Analysis of modern optical inspection systems for parts manufactured by selective laser melting S Giganto, S Martínez-Pellitero, E Cuesta, VM Meana, J Barreiro Sensors 20 (11), 3202, 2020 | 15 | 2020 |
Análisis de la implantación de la metodología BIM en los grados de ingeniería industrial en España bajo la perspectiva de las competencias. V Meana, A Bello, R García Revista ingeniería de construcción 34 (2), 169-180, 2019 | 14 | 2019 |
Laser line scanner aptitude for the measurement of Selective Laser Melting parts E Cuesta, S Giganto, BJ Álvarez, J Barreiro, S Martínez-Pellitero, ... Optics and Lasers in Engineering 138, 106406, 2021 | 13 | 2021 |
Analysis of the implementation of the BIM methodology in the spanish industrial engineering degrees under the competential perspective V Meana, A Bello, R García Revista Ingeniería de Construcción RIC 34 (2), 169-180, 2019 | 8 | 2019 |
Comparison of Chemical and Mechanical Surface Treatments on Metallic Precision Spheres for Using as Optical Reference Artifacts V Meana, E Cuesta, BJ Álvarez, S Giganto, S Martínez-Pellitero Materials 15 (11), 3741, 2022 | 4 | 2022 |
A Procedure to Integrate a CIS Sensor in an Additive Manufacturing Machine for In-Situ Digitizing of Deposited Material Layers F Peña, JC Rico, G Valiño, P Zapico, VM Meana IEEE/ASME Transactions on Mechatronics 27 (5), 2690-2698, 2021 | 4 | 2021 |
Testing the Sandblasting Process in the Manufacturing of Reference Spheres for Non-Contact Metrology Applications V Meana, E Cuesta, BJ Álvarez Materials 14 (18), 5187, 2021 | 4 | 2021 |
Virtual-point-based geometric error compensation model for additive manufacturing machines P Zapico, F Peña, G Valiño, JC Rico, V Meana, S Mateos Rapid Prototyping Journal 29 (4), 837-849, 2023 | 3 | 2023 |
Integrating BIM in Industrial Engineering programs. A new strategy model V Meana, R García, A Bello, I León, S Giganto IOP Conference Series: Materials Science and Engineering 1193 (1), 012133, 2021 | 3 | 2021 |
Metrology Benchmarking of 3D Scanning Sensors Using a Ceramic GD&T-Based Artefact E Cuesta, V Meana, BJ Álvarez, S Giganto, S Martínez-Pellitero Sensors 22 (22), 8596, 2022 | 2 | 2022 |
On-machine non-contact roughness verification system based on Conoscopic holography P Zapico, G Valino, JC Rico, VM Meana, P Fernandez Precision Engineering 73, 115-127, 2022 | 2 | 2022 |
Contact Image Sensor integration in Fused Filament Fabrication machines for layer inspection F Peña, JC Rico, G Valiño, P Fernández, V Meana, P Zapico IOP Conference Series: Materials Science and Engineering 1193 (1), 012091, 2021 | 1 | 2021 |
Feasibility analysis of using machinable glass ceramics to manufacture non-contact measurement approach metrological artefacts P Zapico, BJ Álvarez, V Meana, A Telenti, E Cuesta IOP Conference Series: Materials Science and Engineering 1193 (1), 012063, 2021 | 1 | 2021 |
Flipped Classroom and gamification in Automated Manufacturing lab classes V Meana, JC Rico, G Valiño, F Peña IOP Conference Series: Materials Science and Engineering 1193 (1), 012134, 2021 | 1 | 2021 |
Characterisation of the Performance of a Structured Light Digitising Sensor by Using Different Materials and Surface Finishes P Zapico García, E Cuesta, V Meana, G Suárez, S Mateos, ... Key Engineering Materials 961, 151-159, 2023 | | 2023 |
Optical Characterization of Materials for Precision Reference Spheres for Use with Structured Light Sensors P Zapico, V Meana, E Cuesta, S Mateos Materials 16 (15), 5443, 2023 | | 2023 |
Optical Characterization of Materials for Precision Reference Spheres for Use with Structured Light Sensors. Materials 2023, 16, 5443 P Zapico, V Meana, E Cuesta, S Mateos | | 2023 |
Validation of the sandblasting process in the manufacturing of precision spheres for non-contact metrology E Cuesta, V Meana, P Pastur, BJ Álvarez, P Zapico IOP Conference Series: Materials Science and Engineering 1193 (1), 012058, 2021 | | 2021 |
MESIC 9. Book of abstracts JC Rico Fernández, E Cuesta González, G Valiño Riestra, ... Universidad de Oviedo, 2021 | | 2021 |
Laser Triangulation Sensors Performance in Scanning Different Materials and Finishes V Meana, P Zapico, E Cuesta, S Giganto, S Martinez-Pellitero Sensors 2024 24 (8), 2410, 0 | | |