Follow
Emmanouil Kalligeros
Emmanouil Kalligeros
Assistant Professor, Information and Communication Systems Engineering Dept., Univ. of the Aegean
Verified email at aegean.gr - Homepage
Title
Cited by
Cited by
Year
Optimal selective Huffman coding for test-data compression
X Kavousianos, E Kalligeros, D Nikolos
IEEE transactions on computers 56 (8), 1146-1152, 2007
1592007
Thwarting all logic locking attacks: Dishonest oracle with truly random logic locking
N Limaye, E Kalligeros, N Karousos, IG Karybali, O Sinanoglu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
692020
Multilevel Huffman coding: An efficient test-data compression method for IP cores
X Kavousianos, E Kalligeros, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007
642007
Test data compression based on variable-to-variable Huffman encoding with codeword reusability
X Kavousianos, E Kalligeros, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
512008
Multilevel-Huffman Test-Data Compression for IP Cores with Multiple Scan Chains
X Kavousianos, E Kalligeros, D Nikolos
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 16 (7 …, 2008
472008
Multiphase BIST: A new reseeding technique for high test-data compression
E Kalligeros, X Kavousianos, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
332004
Weighted logic locking: a new approach for IC piracy protection
N Karousos, K Pexaras, IG Karybali, E Kalligeros
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017
302017
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
Proceedings of the conference on Design, automation and test in Europe, 474-479, 2008
302008
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
282010
An efficient seeds selection method for LFSR-based test-per-clock BIST
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Proceedings International Symposium on Quality Electronic Design, 261-266, 2002
282002
Merged switch allocation and traversal in network-on-chip switches
G Dimitrakopoulos, E Kalligeros, K Galanopoulos
IEEE Transactions on Computers 62 (10), 2001-2012, 2012
272012
Reseeding-based test set embedding with reduced test sequences
E Kalligeros, D Kaseridis, X Kavousianos, D Nikolos
Sixth international symposium on quality electronic design (isqed'05), 226-231, 2005
272005
On-the-fly reseeding: A new reseeding technique for test-per-clock BIST
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Journal of Electronic Testing 18, 315-332, 2002
252002
New reseeding technique for LFSR-based test pattern generation
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Proceedings Seventh International On-Line Testing Workshop, 80-86, 2001
222001
Lawris: A rule-based Arduino programming system for young students
S Arakliotis, DG Nikolos, E Kalligeros
2016 5th International Conference on Modern Circuits and Systems …, 2016
212016
ElastiNoC: A self-testable distributed VC-based network-on-chip architecture
I Seitanidis, A Psarras, E Kalligeros, C Nicopoulos, G Dimitrakopoulos
2014 Eighth IEEE/ACM International Symposium on Networks-on-Chip (NoCS), 135-142, 2014
212014
Defect-oriented LFSR reseeding to target unmodeled defects using stuck-at test sets
X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros
IEEE transactions on very large scale integration (VLSI) systems 19 (12 …, 2010
182010
Optimization and hardware implementation of image and video watermarking for low-cost applications
K Pexaras, IG Karybali, E Kalligeros
IEEE Transactions on Circuits and Systems I: Regular Papers 66 (6), 2088-2101, 2019
172019
Scalable arbiters and multiplexers for on-FGPA interconnection networks
G Dimitrakopoulos, C Kachris, E Kalligeros
2011 21st International Conference on Field Programmable Logic and …, 2011
122011
An efficient test set embedding scheme with reduced test data storage and test sequence length requirements for scan-based testing
D Kaseridis, E Kalligeros, X Kavousianos, D Nikolos
Informal Digest of Papers of IEEE European Test Symposium (ETS), 147-150, 2005
122005
The system can't perform the operation now. Try again later.
Articles 1–20