| Cross sections for inner-shell ionization by electron impact X Llovet, CJ Powell, F Salvat, A Jablonski Journal of Physical and Chemical Reference Data 43 (1), 2014 | 177 | 2014 |
| Monte Carlo simulation of bremsstrahlung emission by electrons E Acosta, X Llovet, F Salvat Applied Physics Letters 80 (17), 3228-3230, 2002 | 110 | 2002 |
| Técnicas de caracterización mineral y su aplicación en exploración y explotación minera JC Melgarejo, JA Proenza, S Galí, X Llovet Boletín de la Sociedad Geológica Mexicana 62 (1), 1-23, 2010 | 98 | 2010 |
| Monte Carlo simulation of x-ray spectra generated by kilo-electron-volt electrons X Llovet, L Sorbier, CS Campos, E Acosta, F Salvat Journal of applied physics 93 (7), 3844-3851, 2003 | 92 | 2003 |
| Measurements of K-shell ionization cross sections of Cr, Ni and Cu by impact of 6.5-40 keV electrons X Llovet, C Merlet, F Salvat Journal of Physics B: Atomic, Molecular and Optical Physics 33 (18), 3761, 2000 | 87 | 2000 |
| Monte Carlo simulation of bremsstrahlung emission by electrons F Salvat, JM Fernández-Varea, J Sempau, X Llovet Radiation Physics and Chemistry 75 (10), 1201-1219, 2006 | 83 | 2006 |
| Monte Carlo simulation of x-ray emission by kilovolt electron bombardment E Acosta, X Llovet, E Coleoni, JA Riveros, F Salvat Journal of applied physics 83 (11), 6038-6049, 1998 | 81 | 1998 |
| Correction of secondary X-ray fluorescence near grain boundaries in electron microprobe analysis: Application to thermobarometry of spinel lherzolites X Llovet, G Galan American Mineralogist 88 (1), 121-130, 2003 | 74 | 2003 |
| Electron probe microanalysis: A review of recent developments and applications in materials science and engineering X Llovet, A Moy, PT Pinard, JH Fournelle Progress in Materials Science 116, 100673, 2021 | 68 | 2021 |
| Measurements of L-shell x-ray production cross sections of W, Pt, and Au by 10–30-keV electrons CS Campos, MAZ Vasconcellos, X Llovet, F Salvat Physical Review A 66 (1), 012719, 2002 | 67 | 2002 |
| Secondary fluorescence in electron probe microanalysis of material couples X Llovet, PT Pinard, JJ Donovan, F Salvat Journal of Physics D: Applied Physics 45 (22), 225301, 2012 | 66 | 2012 |
| PENEPMA: A Monte Carlo program for the simulation of X-ray emission in electron probe microanalysis X Llovet, F Salvat Microscopy and Microanalysis 23 (3), 634-646, 2017 | 63 | 2017 |
| Electron probe microanalysis: A review of the past, present, and future R Rinaldi, X Llovet Microscopy and Microanalysis 21 (5), 1053-1069, 2015 | 61 | 2015 |
| Low-voltage electron-probe microanalysis of Fe–Si compounds using soft X-rays P Gopon, J Fournelle, PE Sobol, X Llovet Microscopy and Microanalysis 19 (6), 1698-1708, 2013 | 57 | 2013 |
| Electron probe microanalysis of thin films and multilayers using the computer program XFILM X Llovet, C Merlet Microscopy and Microanalysis 16 (1), 21-32, 2010 | 53 | 2010 |
| Near-threshold absolute M-shell x-ray production cross sections of Au and Bi by electron impact C Merlet, X Llovet, F Salvat Physical Review A 78 (2), 022704, 2008 | 49 | 2008 |
| Absolute K-shell ionization cross sections and L α and L β 1 x-ray production cross sections of Ga and As by 1.5–39− keV electrons C Merlet, X Llovet, JM Fernández-Varea Physical Review A 73 (6), 062719, 2006 | 49 | 2006 |
| Monte Carlo simulation of X‐ray emission using the general‐purpose code PENELOPE X Llovet, JM Fernández‐Varea, J Sempau, F Salvat Surface and Interface Analysis: An International Journal devoted to the …, 2005 | 48 | 2005 |
| Measurements of absolute K-shell ionization cross sections and L-shell x-ray production cross sections of Ge by electron impact C Merlet, X Llovet, F Salvat Physical Review A 69 (3), 032708, 2004 | 48 | 2004 |
| PENEPMA: A Monte Carlo programme for the simulation of X-ray emission in EPMA X Llovet, F Salvat IOP conference series: materials science and engineering 109 (1), 012009, 2016 | 44 | 2016 |
Francesc SalvatProfessor of Physics, Universitat de BarcelonaVerified email at ub.edu
