Raul Chipana
Raul Chipana
Verified email at inf.ufrgs.br
Title
Cited by
Cited by
Year
An analytical model of the propagation induced pulse broadening (PIPB) effects on single event transient in flash-based FPGAs
L Sterpone, N Battezzati, FL Kastensmidt, R Chipana
IEEE Transactions on Nuclear science 58 (5), 2333-2340, 2011
362011
TID in flash-based FPGA: Power supply-current rise and logic function mapping effects in propagation-delay degradation
FL Kastensmidt, ECP Fonseca, RG Vaz, OL Gonçalez, R Chipana, ...
IEEE Transactions on Nuclear Science 58 (4), 1927-1934, 2011
282011
Reliability analysis of H-tree random access memories implemented with built in current sensors and parity codes for multiple bit upset correction
C Argyrides, R Chipana, F Vargas, DK Pradhan
IEEE Transactions on Reliability 60 (3), 528-537, 2011
232011
SET susceptibility analysis of clock tree and clock mesh topologies
R Chipana, FL Kastensmidt
2014 IEEE Computer Society Annual Symposium on VLSI, 559-564, 2014
112014
Designing and analyzing a SpaceWire router IP for soft errors detection
J Tarrillo, R Chipana, E Chielle, FL Kastensmidt
2011 12th Latin American Test Workshop (LATW), 1-6, 2011
102011
SET susceptibility estimation of clock tree networks from layout extraction
R Chipana, FL Kastensmidt, J Tonfat, R Reis
2012 13th Latin American Test Workshop (LATW), 1-6, 2012
82012
Soft-error probability due to SET in clock tree networks
R Chipana, E Chielle, FL Kastensmidt, J Tonfat, R Reis
2012 IEEE Computer Society Annual Symposium on VLSI, 338-343, 2012
62012
SET susceptibility analysis in buffered tree clock distribution networks
R Chipana, FL Kastensmidt, J Tonfat, R Reis, M Guthaus
2011 12th European Conference on Radiation and Its Effects on Components and …, 2011
32011
BICS-based March test for resistive-open defect detection in SRAMs
R Chipana, L Bolzani, F Vargas
2010 11th Latin American Test Workshop, 1-6, 2010
22010
Securing physically uncloneable functions with addtional random ternary states
BF Cambou, R Chipana, B Habib
US Patent App. 16/492,910, 2020
12020
Investigating the Use of BICS to detect resistive-open defects in SRAMs
R Chipana, L Bolzani, F Vargas, J Semião, J Rodríguez-Andina, I Teixeira, ...
2010 IEEE 16th International On-Line Testing Symposium, 200-201, 2010
12010
Integrated Circuit Reliability-Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction
C Argyrides, R Chipana, F Vargas, DK Pradhan
IEEE Transactions on Reliability 60 (3), 528, 2011
2011
2010 RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) CONFERENCE-LANGENFELD, AUSTRIA, SEPTEMBER 20-24, 2010-An Analytical Model of the Propagation Induced Pulse …
L Sterpone, N Battezzati, FL Kastensmidt, R Chipana
IEEE Transactions on Nuclear Science 58 (5), 2333, 2011
2011
NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE (NSREC) DENVER, CO, JULY 19-23, 2010-TID in Flash-Based FPGA: Power Supply-Current Rise and Logic Function Mapping Effects in …
FL Kastensmidt, ECP Fonseca, RG Vaz, OL Gonçalez, R Chipana, ...
IEEE Transactions on Nuclear Science 58 (4), 1927, 2011
2011
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