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Yasin Gunaydin
Yasin Gunaydin
PhD Student, University of Bristol
Verified email at bristol.ac.uk - Homepage
Title
Cited by
Cited by
Year
Performance of wide-bandgap gallium nitride vs silicon carbide cascode transistors
Y Gunaydin, S Jahdi, O Alatise, JO Gonzalez, R Wu, B Stark, M Hedayati, ...
2020 IEEE Energy Conversion Congress and Exposition (ECCE), 239-245, 2020
62020
Performance of wide-bandgap discrete and module cascodes at sub-1 kV: GaN vs. SiC
Y Gunaydin, S Jahdi, O Alatise, JO Gonzalez, R Wu, B Stark, M Hedayati, ...
Microelectronics reliability 125, 114362, 2021
42021
Impact of temperature and switching rate on forward and reverse conduction of gan and sic cascode devices: A technology evaluation
Y Gunaydin, S Jahdi, O Alatise, JO Gonzalez, M Hedayati, B Stark, J Yang, ...
IET Digital Library, 2021
42021
Analysis of cyclic spontaneous switchings in gan & sic cascodes by snappy turn-off currents
Y Gunaydin, S Jahdi, O Alatise, JA Ortiz-Gonzalez, A Aithal, X Yuan, ...
Microelectronics reliability 114, 113752, 2020
32020
Analysis of Performance and Reliability of Sub-kV SiC and GaN Cascode Power Electronic Devices
Y Gunaydin
The University of Bristol, 2023
22023
Unclamped inductive stressing of GaN and SiC Cascode power devices to failure at elevated temperatures
Y Gunaydin, S Jahdi, X Yuan, R Yu, C Shen, SP Munagala, A Hopkins, ...
Microelectronics Reliability 138, 114711, 2022
12022
Analysis of 1st & 3rd Quadrant Electrothermal Robustness of Symmetrical and Asymmetrical Double- Trench SiC Power MOSFETs Under UIS
M Hosseinzadehlish, S Jahdi, X Yuan, C Shen, Y Gunaydin, I Laird, ...
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe …, 2022
12022
Transfer IV and Threshold Voltage Drift of GaN and SiC Cascode Discrete Devices Under Gate Bias Stress
Y Gunaydin, S Jahdi, X Yuan, B Stark, J Ortiz-Gonzalez, E Bashar, ...
PCIM Europe 2022; International Exhibition and Conference for Power …, 2022
12022
Electrothermal power cycling of GaN and SiC cascode devices
Y Gunaydin, S Jahdi, R Yu, X Yuan, O Alatise, JO Gonzalez
Microelectronics Reliability 150, 115117, 2023
2023
Experimental Analysis of Short Circuit Robustness of GaN and SiC Cascode Devices
Y Gunaydin, S Jahdi, X Yuan, C Shen, M Hosseinzadelish, R Yu, ...
PCIM Europe 2023; International Exhibition and Conference for Power …, 2023
2023
Impact of Electrothermal Bias Temperature Instability Stress on Threshold Voltage Drift of GaN Cascode Power Modules
Y Gunaydin, S Jahdi, X Yuan, J Yang, R Yu, B Stark
2022 IEEE Workshop on Wide Bandgap Power Devices and Applications in Europe …, 2022
2022
The impact of electrothermal stress on threshold voltage drift of gan and SIC cascode devices
Y Gunaydin, S Jahdi, X Yuan, J Yang, B Stark, J Ortiz-Gonzalez, R Wu, ...
IET Digital Library, 2022
2022
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