Seguir
Wael Hourani
Wael Hourani
Maître de conférences à l'Université de Franche Comte - Institut FEMTO-ST
Dirección de correo verificada de univ-fcomte.fr
Título
Citado por
Citado por
Año
Thermal exfoliation of fluorinated graphite
M Dubois, K Guérin, Y Ahmad, N Batisse, M Mar, L Frezet, W Hourani, ...
Carbon 77, 688-704, 2014
532014
Anisotropic charge transport in large single crystals of π-conjugated organic molecules
W Hourani, K Rahimi, I Botiz, FPV Koch, G Reiter, P Lienerth, T Heiser, ...
Nanoscale 6 (9), 4774-4780, 2014
462014
LaAlO3/Si capacitors: Comparison of different molecular beam deposition conditions and their impact on electrical properties
S Pelloquin, G Saint-Girons, N Baboux, D Albertini, W Hourani, ...
Journal of Applied Physics 113 (3), 2013
202013
Toward a better understanding of the nanoscale degradation mechanisms of ultra-thin Si02/Si films: Investigation of the best experimental conditions with a conductive-atomic …
R Arinero, W Hourani, AD Touboul, B Gautier, M Ramonda, D Albertini, ...
Journal of Applied Physics 110 (1), 2011
122011
Study of the physical and electrical degradation of thin oxide films by atomic force microscope
W Hourani, B Gautier, L Militaru, D Albertini, A Descamps-Mandine
Journal of Vacuum Science & Technology B 29 (1), 2011
122011
Nanoscale elemental quantification in heterostructured SiGe nanowires
W Hourani, P Periwal, F Bassani, T Baron, G Patriarche, E Martinez
Nanoscale 7 (18), 8544-8553, 2015
82015
Tuning the Electrical Properties of Tungsten Oxide Thin Films Deposited by Reactive Magnetron Sputtering
KBJI N’Djoré, M Grafouté, Y Makoudi, W Hourani, C Rousselot
Coatings 12 (2), 274, 2022
72022
3D Auger quantitative depth profiling of individual nanoscaled III–V heterostructures
W Hourani, V Gorbenko, JP Barnes, C Guedj, R Cipro, J Moeyaert, ...
Journal of Electron Spectroscopy and Related Phenomena 213, 1-10, 2016
72016
Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope
W Hourani, B Gautier, L Militaru, D Albertini, A Descamps-Mandine, ...
Microelectronics Reliability 51 (12), 2097-2101, 2011
72011
From Solid-State Dewetting of Ultrathin, Compressively Strained Silicon–Germanium-on-Insulator Films to Mastering the Stoichiometry of Si1–xGex Nanocrystals
Y Almadori, Ł Borowik, N Chevalier, W Hourani, F Glowacki, JC Barbe
The Journal of Physical Chemistry C 120 (13), 7412-7420, 2016
62016
Chemical depth profiling and 3D reconstruction of III–V heterostructures selectively grown on non‐planar Si substrates by MOCVD
V Gorbenko, M Veillerot, A Grenier, G Audoit, W Hourani, E Martinez, ...
physica status solidi (RRL)–Rapid Research Letters 9 (3), 202-205, 2015
62015
Nanoscale characterization of leakage currents in ultra-thin oxide layers for microelectronics
W Hourani
INSA de Lyon, 2011
42011
Nanoscale study of the influence of atomic oxygen on the electrical properties of LaAlO3 thin high-k oxide films deposited by molecular beam epitaxy
W Hourani, L Militaru, B Gautier, D Albertini, A Descamps-Mandine, ...
MRS Spring Meeting, San Francisco, CA, 5-9, 2010
32010
Soluble Two‐Dimensional Covalent Organometallic Polymers by (Arene) Ruthenium‐Sulfur Chemistry
F Cherioux, J Coraux, V Muller, L Magaud, N Bendiab, M Den Hertog, ...
Chemistry-A European Journal, 2017
22017
The needs and challenges of electrical measurements for micro/nanoelectronic devices
B Gautier, S Martin, W Hourani, A Grandfond, N Baboux, D Albertini
Consultative Committee for Electricity and Magnetism workshop, 2017
12017
Extended monolayer of cyano-ended oligo(para-phenylenes) at the air/HOPG interface investigated by high-resolution AFM
W Hourani, S Lamare, Y Makoudi, F Palmino, F Cherioux
Nanotechnology, 2016
12016
Photoemission investigation of the graphene surface cleaning by hydrogen/nitrogen plasma
D Ferrah, O Renault, C Petit-Etienne, H Okuno, W Hourani, K Dipankar, ...
16th European Conference on Applications of Surface and Interface Analysis …, 2015
12015
Nanoscale Surface and Sub-Surface Chemical Analysis of SiGe Nanowires
W Hourani, E Martinez, P Periwal, G Patriarche, F Bassani, JM Fabbri, ...
Microscopy and Microanalysis 20 (S3), 2052-2053, 2014
12014
Thermal Annealing Effect on the Structure, Optical and Electrical Properties of Lanthanum Manganite Thin Films Prepared by Reactive Co-Sputtering
W Hourani, C Rousselot, KBJI N’Djoré, A Billard, M Arab Pour Yazdi, ...
Electronic Materials 3 (4), 291-300, 2022
2022
Arab Pour Yazdi, M.; Makoudi, Y. Thermal Annealing Effect on the Structure, Optical and Electrical Properties of Lanthanum Manganite Thin Films Prepared by Reactive Co-Sputtering
W Hourani, C Rousselot, K N’Djoré, A Billard
Electron. Mater 3, 291-300, 2022
2022
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20