Emmanouil Kalligeros
Emmanouil Kalligeros
Assistant Professor, Information and Communication Systems Engineering Dept., Univ. of the Aegean
Verified email at aegean.gr - Homepage
Title
Cited by
Cited by
Year
Optimal selective Huffman coding for test-data compression
X Kavousianos, E Kalligeros, D Nikolos
IEEE transactions on computers 56 (8), 1146-1152, 2007
1552007
Multilevel Huffman coding: An efficient test-data compression method for IP cores
X Kavousianos, E Kalligeros, D Nikolos
IEEE transactions on computer-aided design of integrated circuits and …, 2007
602007
Multilevel-Huffman Test-Data Compression for IP Cores with Multiple Scan Chains
X Kavousianos, E Kalligeros, D Nikolos
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 16 (7 …, 2008
482008
Test data compression based on variable-to-variable Huffman encoding with codeword reusability
X Kavousianos, E Kalligeros, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
472008
Multiphase BIST: A new reseeding technique for high test-data compression
E Kalligeros, X Kavousianos, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
332004
An efficient seeds selection method for LFSR-based test-per-clock BIST
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Proceedings International Symposium on Quality Electronic Design, 261-266, 2002
292002
On-the-fly reseeding: A new reseeding technique for test-per-clock BIST
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Journal of Electronic Testing 18 (3), 315-332, 2002
252002
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
242010
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
2008 Design, Automation and Test in Europe, 474-479, 2008
242008
Reseeding-based test set embedding with reduced test sequences
E Kalligeros, D Kaseridis, X Kavousianos, D Nikolos
Sixth international symposium on quality electronic design (isqed'05), 226-231, 2005
242005
Merged switch allocation and traversal in network-on-chip switches
G Dimitrakopoulos, E Kalligeros, K Galanopoulos
IEEE Transactions on Computers 62 (10), 2001-2012, 2012
202012
New reseeding technique for LFSR-based test pattern generation
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Proceedings Seventh International On-Line Testing Workshop, 80-86, 2001
202001
ElastiNoC: A self-testable distributed VC-based network-on-chip architecture
I Seitanidis, A Psarras, E Kalligeros, C Nicopoulos, G Dimitrakopoulos
2014 Eighth IEEE/ACM International Symposium on Networks-on-Chip (NoCS), 135-142, 2014
172014
Defect-oriented LFSR reseeding to target unmodeled defects using stuck-at test sets
X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros
IEEE transactions on very large scale integration (VLSI) systems 19 (12 …, 2010
162010
Lawris: A rule-based Arduino programming system for young students
S Arakliotis, DG Nikolos, E Kalligeros
2016 5th International Conference on Modern Circuits and Systems …, 2016
122016
A ROMless LFSR reseeding scheme for scan-based BIST
E Kalligeros, X Kavousianos, D Nikolos
Proceedings of the 11th Asian Test Symposium, 2002.(ATS'02)., 206-211, 2002
122002
Weighted logic locking: A new approach for IC piracy protection
N Karousos, K Pexaras, IG Karybali, E Kalligeros
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017
112017
LFSR-based test-data compression with self-stoppable seeds
M Koutsoupia, E Kalligeros, X Kavousianos, D Nikolos
2009 Design, Automation & Test in Europe Conference & Exhibition, 1482-1487, 2009
112009
Low power BIST for wallace tree-based multipliers
D Bakalis, E Kalligeros, D Nikolos, HT Vergos, G Alexiou
Proceedings IEEE 2000 First International Symposium on Quality Electronic …, 2000
112000
Efficient test-data compression for IP cores using multilevel Huffman coding
X Kavousianos, E Kalligeros, D Nikolos
Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006
102006
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