Antonio Miele
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Citado por
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Año
TMR and Partial Dynamic Reconfiguration to mitigate SEU faults in FPGAs
C Bolchini, A Miele, MD Santambrogio
22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI …, 2007
1962007
A novel design methodology for implementing reliability-aware systems on SRAM-based FPGAs
C Bolchini, A Miele, C Sandionigi
Computers, IEEE Transactions on 60 (12), 1744-1758, 2011
912011
Combined DVFS and mapping exploration for lifetime and soft-error susceptibility improvement in MPSoCs
A Das, A Kumar, B Veeravalli, C Bolchini, A Miele
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
682014
Reliability-driven system-level synthesis for mixed-critical embedded systems
C Bolchini, A Miele
IEEE Transactions on Computers 62 (12), 2489-2502, 2012
612012
A methodology for preference-based personalization of contextual data
A Miele, E Quintarelli, L Tanca
Proceedings of the 12th International Conference on Extending Database …, 2009
512009
Self-adaptive fault tolerance in multi-/many-core systems
C Bolchini, M Carminati, A Miele
Journal of Electronic Testing 29 (2), 159-175, 2013
412013
Automated resource-aware floorplanning of reconfigurable areas in partially-reconfigurable FPGA systems
C Bolchini, A Miele, C Sandionigi
2011 21st International Conference on Field Programmable Logic and …, 2011
402011
Run-time mapping for reliable many-cores based on energy/performance trade-offs
C Bolchini, M Carminati, A Miele, A Das, A Kumar, B Veeravalli
2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2013
392013
Reliability-aware runtime power management for many-core systems in the dark silicon era
AM Rahmani, MH Haghbayan, A Miele, P Liljeberg, A Jantsch, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (2), 427-440, 2016
362016
Fault models and injection strategies in SystemC specifications
C Bolchini, A Miele, D Sciuto
2008 11th EUROMICRO Conference on Digital System Design Architectures …, 2008
342008
A lifetime-aware runtime mapping approach for many-core systems in the dark silicon era
MH Haghbayan, A Miele, AM Rahmani, P Liljeberg, H Tenhunen
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 854-857, 2016
322016
Workload-aware power optimization strategy for asymmetric multiprocessors
E Del Sozzo, GC Durelli, EMG Trainiti, A Miele, MD Santambrogio, ...
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 531-534, 2016
302016
An Adaptive Approach for Online Fault Management in Many-Core Architectures
C Bolchini, A Miele, D Sciuto
Design, Automation and Testing in Europe (DATE) Conference, 1429-1432, 2012
292012
Performance/reliability-aware resource management for many-cores in dark silicon era
MH Haghbayan, A Miele, AM Rahmani, P Liljeberg, H Tenhunen
IEEE Transactions on Computers 66 (9), 1599-1612, 2017
262017
A lightweight and open-source framework for the lifetime estimation of multicore systems
C Bolchini, M Carminati, M Gribaudo, A Miele
2014 IEEE 32nd International Conference on Computer Design (ICCD), 166-172, 2014
262014
A model of soft error effects in generic IP processors
C Bolchini, A Miele, F Salice, D Sciuto
20th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2005
262005
Hybrid service-oriented architectures: a case-study in the automotive domain
L Baresi, C Ghezzi, A Miele, M Miraz, A Naggi, F Pacifici
Proceedings of the 5th international workshop on software engineering and …, 2005
262005
Floorplanning automation for partial-reconfigurable FPGAs via feasible placements generation
M Rabozzi, GC Durelli, A Miele, J Lillis, MD Santambrogio
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (1), 151-164, 2016
252016
A data-mining approach to preference-based data ranking founded on contextual information
A Miele, E Quintarelli, E Rabosio, L Tanca
Information Systems 38 (4), 524-544, 2013
242013
Design space exploration for the design of reliable SRAM-based FPGA systems
C Bolchini, A Miele
2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI …, 2008
232008
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Artículos 1–20