José María Enguita
José María Enguita
Dirección de correo verificada de uniovi.es
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On-line metrology with conoscopic holography: beyond triangulation
I Alvarez, JM Enguita, M Frade, J Marina, G Ojea
Sensors 9 (9), 7021-7037, 2009
432009
Fast stereo vision algorithm for robotic applications
RC Gonzalez, JA Cancelas, JC Alvarez, JA Fernandez, JM Enguita
1999 7th IEEE International Conference on Emerging Technologies and Factory …, 1999
171999
On-line defect detection with the Long Stand-off Conoline profilometer
I Álvarez, G Sirat, C Fraga, J Enguita, Y Fernández, J Marina
Second International Conference on Metrology, 84-89, 2003
152003
Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment
JM Enguita, I Alvarez, CF Bobis, J Marina, Y Fernández, GY Sirat
Optical Engineering 45 (7), 073602, 2006
132006
Denoising of conoscopic holography fringe patterns with orientational filters: a comparative study
JM Enguita, Y Fernández, I Alvarez, CF Bobis, J Marina
Optical Engineering 44 (3), 035603, 2005
112005
On-line non-contact measuring of synchronizer hubs
C Fraga, JM Enguita, I Alvarez, J Marina, N Martinez
Optical Measurement Systems for Industrial Inspection IV 5856, 938-949, 2005
102005
Improving laboratory training for automation and process control courses with a specifically designed testing software application
F Mateos, AM López, VM Gonazalez, JM Enguita
IEEE Transactions on Education 44 (2), 14 pp., 2001
102001
Theoretical design of a depolarized interferometric fiber-optic gyroscope (IFOG) on SMF-28 single-mode standard optical fiber based on closed-loop sinusoidal phase modulation …
RJ Pérez, I Álvarez, JM Enguita
Sensors 16 (5), 604, 2016
82016
In-situ waviness characterization of metal plates by a lateral shearing interferometric profilometer
M Frade, JM Enguita, I Alvarez
Sensors 13 (4), 4906-4921, 2013
82013
Toward online non-contact roughness profile measurements with a sensor based on conoscopic holography: current developments
I Alvarez, J Marina, JM Enguita, C Fraga, R García, G Ojea
Two-and Three-Dimensional Methods for Inspection and Metrology IV 6382, 638202, 2006
82006
Camber measurement system in a hot rolling mill
C Fraga, RC Gonzalez, JA Cancelas, LM Enguita, LAR Loredo
Conference Record of the 2004 IEEE Industry Applications Conference, 2004 …, 2004
82004
Face recognition using binary thresholding for features extraction
CF Bobis, RC Gonzalez, JA Cancelas, I Alvarez, JM Enguita
Proceedings 10th International Conference on Image Analysis and Processing …, 1999
81999
Industrial online surface defects detection in continuous casting hot slabs
I Alvarez, J Marina, JM Enguita, C Fraga, R Garcia
Optical Measurement Systems for Industrial Inspection VI 7389, 73891X, 2009
72009
On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems
I Alvarez, JMÃ Enguita, J Marina, CF Bobis
Optical Engineering 47 (2), 023602, 2008
72008
In situ 3D profilometry of rough objects with a lateral shearing interferometry range finder
M Frade, JM Enguita, I Álvarez
Optics and Lasers in Engineering 50 (11), 1559-1567, 2012
62012
Visir, a simulation software for domotics installations to improve laboratory training
VM González, F Mateos, AM López, JM Enguita, M Garcia, R Olaiz
31st Annual Frontiers in Education Conference. Impact on Engineering and …, 2001
62001
Thickness quality control
JM Enguita, C Fraga, AA Cuadrado, Y Fernandez, JL Rendueles, ...
IEEE Industry Applications Magazine 12 (2), 12-20, 2006
52006
A long standoff profilometer for surface inspection in adverse environments based on conoscopic holography
JM Enguita, I Alvarez, C Fraga, J Marina, Y Fernandez, G Sirat
Optical Measurement Systems for Industrial Inspection IV 5856, 481-490, 2005
52005
Common-path two-wavelength interferometer with submicron precision for profile measurements in on-line applications
JM Enguita, I Álvarez, MF Rodriguez, J Marina
Optical Engineering 49 (2), 023602, 2010
42010
Conoscopic holography based profilometers for defect inspection: improviements in speed, resolution, and noise reduction
I Álvarez, JM Enguita, C Fraga, J Marina, Y Fernández
Optical Sensing II 6189, 61890H, 2006
42006
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Artículos 1–20