José María Enguita
José María Enguita
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On-line metrology with conoscopic holography: beyond triangulation
I Alvarez, JM Enguita, M Frade, J Marina, G Ojea
Sensors 9 (9), 7021-7037, 2009
Fast stereo vision algorithm for robotic applications
RC Gonzalez, JA Cancelas, JC Alvarez, JA Fernandez, JM Enguita
1999 7th IEEE International Conference on Emerging Technologies and Factory …, 1999
On-line defect detection with the Long Stand-off Conoline profilometer
I Álvarez, G Sirat, C Fraga, J Enguita, Y Fernández, J Marina
Second International Conference on Metrology, 84-89, 2003
Conoscopic holography-based long-standoff profilometer for surface inspection in adverse environment
JM Enguita, I Alvarez, C Fraga, J Marina, Y Fenández, G Sirat
Optical Engineering 45 (7), 073602-073602-10, 2006
Camber measurement system in a hot rolling mill
C Fraga, RC Gonzalez, JA Cancelas, LM Enguita, LAR Loredo
Conference Record of the 2004 IEEE Industry Applications Conference, 2004 …, 2004
Face recognition using binary thresholding for features extraction
CF Bobis, RC González, JA Cancelas, I Alvarez, JM Enguita
Proceedings 10th International Conference on Image Analysis and Processing …, 1999
Theoretical design of a depolarized interferometric fiber-optic gyroscope (IFOG) on SMF-28 single-mode standard optical fiber based on closed-loop sinusoidal phase modulation …
RJ Pérez, I Álvarez, JM Enguita
Sensors 16 (5), 604, 2016
On-line non-contact measuring of synchronizer hubs
C Fraga, JM Enguita, I Alvarez, J Marina, N Martinez
Optical Measurement Systems for Industrial Inspection IV 5856, 938-949, 2005
Denoising of conoscopic holography fringe patterns with orientational filters: a comparative study
JM Enguita, Y Ferna´ ndez, I A´ lvarez, C Fraga, J Marina
Optical Engineering 44 (3), 035603-035603-11, 2005
In-Situ Waviness Characterization of Metal Plates by a Lateral Shearing Interferometric Profilometer
M Frade, JM Enguita, I Alvarez
Sensors 13 (4), 4906-4921, 2013
In situ 3D profilometry of rough objects with a lateral shearing interferometry range finder
M Frade, JM Enguita, I Alvarez
Optics and Lasers in Engineering 50 (11), 1559-1567, 2012
Toward online non-contact roughness profile measurements with a sensor based on conoscopic holography: current developments
I Alvarez, J Marina, JM Enguita, C Fraga, R García, G Ojea
Two-and Three-Dimensional Methods for Inspection and Metrology IV 6382, 11-22, 2006
Industrial online surface defects detection in continuous casting hot slabs
I Alvarez, J Marina, JM Enguita, C Fraga, R Garcia
Optical Measurement Systems for Industrial Inspection VI 7389, 614-622, 2009
Improving laboratory training for automation and process control courses with a specifically designed testing software application
F Mateos, AM López, VM Gonazalez, JM Enguita
IEEE Transactions on Education 44 (2), 14 pp., 2001
On-line submicron profile measurements from safe distances with conoscopic holography: feasibility and potential problems
I Alvarez, JM Enguita, J Marina, C Fraga
Optical Engineering 47 (2), 023602-023602-8, 2008
Visir, a simulation software for domotics installations to improve laboratory training
VM González, F Mateos, AM Lopez, JM Enguita, M Garcia, R Olaiz
31st Annual Frontiers in Education Conference. Impact on Engineering and …, 2001
Morphing projections: a new visual technique for fast and interactive large-scale analysis of biomedical datasets
I Díaz, JM Enguita, A González, D García, AA Cuadrado, MD Chiara, ...
Bioinformatics 37 (11), 1571-1580, 2021
Procesamiento Morfológico, Visión 3D: Estereoscopía, Álgebra lineal básica para visión por computador, Geometría Proyectiva para Visión 3D
JA Cancelas, RC González, I Álvarez, JM Enguita
Conceptos y Métodos en Visión Por Computador 1, 2016
Thickness quality control
JM Enguita, C Fraga, AA Cuadrado, Y Fernandez, JL Rendueles, ...
IEEE Industry Applications Magazine 12 (2), 12-20, 2006
A long standoff profilometer for surface inspection in adverse environments based on conoscopic holography
JM Enguita, I Alvarez, C Fraga, J Marina, Y Fernandez, G Sirat
Optical Measurement Systems for Industrial Inspection IV 5856, 481-490, 2005
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