| Comprehensive variability analysis in dual-port fefet for reliable multi-level-cell storage S Chatterjee, S Thomann, K Ni, YS Chauhan, H Amrouch IEEE Transactions on Electron Devices 69 (9), 5316-5323, 2022 | 25 | 2022 |
| Asymmetric double-gate ferroelectric FET to decouple the tradeoff between thickness scaling and memory window Z Jiang, Y Xiao, S Chatterjee, H Mulaosmanovic, S Duenkel, S Soss, ... 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2022 | 15 | 2022 |
| Ferroelectric fdsoi fet modeling for memory and logic applications S Chatterjee, S Kumar, A Gaidhane, CK Dabhi, YS Chauhan, H Amrouch Solid-State Electronics 200, 108554, 2023 | 14 | 2023 |
| Cross-layer fefet reliability modeling for robust hyperdimensional computing S Kumar, S Chatterjee, S Thomann, PR Genssler, YS Chauhan, ... 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration …, 2022 | 11 | 2022 |
| First demonstration of in-memory computing crossbar using multi-level Cell FeFET T Soliman, S Chatterjee, N Laleni, F Müller, T Kirchner, N Wehn, ... Nature Communications 14 (1), 6348, 2023 | 9 | 2023 |
| Cross-Layer Reliability Modeling of Dual-Port FeFET: Device-Algorithm Interaction S Kumar, S Chatterjee, S Thomann, YS Chauhan, H Amrouch IEEE Transactions on Circuits and Systems I: Regular Papers, 2023 | 9 | 2023 |
| Novel fdsoi-based dynamic xnor logic for ultra-dense highly-efficient computing S Kumar, S Chatterjee, CK Dabhi, H Amrouch, YS Chauhan 2022 IEEE International Symposium on Circuits and Systems (ISCAS), 3373-3377, 2022 | 9 | 2022 |
| FerroCoin: ferroelectric tunnel junction-based true random number generator S Chatterjee, N Rangarajan, S Patnaik, D Rajasekharan, O Sinanoglu, ... IEEE Transactions on Emerging Topics in Computing, 2022 | 5 | 2022 |
| Non-traditional design of dynamic logics using fdsoi for ultra-efficient computing S Kumar, S Chatterjee, CK Dabhi, YS Chauhan, H Amrouch IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2023 | 3 | 2023 |
| Powering disturb-free reconfigurable computing and tunable analog electronics with dual-port ferroelectric FET Z Zhao, S Deng, S Chatterjee, Z Jiang, MS Islam, Y Xiao, Y Xu, ... ACS Applied Materials & Interfaces 15 (47), 54602-54610, 2023 | 2 | 2023 |
| Programmable Delay Element using Dual-Port FeFET for Post-Silicon Clock Tuning S Chatterjee, YS Chauhan, H Amrouch IEEE Electron Device Letters, 2023 | 1 | 2023 |
| Modeling and Benchmarking 5nm Ferroelectric FinFET from Room Temperature down to Cryogenic Temperatures SS Parihar, S Chatterjee, G Pahwa, YS Chauhan, H Amrouch 2023 IEEE 23rd International Conference on Nanotechnology (NANO), 643-648, 2023 | 1 | 2023 |
| Leveraging ferroelectric stochasticity and in-memory computing for DNN IP obfuscation L Mankali, N Rangarajan, S Chatterjee, S Kumar, YS Chauhan, ... IEEE Journal on Exploratory Solid-State Computational Devices and Circuits 8 …, 2022 | 1 | 2022 |
| Temperature-and variability-aware compact modeling of ferroelectric FDSOI FET for memory and emerging applications S Chatterjee, S Kumar, A Gaidhane, CK Dabhi, YS Chauhan, H Amrouch Solid-State Electronics, 108954, 2024 | | 2024 |
| Unveiling the Hidden Impact of Self-Heating on Ferroelectric FinFET and FDSOI based In-Memory Computing S Chatterjee, N Baruah, S Deshwal, A Kar, O Prakash, SS Parihar, ... 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
| Benchmarking IWO-based Logic Circuits for Monolithic 3D Integration S Shahin, S Kumar, S Chatterjee, H Amrouch, YS Chauhan 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
| Monolithic 3D Integration using BEOL FeFET: Reliability, Thermal Effects, and DNN Accuracy S Kumar, YS Chauhan, H Amrouch 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024 | | 2024 |
| Cryogenic Brain-inspired Hyperdimensional In-Memory Computing using 5nm Ferroelectric FinFET SS Parihar, S Kumar, S Chatterjee, G Pahwa, YS Chauhan, H Amrouch | | 2024 |
| Defying Temperature: Reliable Compute-in-Memory in Monolithic 3D using BEOL Ferroelectric TFT S Chatterjee, S Kumar, A Sunil, S De, D Lehninger, M Jank, T Kämpfe, ... 2023 International Electron Devices Meeting (IEDM), 1-4, 2023 | | 2023 |
| A Novel Approach to Mitigate Power Side-Channel Attacks for Emerging Negative Capacitance Transistor Technology S Kumar, S Chatterjee, CK Dabhi, H Amrouch, YS Chauhan 2022 20th IEEE Interregional NEWCAS Conference (NEWCAS), 504-508, 2022 | | 2022 |
Yogesh S. ChauhanFellow IEEE, FNAE, Professor-IIT KanpurDirección de correo verificada de iitk.ac.in
