| Assessing AMS-RF test quality by defect simulation VG Gil, AJG Arteaga, G Leger IEEE Transactions on Device and Materials Reliability 19 (1), 55-63, 2019 | 18 | 2019 |
| Single Event Transient injection in large mixed-signal circuits V Guiterrez, G Leger Design of Circuits and Integrated Systems, 2018 | 4 | 2018 |
| AMS-RF test quality : Assessing defect severity V Guiterrez, A Gines, G Leger International Symposium on On-Line Testing and Robust System Design, 2018 | 4 | 2018 |
| SET sensitivity evaluation, a comparison before and after layout V Gutierrez, G Leger 2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS), 1-6, 2019 | 2 | 2019 |
| On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits V Gutierrez, G Leger 2020 18th IEEE International New Circuits and Systems Conference (NEWCAS …, 2020 | 1 | 2020 |
| 1 Adaptive defect simulation flow for Defect-oriented Test evaluation V Gutierrez, G Leger 2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019 | 1 | 2019 |
| Behavioral Model for High-Speed SAR ADCs With On-Chip References C Dominguez-Matas, A Gines, A Otin, V Gutiérrez, G Leger, E Peralias IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2023 | | 2023 |
| A Single-Event Latchup setup for high-precision AMS circuits G Leger, A Gines, E Peralias, V Gutierrez, C Dominguez, MA Jalon, ... 2023 IEEE European Test Symposium (ETS), 1-6, 2023 | | 2023 |
| A methodology for defect detection in analog circuits based on causal feature selection G Leger, A Gines, V Gutierrez, MJ Barragán 2022 29th IEEE International Conference on Electronics, Circuits and Systems …, 2022 | | 2022 |
| An adaptive simulation framework for AMS-RF test quality V Gutierrez, G Leger Integration 73, 10-17, 2020 | | 2020 |
| Defect filter construction [Dataset] G Leger, A Ginés, V Gutiérrez, MJ Barragán | | 2019 |
| Optimización del flujo de simulación de defectos y fallos en circuitos analógicos y de señal mixta V Gutiérrez Gil | | 2018 |
| npatetic1 AJ Ginés, G Leger, E Peralías, AJ López-Angulo, V Gutiérrez, A Rueda CSIC-Instituto de Microelectrónica de Sevilla (IMS-CNM), 2017 | | 2017 |
