| Optimal selective Huffman coding for test-data compression X Kavousianos, E Kalligeros, D Nikolos IEEE transactions on computers 56 (8), 1146-1152, 2007 | 155 | 2007 |
| Multilevel Huffman coding: An efficient test-data compression method for IP cores X Kavousianos, E Kalligeros, D Nikolos IEEE transactions on computer-aided design of integrated circuits and …, 2007 | 60 | 2007 |
| Multilevel-Huffman Test-Data Compression for IP Cores with Multiple Scan Chains X Kavousianos, E Kalligeros, D Nikolos Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 16 (7 …, 2008 | 48 | 2008 |
| Test data compression based on variable-to-variable Huffman encoding with codeword reusability X Kavousianos, E Kalligeros, D Nikolos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008 | 47 | 2008 |
| Multiphase BIST: A new reseeding technique for high test-data compression E Kalligeros, X Kavousianos, D Nikolos IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004 | 33 | 2004 |
| An efficient seeds selection method for LFSR-based test-per-clock BIST E Kalligeros, X Kavousianos, D Bakalis, D Nikolos Proceedings International Symposium on Quality Electronic Design, 261-266, 2002 | 29 | 2002 |
| On-the-fly reseeding: A new reseeding technique for test-per-clock BIST E Kalligeros, X Kavousianos, D Bakalis, D Nikolos Journal of Electronic Testing 18 (3), 315-332, 2002 | 25 | 2002 |
| Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010 | 24 | 2010 |
| State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores V Tenentes, X Kavousianos, E Kalligeros 2008 Design, Automation and Test in Europe, 474-479, 2008 | 24 | 2008 |
| Reseeding-based test set embedding with reduced test sequences E Kalligeros, D Kaseridis, X Kavousianos, D Nikolos Sixth international symposium on quality electronic design (isqed'05), 226-231, 2005 | 24 | 2005 |
| Merged switch allocation and traversal in network-on-chip switches G Dimitrakopoulos, E Kalligeros, K Galanopoulos IEEE Transactions on Computers 62 (10), 2001-2012, 2012 | 20 | 2012 |
| New reseeding technique for LFSR-based test pattern generation E Kalligeros, X Kavousianos, D Bakalis, D Nikolos Proceedings Seventh International On-Line Testing Workshop, 80-86, 2001 | 20 | 2001 |
| ElastiNoC: A self-testable distributed VC-based network-on-chip architecture I Seitanidis, A Psarras, E Kalligeros, C Nicopoulos, G Dimitrakopoulos 2014 Eighth IEEE/ACM International Symposium on Networks-on-Chip (NoCS), 135-142, 2014 | 17 | 2014 |
| Defect-oriented LFSR reseeding to target unmodeled defects using stuck-at test sets X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros IEEE transactions on very large scale integration (VLSI) systems 19 (12 …, 2010 | 16 | 2010 |
| Lawris: A rule-based Arduino programming system for young students S Arakliotis, DG Nikolos, E Kalligeros 2016 5th International Conference on Modern Circuits and Systems …, 2016 | 12 | 2016 |
| A ROMless LFSR reseeding scheme for scan-based BIST E Kalligeros, X Kavousianos, D Nikolos Proceedings of the 11th Asian Test Symposium, 2002.(ATS'02)., 206-211, 2002 | 12 | 2002 |
| Weighted logic locking: A new approach for IC piracy protection N Karousos, K Pexaras, IG Karybali, E Kalligeros 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017 | 11 | 2017 |
| LFSR-based test-data compression with self-stoppable seeds M Koutsoupia, E Kalligeros, X Kavousianos, D Nikolos 2009 Design, Automation & Test in Europe Conference & Exhibition, 1482-1487, 2009 | 11 | 2009 |
| Low power BIST for wallace tree-based multipliers D Bakalis, E Kalligeros, D Nikolos, HT Vergos, G Alexiou Proceedings IEEE 2000 First International Symposium on Quality Electronic …, 2000 | 11 | 2000 |
| Efficient test-data compression for IP cores using multilevel Huffman coding X Kavousianos, E Kalligeros, D Nikolos Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006 | 10 | 2006 |
