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Mudit Bhargava
Mudit Bhargava
intel
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An efficient reliable PUF-based cryptographic key generator in 65nm CMOS
M Bhargava, K Mai
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
1292014
Reliability enhancement of bi-stable PUFs in 65nm bulk CMOS
M Bhargava, C Cakir, K Mai
2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 25-30, 2012
1002012
A high reliability PUF using hot carrier injection based response reinforcement
M Bhargava, K Mai
International Conference on Cryptographic Hardware and Embedded Systems, 90-106, 2013
732013
Attack resistant sense amplifier based PUFs (SA-PUF) with deterministic and controllable reliability of PUF responses
M Bhargava, C Cakir, K Mai
Hardware-Oriented Security and Trust (HOST), 2010 IEEE International …, 2010
622010
Variation-tolerant SRAM sense-amplifier timing using configurable replica bitlines
U Arslan, MP McCartney, M Bhargava, X Li, K Mai, LT Pileggi
2008 IEEE Custom Integrated Circuits Conference, 415-418, 2008
492008
On-Chip Memory Technology Design Space Explorations for Mobile Deep Neural Network Accelerators
H Li, M Bhargava, PN Whatmough, HSP Wong
Proceedings of the 56th Annual Design Automation Conference 2019, 131, 2019
452019
Comparison of bi-stable and delay-based Physical Unclonable Functions from measurements in 65nm bulk CMOS
M Bhargava, C Cakir, K Mai
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 1-4, 2012
422012
Reliability of physical unclonable function circuits
KW Mai, M Bhargava
US Patent App. 14/913,285, 2018
322018
Low-overhead, digital offset compensated, SRAM sense amplifiers
M Bhargava, MP McCartney, A Hoefler, K Mai
2009 IEEE Custom Integrated Circuits Conference, 705-708, 2009
312009
Memory devices formed from correlated electron materials
M Bhargava, P Agarwal, A Kumar, GA Rosendale
US Patent 10,002,665, 2018
242018
6T SRAM and 3T DRAM data retention and remanence characterization in 65nm bulk CMOS
C Cakir, M Bhargava, K Mai
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 1-4, 2012
222012
Methods for generating reliable responses in physical unclonable functions (PUFs) and methods for designing strong PUFs
KW Mai, M Bhargava
US Patent App. 15/128,693, 2019
202019
Low VMIN 20nm embedded SRAM with multi-voltage wordline control based read and write assist techniques
M Bhargava, YK Chong, V Schuppe, B Maiti, M Kinkade, HY Chen, ...
2014 Symposium on VLSI Circuits Digest of Technical Papers, 1-2, 2014
202014
Reliable, Secure, Efficient Physical Unclonable Functions
M Bhargava
202013
SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states
B Niewenhuis, RD Blanton, M Bhargava, K Mai
2013 IEEE International Test Conference (ITC), 1-8, 2013
182013
Voltage detection with correlated electron switch
M Bhargava, GA Rosendale, S Das
US Patent 10,352,971, 2019
172019
Process variation compensation with correlated electron switch devices
V Chandra, M Bhargava
US Patent 10,267,831, 2019
172019
Virtual prototyper (ViPro): An early design space exploration and optimization tool for SRAM designers
S Nalam, M Bhargava, K Mai, BH Calhoun
Design Automation Conference, 138-143, 2010
172010
Method, system and device for correlated electron switch (CES) device operation
M Bhargava, GA Rosendale
US Patent 10,002,669, 2018
152018
Robust true random number generator using hot-carrier injection balanced metastable sense amplifiers
M Bhargava, K Sheikh, K Mai
2015 IEEE International Symposium on Hardware Oriented Security and Trust …, 2015
122015
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