Ion implantation for deterministic single atom devices JL Pacheco, M Singh, DL Perry, JR Wendt, G Ten Eyck, RP Manginell, ... Review of Scientific Instruments 88 (12), 123301, 2017 | 51 | 2017 |
Electrostatically defined silicon quantum dots with counted antimony donor implants M Singh, JL Pacheco, D Perry, E Garratt, G Ten Eyck, NC Bishop, ... Applied Physics Letters 108 (6), 062101, 2016 | 29 | 2016 |
Cryogenic electron microscopy reveals that applied pressure promotes short circuits in Li batteries KL Harrison, LC Merrill, DM Long, SJ Randolph, S Goriparti, J Christian, ... Iscience 24 (12), 103394, 2021 | 20 | 2021 |
Controlling light emission by engineering atomic geometries in silicon photonics A Nandi, X Jiang, D Pak, D Perry, K Han, ES Bielejec, Y Xuan, M Hosseini Optics letters 45 (7), 1631-1634, 2020 | 11 | 2020 |
Evaluation of the accuracy of stopping and range of ions in matter simulations through secondary ion mass spectrometry and Rutherford backscattering spectrometry for low energy … M Titze, JL Pacheco, T Byers, SB Van Deusen, DL Perry, D Weathers, ... Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 39 (6 …, 2021 | 6 | 2021 |
Lithium source for focused ion beam implantation and analysis M Titze, DL Perry, EA Auden, JL Pacheco, JBS Abraham, ES Bielejec Journal of Vacuum Science & Technology B, Nanotechnology and …, 2021 | 5 | 2021 |
Focused ion beam preparation of low melting point metals: Lessons learned from indium JR Michael, DL Perry, DP Cummings, JA Walraven, MB Jordan Microscopy and Microanalysis 28 (3), 603-610, 2022 | 4 | 2022 |
Focused Ion Beam Preparation of Low Melting Point Metals: Lessons Learned from Pb/Sn Solders PG Kotula, SM Vitale, DL Perry, DP Cummings, J Deitz, JR Michael Microscopy and Microanalysis 28 (S1), 10-12, 2022 | 1 | 2022 |
Microstructural Analysis of Cadmium Whiskers on Long-Term-Used Hardware R White, Z Ghanbari, D Susan, S Dickens, T Ruggles, D Perry Metallurgical and Materials Transactions A 53 (1), 200-210, 2022 | 1 | 2022 |
Microanalysis of Cd Whiskers on Cd Plated Long-Term Used Hardware S Dickens, T Ruggles, R White, Z Ghanbari, D Perry, D Susan Microscopy and Microanalysis 27 (S1), 2738-2740, 2021 | 1 | 2021 |
Integration of rare earth ions and photonic resonators for quantum application D Pak, A Nandi, X Jiang, D Perry, ES Bielejec, Y Xuan, M Hosseini CLEO: QELS_Fundamental Science, FW3C. 2, 2020 | 1 | 2020 |
Loss suppression by engineering atomic geometries in silicon photonics A Nandi, X Jiang, D Pak, D Perry, K Han, ES Bielejec, Y Xuan, M Hosseini arXiv, arXiv: 1902.08898, 2019 | 1 | 2019 |
Comparing SRIM simulations and experimental results for shallow implantation of Sb into Si. JL Pacheco, T Byers, SB Van Deusen, DL Perry, DL Weathers, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2016 | 1 | 2016 |
Observation of Focused Ion Beam-Induced Artifacts in Transmission Electron Microscopy Samples Leading to the Epitaxial Growth of AlGaSb Quantum Dots on the GaSb Substrate DP Cummings, DL Perry, LJ Jauregui, J Deitz, JF Klem, W Pan, P Lu Microscopy and Microanalysis 29 (1), 138-144, 2023 | | 2023 |
Capturing Carbonation: Understanding Kinetic Complexities through a New Era of Electron Microscopy. J Deitz, T Dewers, J Heath, A Polonsky, D Perry Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2022 | | 2022 |
Focused Ion Beam Characterization of Low Melting Point Metals at Cryogenic Temperatures DL Perry, DP Cummings, JA Walraven, MB Jordan, JR Michael, JI Deitz Microscopy and Microanalysis 28 (S1), 78-79, 2022 | | 2022 |
Opportunities and Challenges of Ultra Short Pulsed Lasers with Dual Focused Ion Beams for Characterization of Full-Scale Electronic Devices JI Deitz, DL Perry, AT Polonsky, TJ Ruggles, KL Jungjohann, KL Harrison, ... Microscopy and Microanalysis 28 (S1), 884-886, 2022 | | 2022 |
Si quantum dots with focused ion beam implanted phosphorus donors. TM Lu, W Hardy, ES Bielejec, DL Perry, DR Ward, JR Wendt, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2018 | | 2018 |
Optimization of SiV Defect Yield in Diamond Substrates. ES Bielejec, JBS Abraham, DL Perry Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2016 | | 2016 |
Transport Measurements in Silicon Quantum Dots with Counted Phosphorus and Antimony Implants. M Singh, JL Pacheco, DL Perry, GA Ten Eyck, JR Wendt, D Luhman, ... Sandia National Lab.(SNL-NM), Albuquerque, NM (United States), 2016 | | 2016 |