| Drawbacks to using NIST electromigration test-structures to test bamboo metal lines I De Munari, A Scorzoni, F Tamarri, D Govoni, F Corticelli, F Fantini IEEE transactions on electron devices 41 (12), 2276-2280, 1994 | 24 | 1994 |
| Material properties measurement and numerical simulation for Characterization of ultra-low-power consumption hotplates E Cozzani, A Roncaglia, S Zampolli, I Elmi, F Mancarella, F Tamarri, ... TRANSDUCERS 2007-2007 International Solid-State Sensors, Actuators and …, 2007 | 14 | 2007 |
| Resistance changes due to Cu transport and precipitation during electromigration in submicrometric Al-0.5% Cu lines A Scorzoni, I De Munari, R Balboni, F Tamarri, A Garulli, F Fantini Microelectronics Reliability 36 (11-12), 1691-1694, 1996 | 13 | 1996 |
| Activation energy in the early stage of electromigration in Al-1% Si/TiN/Ti bamboo lines I De Munari, A Scorzoni, F Tamarri, F Fantini Semiconductor science and technology 10 (3), 255, 1995 | 12 | 1995 |
| Resistance decay after electromigration as the effect of mechanical stress relaxation GL Baldini, A Scorzoni, F Tamarri Microelectronics Reliability 33 (11-12), 1841-1844, 1993 | 9 | 1993 |
| Theory and design of an integrated optical sensor based on a Mach-Zehnder interferometer GG Bentini, M Bianconi, M Chiarini, G Correra, P Maccagnani, F Tamarri, ... Sensors and Microsystems, 319-325, 2002 | 6 | 2002 |
| Limitations in NIST test-structures when used for electromigration tests of bamboo metal lines GL Baldini, I DE MUNARI, A Scorzoni, F Tamarri, C Caprile, F Fantini | 5 | 1993 |
| Characterization of MOS capacitors fabricated on n-type 4H-SiC implanted with nitrogen at high dose A Poggi, F Moscatelli, Y Hijikata, S Solmi, M Sanmartin, F Tamarri, ... Materials science forum 556, 639-642, 2007 | 4 | 2007 |
| The evaluation of the true test temperature during wafer-level electromigration tests GL Baldini, A Scorzoni, F Tamarri, D Trombetti MRS Online Proceedings Library (OPL) 265, 289, 1992 | 4 | 1992 |
| Fully ion implanted vertical pin diodes on high purity semi-insulating 4H-SiC wafers R Nipoti, A Nath, YL Tian, F Tamarri, F Moscatelli, P de Nicola, MV Rao Materials Science Forum 717, 985-988, 2012 | 3 | 2012 |
| ASTM standard structures for electromigration applied to narrow Al/TiN/Ti lines: Drawbacks and new proposal I DE MUNARI, GL Baldini, A Scorzoni, F Tamarri, M Vanzi, F Fantini | 3 | 1993 |
| Ion implantation and activation of aluminum in bulk 3C-SiC and 3C-SiC on Si F Torregrosa, M Canino, F Li, F Tamarri, B Roux, S Morata, F La Via, ... MRS Advances 7 (36), 1347-1352, 2022 | 2 | 2022 |
| Fabrication of Pt-polysilicon thin-film thermopiles: A preliminary study F Mancarella, A Roncaglia, F Tamarri, G Pizzochero, GC Cardinali, ... SENSORS, 2005 IEEE, 1141-1144, 2005 | 2 | 2005 |
| Lightweight Gas Sensor Based on MEMS Pre-Concentration and Infrared Absorption Spectroscopy Inside a Hollow Fiber R Viola, N Liberatore, S Mengali, I Elmi, F Tamarri, S Zampolli Sensors 23 (5), 2809, 2023 | 1 | 2023 |
| Room Temperature Annealing Effects on Leakage Current of Ion Implanted p+n 4H-SiC Diodes F Moscatelli, F Bergamini, A Poggi, M Passini, F Tamarri, M Bianconi, ... Materials Science Forum 600, 1027-1030, 2009 | 1 | 2009 |
| Fully integrated Mach-Zehnder Microinterferometer on Lithium Niobate as an example of Micro electro Optical system for space applications GG Bentini, M Bianconi, A Cerutti, S Guerri, F Tamarri, A Zani, P Apollonio, ... 5th ESA round table on micro/nano technologies for space, Norvijk, The …, 2005 | 1 | 2005 |
| Experimental analysis and simulation of the optical properties of gold nano-particles on sodium alginate C Summonte, A Maurizi, R Rizzoli, F Tamarri, M Bertoldo, G Bolognini, ... Optical Materials Express 12 (11), 4456-4470, 2022 | | 2022 |
| Estimation of Activation and Compensation Ratios in Al+ Ion Implanted 4H-SiC: Comparison of Two Methodologies R Nipoti, V Boldrini, M Canino, F Tamarri, S Vantaggio, A Parisini Materials Science Forum 1062, 241-245, 2022 | | 2022 |
| GC-QEPAS: A Mems-Enabled Portable Trace Chemical Sensor for Safety & Security Applications S Mengali, I Elmi, L Masini, F Bonafé, F Tamarri, M Sanmartin, R Viola, ... 2019 20th International Conference on Solid-State Sensors, Actuators and …, 2019 | | 2019 |
| Micromachined gas calibration sources based on nanometric depth microchannels S Zampolli, I Elmi, F Mancarella, M Messina, G Marra, E Cozzani, ... Procedia Engineering 5, 1344-1347, 2010 | | 2010 |
