José María Enguita
José María Enguita
Dirección de correo verificada de uniovi.es
TítuloCitado porAño
On-line metrology with conoscopic holography: beyond triangulation
I Alvarez, JM Enguita, M Frade, J Marina, G Ojea
Sensors 9 (9), 7021-7037, 2009
332009
Fast stereo vision algorithm for robotic applications
RC Gonzalez, JA Cancelas, JC Alvarez, JA Fernandez, JM Enguita
1999 7th IEEE International Conference on Emerging Technologies and Factory …, 1999
151999
On-line defect detection with the Long Stand-off Conoline profilometer
I Álvarez, G Sirat, C Fraga, J Enguita, Y Fernández, J Marina
Second International Conference on Metrology, 4-6, 2003
142003
Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment
JM Enguita, I Alvarez, CF Bobis, J Marina, Y Fernández, GY Sirat
Optical Engineering 45 (7), 073602, 2006
132006
Improving laboratory training for automation and process control courses with a specifically designed testing software application
F Mateos, AM López, VM Gonazalez, JM Enguita
IEEE Transactions on Education 44 (2), 14 pp., 2001
102001
Face recognition using binary thresholding for features extraction
CF Bobis, RC González, JA Cancelas, I Alvarez, JM Enguita
Proceedings 10th International Conference on Image Analysis and Processing …, 1999
101999
On-line non-contact measuring of synchronizer hubs
C Fraga, JM Enguita, I Alvarez, J Marina, N Martinez
Optical Measurement Systems for Industrial Inspection IV 5856, 938-949, 2005
92005
Denoising of conoscopic holography fringe patterns with orientational filters: a comparative study
JM Enguita, Y Fernández, I Alvarez, CF Bobis, J Marina
Optical Engineering 44 (3), 035603, 2005
82005
In-situ waviness characterization of metal plates by a lateral shearing interferometric profilometer
M Frade, JM Enguita, I Alvarez
Sensors 13 (4), 4906-4921, 2013
72013
Industrial online surface defects detection in continuous casting hot slabs
I Alvarez, J Marina, JM Enguita, C Fraga, R Garcia
Optical Measurement Systems for Industrial Inspection VI 7389, 73891X, 2009
72009
On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems
I Alvarez, JMÃ Enguita, J Marina, CF Bobis
Optical Engineering 47 (2), 023602, 2008
72008
Camber measurement system in a hot rolling mill
C Fraga, RC Gonzalez, JA Cancelas, LM Enguita, LAR Loredo
Conference Record of the 2004 IEEE Industry Applications Conference, 2004 …, 2004
72004
Toward online non-contact roughness profile measurements with a sensor based on conoscopic holography: current developments
I Alvarez, J Marina, JM Enguita, C Fraga, R García, G Ojea
Two-and Three-Dimensional Methods for Inspection and Metrology IV 6382, 638202, 2006
62006
Visir, a simulation software for domotics installations to improve laboratory training
VM Gonzalez, F Mateos, AM Lopez, JM Enguita, M Garcia, R Olaiz
31st Annual Frontiers in Education Conference. Impact on Engineering and …, 2001
62001
In situ 3D profilometry of rough objects with a lateral shearing interferometry range finder
M Frade, JM Enguita, I Álvarez
Optics and Lasers in Engineering 50 (11), 1559-1567, 2012
52012
Thickness quality control
JM Enguita, C Fraga, AA Cuadrado, Y Fernandez, JL Rendueles, ...
IEEE Industry Applications Magazine 12 (2), 12-20, 2006
52006
Theoretical design of a depolarized interferometric fiber-optic gyroscope (IFOG) on SMF-28 single-mode standard optical fiber based on closed-loop sinusoidal phase modulation …
RJ Pérez, I Álvarez, JM Enguita
Sensors 16 (5), 604, 2016
42016
Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications
JM Enguita, I Álvarez, MF Rodriguez, J Marina
Optical Engineering 49 (2), 023602, 2010
42010
Conoscopic holography based profilometers for defect inspection: improviements in speed, resolution, and noise reduction
I Álvarez, JM Enguita, C Fraga, J Marina, Y Fernández
Optical Sensing II 6189, 61890H, 2006
42006
On-line wavy strip and off-center analysis of high speed production lines by a linear camera
Y Fernandez, RC Gonzalez, PF Díaz, JM Enguita
EFTA 2003. 2003 IEEE Conference on Emerging Technologies and Factory …, 2003
42003
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Artículos 1–20