Mudit Bhargava

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Ken MaiCarnegie Mellon University, Stanford UniversityDirección de correo verificada de ece.cmu.edu
Cagla CakirCarnegie Mellon UniversityDirección de correo verificada de andrew.cmu.edu
Brian ClinePrincipal Research Engineer, ARMDirección de correo verificada de arm.com
Shidhartha DasAMDDirección de correo verificada de amd.com
Mark McCartneyCarnegie Mellon UniversityDirección de correo verificada de cmu.edu
Saurabh SinhaEngineer, AppleDirección de correo verificada de apple.com
Rahul Mathur, PhDARM Inc, UT AustinDirección de correo verificada de arm.com
Vikas ChandraDirector, AI @ Meta Reality Labs, FacebookDirección de correo verificada de fb.com
Paul N WhatmoughQualcomm AI Research, Harvard UniversityDirección de correo verificada de qti.qualcomm.com
Xiaoqing XuX development LLCDirección de correo verificada de x.team
Akhilesh JaiswalResearch Assistant Professor, University of Southern California - Information Sciences InstituteDirección de correo verificada de isi.edu
Satyanand NalamIntelDirección de correo verificada de virginia.edu
Jaydeep KulkarniUniversity of Texas at Austin, Electrical and Computer EngineeringDirección de correo verificada de austin.utexas.edu
Benton CalhounProfessor of Electrical and Computer Engineering, University of VirginiaDirección de correo verificada de virginia.edu
Xin LiProfessor, Electrical and Computer Engineering, Duke UniversityDirección de correo verificada de duke.edu
Lawrence PileggiCoraluppi Head and Tanoto Professor of ECE, Carnegie Mellon UniversityDirección de correo verificada de andrew.cmu.edu
Umut ArslanIntelDirección de correo verificada de intel.com
Haitong LiAssistant Professor of ECE, Purdue UniversityDirección de correo verificada de purdue.edu
H.-S. Philip WongProfessor of Electrical Engineering, Stanford UniversityDirección de correo verificada de stanford.edu
Fernando García RedondoR&D ImecDirección de correo verificada de imec.be

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Mudit Bhargava

intel

Dirección de correo verificada de arm.com

SRAM Physical Unclonable Functions Non-volatile Memory 3D Integration


Título Ordenar por citas Ordenar por año Ordenar por título	Citado por Citado por	Año
An efficient reliable PUF-based cryptographic key generator in 65nm CMOS M Bhargava, K Mai 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014	129	2014
Reliability enhancement of bi-stable PUFs in 65nm bulk CMOS M Bhargava, C Cakir, K Mai 2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 25-30, 2012	100	2012
A high reliability PUF using hot carrier injection based response reinforcement M Bhargava, K Mai International Conference on Cryptographic Hardware and Embedded Systems, 90-106, 2013	73	2013
Attack resistant sense amplifier based PUFs (SA-PUF) with deterministic and controllable reliability of PUF responses M Bhargava, C Cakir, K Mai Hardware-Oriented Security and Trust (HOST), 2010 IEEE International …, 2010	62	2010
Variation-tolerant SRAM sense-amplifier timing using configurable replica bitlines U Arslan, MP McCartney, M Bhargava, X Li, K Mai, LT Pileggi 2008 IEEE Custom Integrated Circuits Conference, 415-418, 2008	49	2008
On-Chip Memory Technology Design Space Explorations for Mobile Deep Neural Network Accelerators H Li, M Bhargava, PN Whatmough, HSP Wong Proceedings of the 56th Annual Design Automation Conference 2019, 131, 2019	45	2019
Comparison of bi-stable and delay-based Physical Unclonable Functions from measurements in 65nm bulk CMOS M Bhargava, C Cakir, K Mai Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 1-4, 2012	42	2012
Reliability of physical unclonable function circuits KW Mai, M Bhargava US Patent App. 14/913,285, 2018	32	2018
Low-overhead, digital offset compensated, SRAM sense amplifiers M Bhargava, MP McCartney, A Hoefler, K Mai 2009 IEEE Custom Integrated Circuits Conference, 705-708, 2009	31	2009
Memory devices formed from correlated electron materials M Bhargava, P Agarwal, A Kumar, GA Rosendale US Patent 10,002,665, 2018	24	2018
6T SRAM and 3T DRAM data retention and remanence characterization in 65nm bulk CMOS C Cakir, M Bhargava, K Mai Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 1-4, 2012	22	2012
Methods for generating reliable responses in physical unclonable functions (PUFs) and methods for designing strong PUFs KW Mai, M Bhargava US Patent App. 15/128,693, 2019	20	2019
Low V_MIN 20nm embedded SRAM with multi-voltage wordline control based read and write assist techniques M Bhargava, YK Chong, V Schuppe, B Maiti, M Kinkade, HY Chen, ... 2014 Symposium on VLSI Circuits Digest of Technical Papers, 1-2, 2014	20	2014
Reliable, Secure, Efficient Physical Unclonable Functions M Bhargava	20	2013
SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states B Niewenhuis, RD Blanton, M Bhargava, K Mai 2013 IEEE International Test Conference (ITC), 1-8, 2013	18	2013
Voltage detection with correlated electron switch M Bhargava, GA Rosendale, S Das US Patent 10,352,971, 2019	17	2019
Process variation compensation with correlated electron switch devices V Chandra, M Bhargava US Patent 10,267,831, 2019	17	2019
Virtual prototyper (ViPro): An early design space exploration and optimization tool for SRAM designers S Nalam, M Bhargava, K Mai, BH Calhoun Design Automation Conference, 138-143, 2010	17	2010
Method, system and device for correlated electron switch (CES) device operation M Bhargava, GA Rosendale US Patent 10,002,669, 2018	15	2018
Robust true random number generator using hot-carrier injection balanced metastable sense amplifiers M Bhargava, K Sheikh, K Mai 2015 IEEE International Symposium on Hardware Oriented Security and Trust …, 2015	12	2015

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