| Photovoltaic module reliability model based on field degradation studies M Vázquez, I Rey‐Stolle Progress in photovoltaics: Research and Applications 16 (5), 419-433, 2008 | 391 | 2008 |
| Temperature, stress, and structural-relaxation dependence of the magnetostriction in (// glasses JM Barandiarán, A Hernando, V Madurga, OV Nielsen, M Vázquez, ... Physical Review B 35 (10), 5066, 1987 | 185 | 1987 |
| III‐V concentrator solar cell reliability prediction based on quantitative LED reliability data M Vázquez, C Algora, I Rey‐Stolle, JR González Progress in Photovoltaics: Research and applications 15 (6), 477-491, 2007 | 75 | 2007 |
| Temperature accelerated life test on commercial concentrator III–V triple‐junction solar cells and reliability analysis as a function of the operating temperature P Espinet‐González, C Algora, N Núñez, V Orlando, M Vázquez, ... Progress in Photovoltaics: Research and Applications 23 (5), 559-569, 2015 | 68 | 2015 |
| Reliability analysis of temperature step-stress tests on III–V high concentrator solar cells JR González, M Vázquez, N Núñez, C Algora, I Rey-Stolle, B Galiana Microelectronics Reliability 49 (7), 673-680, 2009 | 61 | 2009 |
| Degradation of AlInGaP red LEDs under drive current and temperature accelerated life tests M Vázquez, N Núñez, E Nogueira, A Borreguero Microelectronics Reliability 50 (9-11), 1559-1562, 2010 | 57 | 2010 |
| Evaluation of AlGaInP LEDs reliability based on accelerated tests E Nogueira, M Vázquez, N Núñez Microelectronics Reliability 49 (9-11), 1240-1243, 2009 | 51 | 2009 |
| Evaluation of the reliability of high concentrator GaAs solar cells by means of temperature accelerated aging tests N Núñez, JR González, M Vázquez, C Algora, P Espinet Progress in Photovoltaics: Research and Applications 21 (5), 1104-1113, 2013 | 43 | 2013 |
| Low-temperature growth of AlAs/GaAs heterostructures by modulated molecular beam epitaxy F Briones, L González, M Recio, M Vázquez Japanese journal of applied physics 26 (7A), L1125, 1987 | 42 | 1987 |
| High-power UV-LED degradation: Continuous and cycled working condition influence FJ Arques-Orobon, N Nuñez, M Vazquez, C Segura-Antunez, ... Solid-State Electronics 111, 111-117, 2015 | 33 | 2015 |
| DC/DC conversion circuit MV Lopez, EDLC Moreno, JR Perez US Patent 5,535,112, 1996 | 30 | 1996 |
| Accelerated Life Test of high luminosity blue LEDs E Nogueira, V Orlando, J Ochoa, A Fernandez, M Vázquez Microelectronics Reliability 64, 631-634, 2016 | 24 | 2016 |
| Real‐time reliability test for a CPV module based on a power degradation model JR González, M Vázquez, C Algora, N Núñez Progress in Photovoltaics: Research and Applications 19 (1), 113-122, 2011 | 23 | 2011 |
| Novel accelerated testing method for III–V concentrator solar cells N Núñez, M Vázquez, JR González, C Algora, P Espinet Microelectronics Reliability 50 (9-11), 1880-1883, 2010 | 23 | 2010 |
| Fixed frequency forward-flyback converter with two fully regulated outputs M Vazquez, E De La Cruz, JA Navas, JA Cobos Proceedings of INTELEC 95. 17th International Telecommunications Energy …, 1995 | 23 | 1995 |
| Analysis of suitable PWM topologies to meet very high efficiency requirements for on-board DC/DC converters in future telecom systems E de la Cruz, M Vazquez, JJ Rodriguez Proceedings of Intelec 93: 15th International Telecommunications Energy …, 1993 | 22 | 1993 |
| Accelerated life test of high luminosity AlGaInP LEDs E Nogueira, M Vázquez, J Mateos Microelectronics Reliability 52 (9-10), 1853-1858, 2012 | 20 | 2012 |
| Degradation mechanism analysis in temperature stress tests on III–V ultra-high concentrator solar cells using a 3D distributed model P Espinet, C Algora, JR González, N Núñez, M Vázquez Microelectronics Reliability 50 (9-11), 1875-1879, 2010 | 19 | 2010 |
| Failure analysis on lattice matched GaInP/Ga (In) As/Ge commercial concentrator solar cells after temperature accelerated life tests V Orlando, M Gabás, B Galiana, P Espinet‐González, S Palanco, ... Progress in Photovoltaics: Research and Applications 25 (1), 97-112, 2017 | 17 | 2017 |
| Improved estimation of weibull parameters considering unreliability uncertainties A Fernandez, M Vázquez IEEE Transactions on Reliability 61 (1), 32-40, 2011 | 17 | 2011 |
NEFTALI NUÑEZ - ORCID: 0000-0003...Professor Of Electronic Technology , Universidad Politécnica de Madrid, SpainVerified email at upm.es
