| Microprocessor software-based self-testing M Psarakis, D Gizopoulos, E Sanchez, MS Reorda IEEE Design & Test of Computers 27 (3), 4-19, 2010 | 228 | 2010 |
| Software-based self-testing of embedded processors N Kranitis, A Paschalis, D Gizopoulos, G Xenoulis Processor Design, 447-481, 2007 | 195 | 2007 |
| Effective software-based self-test strategies for on-line periodic testing of embedded processors A Paschalis, D Gizopoulos IEEE Transactions on Computer-aided design of integrated circuits and …, 2004 | 150 | 2004 |
| Advances in electronic testing: challenges and methodologies D Gizopoulos Springer 27, 1, 2006 | 116 | 2006 |
| Architectures for online error detection and recovery in multicore processors D Gizopoulos, M Psarakis, SV Adve, P Ramachandran, SKS Hari, D Sorin, ... 2011 Design, Automation & Test in Europe, 1-6, 2011 | 115 | 2011 |
| Guest editors' introduction: Design for yield and reliability Y Zorian, D Gizopoulos, C Vandenberg, P Magarshack IEEE Design & Test of Computers 21 (3), 177-182, 2004 | 98 | 2004 |
| Systematic software-based self-test for pipelined processors D Gizopoulos, M Psarakis, M Hatzimihail, M Maniatakos, A Paschalis, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (11 …, 2008 | 84 | 2008 |
| Low power/energy BIST scheme for datapaths D Gizopoulos, N Krantitis, A Paschalis, M Psarakis, Y Zorian Proceedings 18th IEEE VLSI Test Symposium, 23-28, 2000 | 75 | 2000 |
| Instruction-based self-testing of processor cores N Kranitis, A Paschalis, D Gizopoulos, Y Zorian Journal of Electronic Testing 19 (2), 103-112, 2003 | 69 | 2003 |
| Reliability challenges of real-time systems in forthcoming technology nodes S Hamdioui, D Gizopoulos, G Guido, M Nicolaidis, A Grasset, P Bonnot 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 129-134, 2013 | 64 | 2013 |
| Effective software self-test methodology for processor cores N Kranitis, A Paschalis, D Gizopoulos, Y Zorian Proceedings of the conference on Design, automation and test in Europe, 592, 2002 | 62 | 2002 |
| Deterministic software-based self-testing of embedded processor cores A Paschalis, D Gizopoulos, N Kranitis, M Psarakis, Y Zorian Proceedings Design, Automation and Test in Europe. Conference and Exhibition …, 2001 | 59 | 2001 |
| Hybrid-SBST methodology for efficient testing of processor cores N Kranitis, A Merentitis, G Theodorou, A Paschalis, D Gizopoulos IEEE Design & Test of Computers 25 (1), 64-75, 2008 | 58 | 2008 |
| A concurrent built-in self-test architecture based on a self-testing RAM I Voyiatzis, A Paschalis, D Gizopoulos, N Kranitis, C Halatsis IEEE Transactions on Reliability 54 (1), 69-78, 2005 | 58 | 2005 |
| Application and analysis of RT-level software-based self-testing for embedded processor cores N Kranitis, G Xenoulis, A Paschalis, D Gizopoulos, Y Zorian International Test Conference, 2003. Proceedings. ITC 2003. 1, 431-440, 2003 | 48 | 2003 |
| An effective built-in self-test scheme for parallel multipliers D Gizopoulos, A Paschalis, Y Zorian IEEE Transactions on Computers 48 (9), 936-950, 1999 | 48 | 1999 |
| Embedded processor-based self-test D Gizopoulos, A Paschalis, Y Zorian Springer Science & Business Media, 2013 | 44 | 2013 |
| Systematic software-based self-test for pipelined processors M Psarakis, D Gizopoulos, M Hatzimihail, A Paschalis, A Raghunathan, ... 2006 43rd ACM/IEEE Design Automation Conference, 393-398, 2006 | 43 | 2006 |
| Low-cost software-based self-testing of RISC processor cores N Kranitis, G Xenoulis, D Gizopoulos, A Paschalis, Y Zorian IEE Proceedings-Computers and Digital Techniques 150 (5), 355-360, 2003 | 43 | 2003 |
| Easily testable cellular carry lookahead adders D Gizopoulos, M Psarakis, A Paschalis, Y Zorian Journal of Electronic Testing 19 (3), 285-298, 2003 | 42 | 2003 |
