| Flexible setup for the measurement of CMOS time-dependent variability with array-based integrated circuits J Diaz-Fortuny, P Saraza-Canflanca, R Castro-Lopez, E Roca, ... IEEE Transactions on Instrumentation and Measurement 69 (3), 853-864, 2019 | 28 | 2019 |
| Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation P Saraza-Canflanca, H Carrasco-Lopez, A Santana-Andreo, P Brox, ... Microelectronics Reliability 118, 114049, 2021 | 19 | 2021 |
| Statistical characterization of time-dependent variability defects using the maximum current fluctuation P Saraza-Canflanca, J Martín-Martínez, R Castro-Lopez, E Roca, ... IEEE Transactions on Electron Devices 68 (8), 4039-4044, 2021 | 17 | 2021 |
| A detailed study of the gate/drain voltage dependence of RTN in bulk pMOS transistors P Saraza-Canflanca, J Martín-Martínez, R Castro-Lopez, E Roca, ... Microelectronic Engineering 215, 111004, 2019 | 16 | 2019 |
| A ring-oscillator-based degradation monitor concept with tamper detection capability J Diaz-Fortuny, P Saraza-Canflanca, E Bury, M Vandemaele, B Kaczer, ... 2022 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2022 | 13 | 2022 |
| A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ... Integration 72, 13-20, 2020 | 13 | 2020 |
| A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs A Santana-Andreo, P Saraza-Canflanca, H Carrasco-Lopez, P Brox, ... Integration 85, 1-9, 2022 | 11 | 2022 |
| A model parameter extraction methodology including time-dependent variability for circuit reliability simulation J Diaz-Fortuny, P Saraza-Canflanca, A Toro-Frías, R Castro-López, ... 2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018 | 11 | 2018 |
| New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ... 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 150-155, 2019 | 8 | 2019 |
| Design considerations of an SRAM array for the statistical validation of time-dependent variability models P Saraza-Canflanca, D Malagon, F Passos, A Toro, J Núñez, ... 2018 15th International Conference on Synthesis, Modeling, Analysis and …, 2018 | 8 | 2018 |
| Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging A Santana-Andreo, P Saraza-Canflanca, R Castro-Lopez, E Roca, ... AEU-International Journal of Electronics and Communications 176, 155147, 2024 | 7 | 2024 |
| Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions J Diaz-Fortuny, P Saraza-Canflanca, R Rodriguez, J Martin-Martinez, ... Solid-State Electronics 185, 108037, 2021 | 7 | 2021 |
| A new time efficient methodology for the massive characterization of RTN in CMOS devices G Pedreira, J Martín-Martínez, J Diaz-Fortuny, P Saraza-Canflanca, ... 2019 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2019 | 7 | 2019 |
| Simulating the impact of random telegraph noise on integrated circuits P Saraza-Canflanca, E Camacho-Ruiz, R Castro-Lopez, E Roca, ... SMACD/PRIME 2021; International Conference on SMACD and 16th Conference on …, 2021 | 6 | 2021 |
| TiDeVa: a toolbox for the automated and robust analysis of Time-Dependent Variability at transistor level P Saraza-Canflanca, J Diaz-Fortuny, R Castro-López, E Roca, ... 2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019 | 6 | 2019 |
| Improving the Tamper-Aware odometer concept by enhancing dynamic stress operation J Diaz-Fortuny, D Sangani, P Saraza-Canflanca, E Bury, R Degraeve, ... 2023 IEEE International Reliability Physics Symposium (IRPS), 1-9, 2023 | 5 | 2023 |
| Towards complete recovery of circuit degradation by annealing with on-chip heaters J Diaz-Fortuny, P Saraza-Canflanca, M Lofrano, E Bury, R Degraeve, ... IEEE Electron Device Letters 44 (2), 201-204, 2022 | 5 | 2022 |
| Determination of the time constant distribution of a defect-centric time-dependent variability model for sub-100-nm FETs P Saraza-Canflanca, R Castro-Lopez, E Roca, J Martín-Martínez, ... IEEE Transactions on Electron Devices 69 (10), 5424-5429, 2022 | 5 | 2022 |
| Exploiting bias temperature instability for reservoir computing in edge artificial intelligence applications Y Guo, R Degraeve, M Vandemaele, P Saraza-Canflanca, J Franco, ... 2024 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2024 | 3 | 2024 |
| Unveiling the Vulnerability of Oxide-Breakdown-Based PUF P Saraza-Canflanca, F Fodor, J Diaz-Fortuny, B Gierlichs, R Degraeve, ... IEEE Electron Device Letters, 2024 | 3 | 2024 |
R. Castro-LópezInstituto de Microelectrónica de Sevilla, IMSE-CNM (CSIC/Universidad de Sevilla)Verified email at imse-cnm.csic.es
