schwachhofer | | 2022 |
Development of an infrastructure for creating a behavioral model of hardware of measurable parameters in dependency of executed software D Schwachhofer Institute of Computer Engineering and Computer Architecture, University of …, 2021 | | 2021 |
Fault emulation for reconfigurable scan networks D Schwachhofer | | 2018 |
Maximizing Power Consumption by Exploiting Genetic Algorithms for Automatic System-Level Test Program Generation D Schwachhofer, F Angione, S Becker, S Wagner, M Sauer, P Bernardi, ... | | |