Seguir
Anjan Chakravorty
Anjan Chakravorty
Associate Professor of Electrical Engineering, IIT Madras
Dirección de correo verificada de ee.iitm.ac.in
Título
Citado por
Citado por
Año
Compact hierarchical bipolar transistor modeling with HICUM
A Chakravorty
World Scientific, 2010
124*2010
Analytical model of subthreshold current and slope for asymmetric 4-T and 3-T double-gate MOSFETs
A Dey, A Chakravorty, N DasGupta, A DasGupta
IEEE transactions on electron devices 55 (12), 3442-3449, 2008
992008
Analytic estimation of thermal resistance in HBTs
A Chakravorty, R D’Esposito, S Balanethiram, S Frégonèse, T Zimmer
IEEE Transactions on Electron Devices 63 (8), 2994-2998, 2016
232016
Effects of BEOL on self-heating and thermal coupling in SiGe multi-finger HBTs under real operating condition
ADD Dwivedi, A Chakravorty, R D’esposito, AK Sahoo, S Fregonese, ...
Solid-State Electronics 115, 1-6, 2016
222016
Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit
T Jacquet, G Sasso, A Chakravorty, N Rinaldi, K Aufinger, T Zimmer, ...
Microelectronics Reliability 55 (9-10), 1433-1437, 2015
222015
Design of novel high-Q multipath parallel-stacked inductor
VNR Vanukuru, A Chakravorty
IEEE Transactions on Electron Devices 61 (11), 3905-3909, 2014
222014
Integrated layout optimized high-g inductors on high-resistivity SOI substrates for RF front-end modules
VNR Vanukuru, A Chakravorty
2014 International Conference on Signal Processing and Communications (SPCOM …, 2014
222014
Compact modeling of high frequency correlated noise in HBTs
P Sakalas, J Herricht, A Chakravorty, M Schroter
2006 Bipolar/BiCMOS Circuits and Technology Meeting, 1-4, 2006
222006
Accurate modeling of thermal resistance for on-wafer SiGe HBTs using average thermal conductivity
S Balanethiram, A Chakravorty, R D’Esposito, S Fregonese, D Céli, ...
IEEE Transactions on Electron Devices 64 (9), 3955-3960, 2017
202017
Modeling of SOI-LDMOS transistor including impact ionization, snapback, and self-heating
U Radhakrishna, A DasGupta, N DasGupta, A Chakravorty
IEEE transactions on electron devices 58 (11), 4035-4041, 2011
202011
Compact Modeling of Proximity Effect in High- Tapered Spiral Inductors
J Sathyasree, V Vanukuru, D Nair, A Chakravorty
IEEE Electron Device Letters 39 (4), 588-590, 2018
192018
High-Q Characteristics of Variable Width Inductors With Reverse Excitation
VNR Vanukuru, A Chakravorty
IEEE Transactions on Electron Devices 61 (9), 3350-3354, 2014
192014
A scalable, broadband, and physics-based model for on-chip rectangular spiral inductors
SS Jayaraman, V Vanukuru, D Nair, A Chakravorty
IEEE Transactions on Magnetics 55 (9), 1-6, 2019
182019
Low-frequency noise in advanced SiGe: C HBTs—Part I: Analysis
C Mukherjee, T Jacquet, A Chakravorty, T Zimmer, J Böck, K Aufinger, ...
IEEE Transactions on Electron Devices 63 (9), 3649-3656, 2016
182016
SOI-LDMOS Transistors With Optimized Partial n+ Buried Layer for Improved Performance in Power Amplifier Applications
KNS Nikhil, N DasGupta, A DasGupta, A Chakravorty
IEEE Transactions on Electron Devices 65 (11), 4931-4937, 2018
162018
Analysis of high-frequency measurement of transistors along with electromagnetic and SPICE cosimulation
S Fregonese, M Cabbia, C Yadav, M Deng, SR Panda, M De Matos, ...
IEEE Transactions on Electron Devices 67 (11), 4770-4776, 2020
152020
Miniaturized millimeter-wave narrow bandpass filter in 0.18 μm CMOS technology using spiral inductors and inter digital capacitors
VNR Vanukuru, N Godavarthi, A Chakravorty
2014 International Conference on Signal Processing and Communications (SPCOM …, 2014
152014
High density solenoidal series pair symmetric inductors and transformers
VNR Vanukuru, A Chakravorty
IEEE Transactions on Electron Devices 61 (7), 2503-2508, 2014
152014
Extraction of BEOL contributions for thermal resistance in SiGe HBTs
S Balanethiram, R D’Esposito, A Chakravorty, S Fregonese, T Zimmer
IEEE Transactions on Electron Devices 64 (3), 1380-1384, 2017
142017
Series stacked multipath inductor with high self resonant frequency
VNR Vanukuru, A Chakravorty
IEEE Transactions on Electron Devices 62 (3), 1058-1062, 2015
142015
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20