Simplified mathematical model for calculating the oxygen excess ratio of a PEM fuel cell system in real-time applications C Restrepo, T Konjedic, C Guarnizo, O Aviñó-Salvadó, J Calvente, ... IEEE Transactions on Industrial Electronics 61 (6), 2816-2825, 2013 | 32 | 2013 |
Humidity sensitivity of large area silicon sensors: Study and implications J Fernández-Tejero, PP Allport, O Aviñó, K Dette, V Fadeyev, C Fleta, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2020 | 21 | 2020 |
Power losses and current distribution studies by infrared thermal imaging in soft-and hard-switched IGBTs under resonant load M Fernández, X Perpiñà, M Vellvehi, O Aviñó-Salvadó, S Llorente, ... IEEE Transactions on Power Electronics 35 (5), 5221-5237, 2019 | 18 | 2019 |
Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling W Sabbah, F Arabi, O Avino-Salvado, C Buttay, L Théolier, H Morel Microelectronics Reliability 76, 444-449, 2017 | 18 | 2017 |
SiC MOSFETs robustness for diode-less applications O Avino-Salvado, C Cheng, C Buttay, H Morel, D Labrousse, S Lefebvre, ... EPE Journal 28 (3), 128-135, 2018 | 17 | 2018 |
VTH-Hysteresis and Interface States Characterisation in SiC Power MOSFETs with Planar and Trench Gate B Asllani, A Castellazzi, OA Salvado, A Fayyaz, H Morel, D Planson 2019 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2019 | 16 | 2019 |
Statistical study of nanocrystalline alloy cut cores from two different manufacturers F Sixdenier, J Morand, OA Salvado, D Bergogne IEEE transactions on magnetics 50 (4), 1-4, 2014 | 16 | 2014 |
Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode OA Salvado, H Morel, C Buttay, D Labrousse, S Lefebvre Microelectronics Reliability 88, 636-640, 2018 | 14 | 2018 |
High temperature ageing of microelectronics assemblies with SAC solder joints W Sabbah, P Bondue, O Avino-Salvado, C Buttay, H Frémont, ... Microelectronics Reliability 76, 362-367, 2017 | 14 | 2017 |
Extraction of the 4H-SiC/SiO2 Barrier Height Over Temperature O Aviñó-Salvadó, B Asllani, C Buttay, C Raynaud, H Morel IEEE Transactions on Electron Devices 67 (1), 63-68, 2019 | 11 | 2019 |
Evaluation of Printed-Circuit Board Materials for High-Temperature Operation O Aviño-Salvado, W Sabbah, C Buttay, H Morel, P Bevilacqua Journal of Microelectronics and Electronic Packaging 14 (4), 166-171, 2017 | 10 | 2017 |
Design of a low-capacitance planar transformer for a 4 kW/500 kHz DAB converter P Demumieux, O Avino-Salvado, C Buttay, C Martin, F Sixdenier, ... 2019 IEEE Applied Power Electronics Conference and Exposition (APEC), 2659-2666, 2019 | 9 | 2019 |
Local thermal resistance extraction in monolithic microwave integrated circuits M Vellvehi, X Perpiñà, J León, O Aviñó-Salvadó, C Ferrer, X Jordà IEEE Transactions on Industrial Electronics 68 (12), 12840-12849, 2020 | 8 | 2020 |
Contribution to the study of the SiC MOSFETs gate oxide O Aviñó Salvadó INSA de Lyon, UdL, 2018 | 6* | 2018 |
Simulation-based analysis of thermo-mechanical constraints in packages for diamond power devices N Fusté, O Avino, M Vellvehi, X Perpiñà, P Godignon, R Seddon, I Obieta, ... 2020 21st International Conference on Thermal, Mechanical and Multi-Physics …, 2020 | 5 | 2020 |
Carrier concentration analysis in 1.2 kV SiC Schottky diodes under current crowding F Bonet, O Aviñó-Salvadó, M Vellvehi, X Jorda, P Godignon, X Perpiñà IEEE Electron Device Letters 43 (6), 938-941, 2022 | 4 | 2022 |
Electrical Behaviour of Ag Sintered Die-attach Layer after Thermal Cycling in High Temperature Power Electronics Applications LA Navarro, X Perpiñà, M Vellvehi, O Aviño, X Jordà surfaces 13, 15, 2019 | 4 | 2019 |
Determination of Anand viscoplastic constitutive parameters for the AuGe solder alloy from experimental stress-strain curves for power systems integration FEA simulations N Fusté, O Aviñó, X Perpiñà, D Sanchez, M Vellvehi, X Jordà 2021 Smart Systems Integration (SSI), 1-5, 2021 | 3 | 2021 |
Realització d’una Càrrega Activa Programable Sense Pèrdues per a una Plataforma de Generació Distribuïda O Aviñó Proyecto Final de Carrera, 2012 | 3 | 2012 |
Physics-based strategies for fast TDDB testing and lifetime estimation in SiC power MOSFETs O Aviñó-Salvadó, C Buttay, F Bonet, C Raynaud, P Bevilacqua, J Rebollo, ... IEEE Transactions on Industrial Electronics, 2023 | 2 | 2023 |