| A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level J Segura, C De Benito, A Rubio, CF Hawkins Proceedings of 1995 IEEE International Test Conference (ITC), 544-551, 1995 | 66 | 1995 |
| On the thermal models for resistive random access memory circuit simulation JB Roldán, G González-Cordero, R Picos, E Miranda, F Palumbo, ... Nanomaterials 11 (5), 1261, 2021 | 56 | 2021 |
| A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors J Segura, C De Benito, A Rubio, CF Hawkins Journal of Electronic Testing 8 (3), 229-239, 1996 | 47 | 1996 |
| Impact of thermal gradients on clock skew and testing SA Bota, JL Rossello, C De Benito, A Keshavarzi, J Segura IEEE Design & Test of Computers 23 (5), 414-424, 2006 | 37 | 2006 |
| Exploring resistive switching‐based memristors in the charge–flux domain: A modeling approach MM Al Chawa, R Picos, JB Roldan, F Jimenez‐Molinos, MA Villena, ... International Journal of Circuit Theory and Applications 46 (1), 29-38, 2018 | 36 | 2018 |
| A compact gate-level energy and delay model of dynamic CMOS gates JL Rosselló, C de Benito, J Segura IEEE Transactions on Circuits and Systems II: Express Briefs 52 (10), 685-689, 2005 | 28 | 2005 |
| A simple piecewise model of reset/set transitions in bipolar ReRAM memristive devices MM Al Chawa, C de Benito, R Picos IEEE Transactions on Circuits and Systems I: Regular Papers 65 (10), 3469-3480, 2018 | 24 | 2018 |
| Dynamic critical resistance: A timing-based critical resistance model for statistical delay testing of nanometer ICs JL Rosselló, C de Benito, SA Bota, J Segura 2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007 | 14 | 2007 |
| Design and implementation of passive memristor emulators using a charge-flux approach MM Al Chawa, C de Benito, M Roca, R Picos, SG Stavrinides 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018 | 13 | 2018 |
| A procedure to calculate a delay model for memristive switches C de Benito, MM Al Chawa, R Picos, E Garcia-Moreno Workshop on Memristor Technology, Design, Automation and Computing, 2017 | 13 | 2017 |
| Waveform and frequency effects on reset transition in bipolar ReRAM in flux-charge space MM Al Chawa, A Rodriguez-Fernandez, M Bargallo, F Campabadal, ... International Conference on Memristive Materials, Devices & Systems …, 2017 | 11 | 2017 |
| Emulating memristors in a digital environment using stochastic logic O Camps, R Picos, C de Benito, MM Al Chawa, SG Stavrinides 2018 7th International Conference on Modern Circuits and Systems …, 2018 | 9 | 2018 |
| Effective accuracy estimation and representation error reduction for stochastic logic operations O Camps, R Picos, C de Benito, MM Al Chawa, SG Stavrinides 2018 7th International Conference on Modern Circuits and Systems …, 2018 | 8 | 2018 |
| A purely digital memristor emulator based on a flux-charge model O Camps, MM Al Chawa, C de Benito, M Roca, SG Stavrinides, R Picos, ... 2018 25th IEEE International Conference on Electronics, Circuits and Systems …, 2018 | 6 | 2018 |
| On the chaotic nature of random telegraph noise in unipolar RRAM memristor devices SG Stavrinides, MP Hanias, MB Gonzalez, F Campabadal, ... Chaos, Solitons & Fractals 160, 112224, 2022 | 5 | 2022 |
| Using stochastic computing for virtual screening acceleration CF Frasser, C de Benito, ES Skibinsky-Gitlin, V Canals, J Font-Rosselló, ... Electronics 10 (23), 2981, 2021 | 5 | 2021 |
| Cantilever NEMS relay-based SRAM devices for enhanced reliability SA Bota, J Verd, J Barceló, X Gili, B Alorda, G Torrens, C De Benito, ... 2017 12th International Conference on Design & Technology of Integrated …, 2017 | 5 | 2017 |
| A switched capacitor memristor emulator using stochastic computing C de Benito, O Camps, MM Al Chawa, SG Stavrinides, R Picos Technologies 10 (2), 39, 2022 | 4 | 2022 |
| A stochastic switched capacitor memristor emulator C de Benito, O Camps, MM Al Chawa, SG Stavrinides, R Picos 2021 10th International Conference on Modern Circuits and Systems …, 2021 | 4 | 2021 |
| Top-side pulsed laser induced single event upsets in highly-scaled SRAM devices I de Paúl, JL Merino, G Torrens, C de Benito, J Verd, J Segura, SA Bota 2013 14th European Conference on Radiation and Its Effects on Components and …, 2013 | 4 | 2013 |
