Enrico Brinciotti
Enrico Brinciotti
Anritsu Corporation
Dirección de correo verificada de anritsu.com
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Quantitative sub-surface and non-contact imaging using scanning microwave microscopy
G Gramse, E Brinciotti, A Lucibello, SB Patil, M Kasper, C Rankl, ...
Nanotechnology 26 (13), 135701, 2015
432015
Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy
E Brinciotti, G Gramse, S Hommel, T Schweinboeck, A Altes, MA Fenner, ...
Nanoscale 7 (35), 14715-14722, 2015
392015
Nondestructive imaging of atomically thin nanostructures buried in silicon
G Gramse, A Kölker, T Lim, TJZ Stock, H Solanki, SR Schofield, ...
Science advances 3 (6), e1602586, 2017
362017
Calibrated complex impedance of CHO cells and E. coli bacteria at GHz frequencies using scanning microwave microscopy
SS Tuca, G Badino, G Gramse, E Brinciotti, M Kasper, YJ Oh, R Zhu, ...
Nanotechnology 27 (13), 135702, 2016
312016
Scanning microwave microscopy applied to semiconducting GaAs structures
A Buchter, J Hoffmann, A Delvallée, E Brinciotti, D Hapiuk, C Licitra, ...
Review of Scientific Instruments 89 (2), 023704, 2018
92018
Frequency analysis of dopant profiling and capacitance spectroscopy using Scanning Microwave Microscopy
E Brinciotti, G Campagnaro, G Badino, M Kasper, G Gramse, SS Tuca, ...
IEEE Transactions on Nanotechnology 16 (1), 75-82, 2016
82016
De-embedding techniques for nanoscale characterization of semiconductors by scanning microwave microscopy
L Michalas, E Brinciotti, A Lucibello, G Gramse, CH Joseph, F Kienberger, ...
Microelectronic Engineering 159, 64-69, 2016
52016
Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements
L Michalas, A Lucibello, G Badino, CH Joseph, E Brinciotti, F Kienberger, ...
2015 European Microwave Conference (EuMC), 159-162, 2015
52015
Scanning microwave microscopy for non-destructive characterization of SOI wafers
L Michalas, I Ionica, E Brinciotti, L Pirro, F Kienberger, S Cristoloveanu, ...
2016 Joint International EUROSOI Workshop and International Conference on …, 2016
42016
Calibrated nanoscale dopant profiling and capacitance of a high-voltage lateral MOS transistor at 20 GHz using Scanning Microwave Microscopy
E Brinciotti, G Badino, M Knaipp, G Gramse, J Smoliner, F Kienberger
IEEE Transactions on Nanotechnology 16 (2), 245-252, 2017
22017
Transmission and reflection mode scanning microwave microscopy (SMM): Experiments, calibration, and simulations
PF Medina, A Lucibello, G Gramse, E Brinciotti, M Kasper, AO Oladipo, ...
2015 European Microwave Conference (EuMC), 654-657, 2015
22015
Nanoscale characterization of MOS systems by microwaves: Dopant profiling calibration
L Michalas, A Lucibello, CH Joseph, E Brinciotti, F Kienberger, E Proietti, ...
EUROSOI-ULIS 2015: 2015 Joint International EUROSOI Workshop and …, 2015
22015
2017 Index IEEE Transactions on Nanotechnology Vol. 16
A Abusleme, D Acharyya, S Acharyya, F Adamu-Lema, KN Afanasev, ...
IEEE Transactions on Nanotechnology 16 (6), 1, 2017
2017
Characterization of transversal electrophoresis based microflow devices for water purification
E Brinciotti
Sapienza" University of Rome, 2012
2012
New nanoscale tools for measuring doping concentration and photo-conductivity for photovoltaic applications & photovoltaic simulation
G Kada, D Glasse, E Brinciotti, G Gramse, SS Tuca, P Hinterdorfer, ...
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Artículos 1–15