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Daihyun Lim
Daihyun Lim
Elenion Technologies
Verified email at elenion.com
Title
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Cited by
Year
Extracting secret keys from integrated circuits
D Lim, JW Lee, B Gassend, GE Suh, M Van Dijk, S Devadas
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (10 …, 2005
10922005
A technique to build a secret key in integrated circuits for identification and authentication applications
JW Lee, D Lim, B Gassend, GE Suh, M Van Dijk, S Devadas
2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No …, 2004
9342004
Identification and authentication of integrated circuits
B Gassend, D Lim, D Clarke, M Van Dijk, S Devadas
Concurrency and Computation: Practice and Experience 16 (11), 1077-1098, 2004
3372004
A 70GHz manufacturable complementary LC-VCO with 6.14 GHz tuning range in 65nm SOI CMOS
DD Kim, J Kim, JO Plouchart, C Cho, W Li, D Lim, R Trzcinski, M Kumar, ...
2007 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2007
822007
Variation
DS Boning, K Balakrishnan, H Cai, N Drego, A Farahanchi, KM Gettings, ...
IEEE Transactions on Semiconductor Manufacturing 21 (1), 63-71, 2008
522008
Performance variability of a 90GHz static CML frequency divider in 65nm SOI CMOS
D Lim, J Kim, JO Plouchart, C Cho, D Kim, R Trzcinski, D Boning
2007 IEEE International Solid-State Circuits Conference. Digest of Technical …, 2007
452007
Method for transmitting adaptive multi-channel packet in power line communication system
JT Kim, DH Lim
US Patent 6,809,632, 2004
412004
Random numbers from metastability and thermal noise
DC Ranasinghe, D Lim, S Devadas, D Abbott, PH Cole
Electronics Letters 41 (16), 891-893, 2005
322005
Decomposition and analysis of process variability using constrained principal component analysis
C Cho, DD Kim, J Kim, JO Plouchart, D Lim, S Cho, R Trzcinski
IEEE Transactions on Semiconductor Manufacturing 21 (1), 55-62, 2008
272008
Early prediction of product performance and yield via technology benchmark
C Cho, DD Kim, J Kim, D Lim, S Cho
2008 IEEE Custom Integrated Circuits Conference, 205-208, 2008
122008
A low cost solution to authentication in passive RFID systems
DC Ranasinghe, D Lim, PH Cole, S Devadas
Auto-ID Labs, 2006
112006
Physical unclonable functions and applications
S Devadas, D Clarke, B Gassend, D Lim, J Lee, M van Dijk
URl: http://people. csail. mit. edu/rudolph/Teaching/Lectures/Security …, 2007
92007
A Low-Power mmWave CML Prescaler in 65nm SOI CMOS Technology
DD Kim, C Cho, J Kim, JO Plouchart, D Lim
2008 IEEE Compound Semiconductor Integrated Circuits Symposium, 1-4, 2008
82008
Performance and yield optimization of mm-wave PLL front-end in 65nm SOI CMOS
D Lim, J Kim, JO Plouchart, D Kim, C Cho, DS Boning
2007 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 525-528, 2007
82007
A 75GHz PLL front-end integration in 65nm SOI CMOS technology
D Kim, J Kim, JO Plouchart, C Cho, D Lim, W Li, R Trzcinski
2007 IEEE Symposium on VLSI Circuits, 174-175, 2007
62007
Packet communication method of powerline communication system
JT Kim, DH Lim
US Patent 6,894,603, 2005
52005
An integrable low-cost hardware random number generator
DC Ranasinghe, D Lim, S Devadas, B Jamali, Z Zhu, PH Cole
Smart Structures, Devices, and Systems II 5649, 627-639, 2005
52005
A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology
C Cho, D Kim, J Kim, JO Plouchart, D Lim, S Cho, R Trzcinski
8th International Symposium on Quality Electronic Design (ISQED'07), 699-702, 2007
32007
Exploiting metastability and thermal noise to build a reconfigurable hardware random number generator
D Lim, DC Ranasinghe, S Devadas, B Jamali, D Abbott, PH Cole
Noise in Devices and Circuits III 5844, 294-309, 2005
32005
Characterization of process variability and robust optimization of analog circuits
D Lim
Massachusetts Institute of Technology, 2008
12008
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