Portal Jean-Michel
Portal Jean-Michel
Full Professor Aix-Marseille Université - IM2NP
Dirección de correo verificada de univ-amu.fr
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Testing the interconnect of RAM-based FPGAs
M Renovell, JM Portal, J Figueras, Y Zorian
IEEE Design & Test of Computers 15 (1), 45-50, 1998
1981998
Eeprom memory: threshold voltage built in self diagnosis
JM Portal, H Aziza
International Test Conference, 2003. Proceedings. ITC 2003., 23-23, 2003
1012003
EEPROM diagnosis based on threshold voltage embedded measurement
JM Portal, H Aziza, D Née
Journal of Electronic Testing 21 (1), 33-42, 2005
872005
Robust compact model for bipolar oxide-based resistive switching memories
M Bocquet, D Deleruyelle, H Aziza, C Muller, JM Portal, T Cabout, ...
IEEE transactions on electron devices 61 (3), 674-681, 2014
862014
Synchronous non-volatile logic gate design based on resistive switching memories
W Zhao, M Moreau, E Deng, Y Zhang, JM Portal, JO Klein, M Bocquet, ...
IEEE Transactions on Circuits and Systems I: Regular Papers 61 (2), 443-454, 2013
802013
Definition of an Innovative Filling Structure for Digital Blocks: the DFM Filler Cell
L Remy, P Coll, F Picot, P Mico, JM Portal
2009 16th IEEE International Conference on Electronics, Circuits and Systems …, 2009
782009
Self-consistent physical modeling of set/reset operations in unipolar resistive-switching memories
M Bocquet, D Deleruyelle, C Muller, JM Portal
Applied Physics Letters 98 (26), 263507, 2011
652011
IS-FPGA: a new symmetric FPGA architecture with implicit scan
M Renovell, P Faure, JM Portal, J Figueras, Y Zorian
Proceedings International Test Conference 2001 (Cat. No. 01CH37260), 924-931, 2001
592001
SRAM-based FPGA's: testing the LUT/RAM modules
M Renovell, JM Portal, J Figueras, Y Zorian
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998
581998
RAM-based FPGAs: A test approach for the configurable logic
M Renovell, JM Portal, J Figueras, Y Zorian
Proceedings Design, Automation and Test in Europe, 82-88, 1998
461998
Test pattern and test configuration generation methodology for the logic of RAM-based FPGA
M Renovell, JM Portal, J Figueras, Y Zorian
Proceedings Sixth Asian Test Symposium (ATS'97), 254-259, 1997
411997
Minimizing the number of test configurations for different FPGA families
M Renovell, JM Portal, J Figuras, Y Zorian
Proceedings Eighth Asian Test Symposium (ATS'99), 363-368, 1999
401999
RRAM-based FPGA for" Normally off, Instantly on" Applications
O Turkyilmaz, S Onkaraiah, M Reyboz, F Clermidy, C Anghel, JM Portal, ...
Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale …, 2012
392012
Bipolar ReRAM based non-volatile flip-flops for low-power architectures
S Onkaraiah, M Reyboz, F Clermidy, JM Portal, M Bocquet, C Muller, ...
10th IEEE International NEWCAS Conference, 417-420, 2012
392012
SRAM-based FPGAs: Testing the embedded RAM modules
M Renovell, JM Portal, J Figueras, Y Zorian
Journal of Electronic Testing 14 (1-2), 159-167, 1999
361999
SRAM-based FPGAs: Testing the embedded RAM modules
M Renovell, JM Portal, J Figueras, Y Zorian
Journal of Electronic Testing 14 (1-2), 159-167, 1999
361999
Simulation of single and multi-node collection: Impact on SEU occurrence in nanometric SRAM cells
G Toure, G Hubert, K Castellani-Coulie, S Duzellier, JM Portal
IEEE Transactions on Nuclear Science 58 (3), 862-869, 2011
352011
Investigation of the potentialities of Vertical Resistive RAM (VRRAM) for neuromorphic applications
G Piccolboni, G Molas, JM Portal, R Coquand, M Bocquet, D Garbin, ...
2015 IEEE International Electron Devices Meeting (IEDM), 17.2. 1-17.2. 4, 2015
312015
Compact modeling solutions for oxide-based resistive switching memories (OxRAM)
M Bocquet, H Aziza, W Zhao, Y Zhang, S Onkaraiah, C Muller, M Reyboz, ...
Journal of Low Power Electronics and Applications 4 (1), 1-14, 2014
272014
An overview of non-volatile flip-flops based on emerging memory technologies
JM Portal, M Bocquet, M Moreau, H Aziza, D Deleruyelle, Y Zhang, ...
J. Electron. Sci. Technol 12 (2), 173-181, 2014
252014
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20