Microprocessor software-based self-testing M Psarakis, D Gizopoulos, E Sanchez, MS Reorda IEEE Design & Test of Computers 27 (3), 4-19, 2010 | 253 | 2010 |
Software-based self-testing of embedded processors N Kranitis, A Paschalis, D Gizopoulos, G Xenoulis Processor Design, 447-481, 2007 | 214 | 2007 |
Effective software-based self-test strategies for on-line periodic testing of embedded processors A Paschalis, D Gizopoulos IEEE Transactions on Computer-aided design of integrated circuits and …, 2004 | 161 | 2004 |
Architectures for online error detection and recovery in multicore processors D Gizopoulos, M Psarakis, SV Adve, P Ramachandran, SKS Hari, D Sorin, ... 2011 Design, Automation & Test in Europe, 1-6, 2011 | 132 | 2011 |
Advances in electronic testing: challenges and methodologies D Gizopoulos Springer 27, 1, 2006 | 128 | 2006 |
Systematic software-based self-test for pipelined processors D Gizopoulos, M Psarakis, M Hatzimihail, M Maniatakos, A Paschalis, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (11 …, 2008 | 100 | 2008 |
Guest editors' introduction: Design for yield and reliability Y Zorian, D Gizopoulos, C Vandenberg, P Magarshack IEEE Design & Test of Computers 21 (3), 177-182, 2004 | 98 | 2004 |
Low power/energy BIST scheme for datapaths D Gizopoulos, N Krantitis, A Paschalis, M Psarakis, Y Zorian Proceedings 18th IEEE VLSI Test Symposium, 23-28, 2000 | 79 | 2000 |
Reliability challenges of real-time systems in forthcoming technology nodes S Hamdioui, D Gizopoulos, G Guido, M Nicolaidis, A Grasset, P Bonnot 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 129-134, 2013 | 76 | 2013 |
Instruction-based self-testing of processor cores N Kranitis, A Paschalis, D Gizopoulos, Y Zorian Journal of Electronic Testing 19 (2), 103-112, 2003 | 74 | 2003 |
A concurrent built-in self-test architecture based on a self-testing RAM I Voyiatzis, A Paschalis, D Gizopoulos, N Kranitis, C Halatsis IEEE Transactions on Reliability 54 (1), 69-78, 2005 | 71 | 2005 |
Hybrid-SBST methodology for efficient testing of processor cores N Kranitis, A Merentitis, G Theodorou, A Paschalis, D Gizopoulos IEEE Design & Test of Computers 25 (1), 64-75, 2008 | 69 | 2008 |
Deterministic software-based self-testing of embedded processor cores A Paschalis, D Gizopoulos, N Kranitis, M Psarakis, Y Zorian Proceedings Design, Automation and Test in Europe. Conference and Exhibition …, 2001 | 66 | 2001 |
Effective software self-test methodology for processor cores N Kranitis, A Paschalis, D Gizopoulos, Y Zorian Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002 | 64 | 2002 |
Differential fault injection on microarchitectural simulators M Kaliorakis, S Tselonis, A Chatzidimitriou, N Foutris, D Gizopoulos 2015 IEEE International Symposium on Workload Characterization, 172-182, 2015 | 55 | 2015 |
Systematic software-based self-test for pipelined processors M Psarakis, D Gizopoulos, M Hatzimihail, A Paschalis, A Raghunathan, ... 2006 43rd ACM/IEEE Design Automation Conference, 393-398, 2006 | 53 | 2006 |
Application and analysis of RT-level software-based self-testing for embedded processor cores N Kranitis, G Xenoulis, A Paschalis, D Gizopoulos, Y Zorian International Test Conference, 2003. Proceedings. ITC 2003. 1, 431-440, 2003 | 53 | 2003 |
Embedded processor-based self-test D Gizopoulos, A Paschalis, Y Zorian Springer Science & Business Media, 2004 | 50 | 2004 |
Low-cost software-based self-testing of RISC processor cores N Kranitis, G Xenoulis, D Gizopoulos, A Paschalis, Y Zorian IEE Proceedings-Computers and Digital Techniques 150 (5), 355-360, 2003 | 50 | 2003 |
Harnessing voltage margins for energy efficiency in multicore CPUs G Papadimitriou, M Kaliorakis, A Chatzidimitriou, D Gizopoulos, ... Proceedings of the 50th Annual IEEE/ACM International Symposium on …, 2017 | 49 | 2017 |