| Improving thermal stability of hard coating films via a concept of multicomponent alloying H Lind, R Forsén, B Alling, N Ghafoor, F Tasnadi, MP Johansson, ... Applied Physics Letters 99 (9), 2011 | 128 | 2011 |
| Layer formation by resputtering in Ti–Si–C hard coatings during large scale cathodic arc deposition AO Eriksson, JQ Zhu, N Ghafoor, MP Johansson, J Sjölen, J Jensen, ... Surface and Coatings Technology 205 (15), 3923-3930, 2011 | 94 | 2011 |
| Cluster formation at the Si/liquid interface in Sr and Na modified Al–Si alloys J Barrirero, J Li, M Engstler, N Ghafoor, P Schumacher, M Odén, ... Scripta Materialia 117, 16-19, 2016 | 85 | 2016 |
| Comparison of segregations formed in unmodified and Sr-modified Al–Si alloys studied by atom probe tomography and transmission electron microscopy J Barrirero, M Engstler, N Ghafoor, N de Jonge, M Odén, F Mücklich Journal of alloys and compounds 611, 410-421, 2014 | 77 | 2014 |
| Effects of Ti alloying of AlCrN coatings on thermal stability and oxidation resistance R Forsén, MP Johansson, M Odén, N Ghafoor Thin Solid Films 534, 394-402, 2013 | 77 | 2013 |
| Tuning hardness and fracture resistance of ZrN/Zr0. 63Al0. 37N nanoscale multilayers by stress-induced transformation toughening K Yalamanchili, IC Schramm, E Jiménez-Piqué, L Rogström, F Mücklich, ... Acta materialia 89, 22-31, 2015 | 75 | 2015 |
| Decomposition and phase transformation in TiCrAlN thin coatings R Forsén, M Johansson, M Odén, N Ghafoor Journal of Vacuum Science & Technology A 30 (6), 2012 | 62 | 2012 |
| Interface engineering of short-period Ni/V multilayer X-ray mirrors F Eriksson, N Ghafoor, F Schäfers, EM Gullikson, J Birch Thin Solid Films 500 (1-2), 84-95, 2006 | 56 | 2006 |
| Growth and thermal stability of TiN/ZrAlN: Effect of internal interfaces K Yalamanchili, F Wang, H Aboulfadl, J Barrirero, L Rogström, ... Acta Materialia 121, 396-406, 2016 | 46 | 2016 |
| Nanolabyrinthine ZrAlN thin films by self-organization of interwoven single-crystal cubic and hexagonal phases N Ghafoor, LJS Johnson, DO Klenov, J Demeulemeester, P Desjardins, ... APL Materials 1 (2), 2013 | 45 | 2013 |
| Structure, deformation and fracture of arc evaporated Zr–Si–N hard films K Yalamanchili, R Forsén, E Jiménez-Piqué, MPJ Jöesaar, JJ Roa, ... Surface and Coatings Technology 258, 1100-1107, 2014 | 43 | 2014 |
| Influence of chemical composition and deposition conditions on microstructure evolution during annealing of arc evaporated ZrAlN thin films L Rogström, MP Johansson, N Ghafoor, L Hultman, M Odén Journal of Vacuum Science & Technology A 30 (3), 2012 | 42 | 2012 |
| Exploring the high entropy alloy concept in (AlTiVNbCr) N K Yalamanchili, F Wang, IC Schramm, JM Andersson, MPJ Jöesaar, ... Thin Solid Films 636, 346-352, 2017 | 40 | 2017 |
| Microstructure and materials properties of understoichiometric TiBx thin films grown by HiPIMS J Thörnberg, J Palisaitis, N Hellgren, FF Klimashin, N Ghafoor, I Zhirkov, ... Surface and Coatings Technology 404, 126537, 2020 | 39 | 2020 |
| Self-organized anisotropic (Zr1− xSix) Ny nanocomposites grown by reactive sputter deposition N Ghafoor, I Petrov, DO Klenov, B Freitag, J Jensen, JE Greene, ... Acta Materialia 82, 179-189, 2015 | 37 | 2015 |
| Adhesive-deformation relationships and mechanical properties of nc-AlCrN/a-SiNx hard coatings deposited at different bias voltages M Haršáni, N Ghafoor, K Calamba, P Zacková, M Sahul, T Vopát, ... Thin Solid Films 650, 11-19, 2018 | 34 | 2018 |
| Incorporation of nitrogen in Cr∕ Sc multilayers giving improved soft x-ray reflectivity N Ghafoor, F Eriksson, E Gullikson, L Hultman, J Birch Applied Physics Letters 92 (9), 2008 | 34 | 2008 |
| Eutectic modification by ternary compound cluster formation in Al-Si alloys J Barrirero, C Pauly, M Engstler, J Ghanbaja, N Ghafoor, J Li, ... Scientific reports 9 (1), 5506, 2019 | 33 | 2019 |
| Single crystal CrN/ScN superlattice soft X-ray mirrors: Epitaxial growth, structure, and properties J Birch, T Joelsson, F Eriksson, N Ghafoor, L Hultman Thin Solid Films 514 (1-2), 10-19, 2006 | 32 | 2006 |
| Atomic scale interface engineering by modulated ion-assisted deposition applied to soft x-ray multilayer optics F Eriksson, N Ghafoor, F Schäfers, EM Gullikson, S Aouadi, S Rohde, ... Applied Optics 47 (23), 4196-4204, 2008 | 30 | 2008 |
Lars Hultman, Professor, PhDLinköping University, Department of Physics, IFMVerified email at ifm.liu.se
