Christopher Weir Jones
Christopher Weir Jones
Engineering Measurement Division, National Physical Laboratory
Dirección de correo verificada de
Citado por
Citado por
Report on the first international comparison of small force facilities: a pilot study at the micronewton level
MS Kim, JR Pratt, U Brand, CW Jones
Metrologia 49 (1), 70, 2011
Open questions in surface topography measurement: a roadmap
R Leach, C Evans, L He, A Davies, A Duparré, A Henning, CW Jones, ...
Surface Topography: Metrology and Properties 3 (1), 013001, 2015
Advances in engineering nanometrology at the National Physical Laboratory
RK Leach, J Claverley, C Giusca, CW Jones, L Nimishakavi, W Sun, ...
Measurement Science and Technology 23 (7), 074002, 2012
Transient photocurrent and photovoltage mapping for characterisation of defects in organic photovoltaics
S Wood, D O'Connor, CW Jones, JD Claverley, JC Blakesley, C Giusca, ...
Solar Energy Materials and Solar Cells 161, 89-95, 2017
Review of low force transfer artefact technologies.
CW Jones, RK Leach
The high dynamic range surface metrology challenge
RK Leach, CW Jones, B Sherlock, A Krysinski
Proceedings of the 28th Annual Meeting of the American Society for Precision …, 2013
Development of a new traceable areal surface texture measuring instrument
RK Leach, DR Flack, EB Hughes, CW Jones
Wear 266 (5-6), 552-554, 2009
Adding a dynamic aspect to amplitude–wavelength space
CW Jones, RK Leach
Measurement Science and Technology 19 (5), 055105, 2008
Comparison of NIST SI force scale to NPL SI mass scale
CW Jones, JA Kramar, S Davidson, RK Leach, JR Pratt
Proc. ASPE (Portland, OR USA, 19–24 October 2008), 1-4, 2008
A hybrid 2D/3D inspection concept with smart routing optimisation for high throughput, high dynamic range and traceable critical dimension metrology
CW Jones, D O’Connor
Measurement Science and Technology 29 (7), 074004, 2018
Aperiodic interferometer for six degrees of freedom position measurement
DP Burt, PS Dobson, KE Docherty, CW Jones, RK Leach, S Thoms, ...
Optics letters 37 (7), 1247-1249, 2012
Metrology challenges for highly parallel micro-manufacture
R Leach, C Jones, B Sherlock, A Krysinski
10th International Conference on Multi-Material Micro Manufacture, San …, 2013
Concept and modelling of a novel active triskelion low force transfer artefact
C Jones, D Chetwynd, J Singh, RK Leach
Proc. 11th Int. Conf. of the Euspen (Como, Italy), 191-4, 2011
Dimensional nanometrology at the national physical laboratory
A Yacoot, R Leach, B Hughes, C Giusca, C Jones, A Wilson
Fifth International Symposium on Instrumentation Science and Technology 7133 …, 2009
Implementation of a linear optical encoder for high precision in line position referencing of plastic film in a Roll-to-Roll system
K Hollstein, D O’Connor, C Jones, P Morantz, P Comley
Innovations in Large-Area Electronics (innoLAE 2016), Cambridge, UK 1, 2016-2.02, 2016
High precision interferometric optical encoder for inline position referencing of instrumented plastic film in a roll-to-roll system
D O’Connor, G Moschetti, CW Jones, P Lovelock, P Shore, K Hollstein, ...
Proc. 31st ASPE Annual Meeting (Portland, OR, 23–28 October), 2016
Development and characterisation of traceable force measurement for nanotechnology
CW Jones
University of Warwick, 2012
RK Leach, CW Jones
Micro-Assembly Technologies and Applications: IFIP TC5 WG5. 5 Fourth …, 2008
Towards a traceable infrastructure for low force measurements
RK Leach, CW Jones
International Precision Assembly Seminar, 307-314, 2008
Amplitude-wavelength space in three dimensions.
CW Jones, RK Leach
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20