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Christopher Weir Jones
Christopher Weir Jones
Engineering Measurement Division, National Physical Laboratory
Dirección de correo verificada de npl.co.uk
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Report on the first international comparison of small force facilities: a pilot study at the micronewton level
MS Kim, JR Pratt, U Brand, CW Jones
Metrologia 49 (1), 70, 2011
782011
Open questions in surface topography measurement: a roadmap
R Leach, C Evans, L He, A Davies, A Duparré, A Henning, CW Jones, ...
Surface Topography: Metrology and Properties 3 (1), 013001, 2015
642015
Transient photocurrent and photovoltage mapping for characterisation of defects in organic photovoltaics
S Wood, D O'Connor, CW Jones, JD Claverley, JC Blakesley, C Giusca, ...
Solar Energy Materials and Solar Cells 161, 89-95, 2017
432017
Advances in engineering nanometrology at the National Physical Laboratory
RK Leach, J Claverley, C Giusca, CW Jones, L Nimishakavi, W Sun, ...
Measurement Science and Technology 23 (7), 074002, 2012
352012
Review of low force transfer artefact technologies.
CW Jones, RK Leach
172008
Development of a new traceable areal surface texture measuring instrument
RK Leach, DR Flack, EB Hughes, CW Jones
Wear 266 (5-6), 552-554, 2009
162009
The high dynamic range surface metrology challenge
RK Leach, CW Jones, B Sherlock, A Krysinski
Proceedings of the 28th Annual Meeting of the American Society for Precision …, 2013
142013
NPL Areal Standard: a multi-function calibration artefact for surface topography measuring instruments
LP Nimishakavi, CW Jones, CL Giusca
Laser Metrology and Machine Performance 13, 69-72, 2019
132019
A hybrid 2D/3D inspection concept with smart routing optimisation for high throughput, high dynamic range and traceable critical dimension metrology
CW Jones, D O’Connor
Measurement Science and Technology 29 (7), 074004, 2018
112018
Adding a dynamic aspect to amplitude–wavelength space
CW Jones, RK Leach
Measurement Science and Technology 19 (5), 055105, 2008
112008
Comparison of NIST SI force scale to NPL SI mass scale
CW Jones, JA Kramar, S Davidson, RK Leach, JR Pratt
Proc. ASPE, 1-4, 2008
92008
3D roughness standard for performance verification of topography instruments for additively-manufactured surface inspection
CW Jones, W Sun, H Boulter, S Brown
Measurement Science and Technology 33 (8), 084003, 2022
62022
Aperiodic interferometer for six degrees of freedom position measurement
DP Burt, PS Dobson, KE Docherty, CW Jones, RK Leach, S Thoms, ...
Optics Letters 37 (7), 1247-1249, 2012
62012
Thermal and dimensional evaluation of a test plate for assessing the measurement capability of a thermal imager within nuclear decommissioning storage
J McMillan, M Hayes, R Hornby, S Korniliou, C Jones, D O’Connor, ...
Measurement 202, 111903, 2022
42022
Metrology challenges for highly parallel micro-manufacture
R Leach, C Jones, B Sherlock, A Krysinski
10th International Conference on Multi-Material Micro Manufacture, San …, 2013
32013
Concept and modelling of a novel active triskelion low force transfer artefact
C Jones, D Chetwynd, J Singh, RK Leach
Proc. 11th Int. Conf. of the Euspen (Como, Italy), 191-4, 2011
32011
Dimensional nanometrology at the national physical laboratory
A Yacoot, R Leach, B Hughes, C Giusca, C Jones, A Wilson
Fifth International Symposium on Instrumentation Science and Technology 7133 …, 2009
32009
A universal substrate sample fixture for efficient multi-instrument inspection of large, flexible substrates, with absolute position registration support
C Jones, M Santiano, S Downes, R Bellotti, D O’Connor, G Picotto
Proceedings of the 16th international conference of the european society for …, 2016
22016
Low force metrology at the National Physical Laboratory, UK
CW Jones
22010
High precision interferometric optical encoder for inline position referencing of instrumented plastic film in a roll-to-roll system
D O’Connor, G Moschetti, CW Jones, P Lovelock, P Shore, K Hollstein, ...
Proc. 31st ASPE Annual Meeting, 2016
12016
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Artículos 1–20