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Reginald C. Farrow
Reginald C. Farrow
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Superconductivity near 30 K without copper: the Ba0.6K0.4BiO3 perovskite
RJ Cava, B Batlogg, JJ Krajewski, R Farrow, LW Rupp Jr, AE White, ...
nature 332 (6167), 814-816, 1988
15421988
Structure and physical properties of single crystals of the 84-K superconductor
SA Sunshine, T Siegrist, LF Schneemeyer, DW Murphy, RJ Cava, ...
Physical Review B 38 (1), 893, 1988
8321988
Superconductivity Near 70K in a New Family of Layered Copper Oxides
RJ Cava, B Batlogg, JJ Krajewski, LW Rupp, LF Schneemeyer, T Siegrist, ...
Nature 336, 211-214, 1988
6271988
Studies of oxygen-deficient Ba2YCu3O7− δ and superconductivity Bi (Pb) SrCaCuO
RJ Cava, B Batlogg, SA Sunshine, T Siegrist, RM Fleming, K Rabe, ...
Physica C: Superconductivity 153, 560-565, 1988
2741988
I nsitu epitaxial growth of Y1Ba2Cu3O7−x films by molecular beam epitaxy with an activated oxygen source
J Kwo, M Hong, DJ Trevor, RM Fleming, AE White, RC Farrow, AR Kortan, ...
Applied physics letters 53 (26), 2683-2685, 1988
2041988
Crystal structure of solid hydrogen chloride and deuterium chloride
E Sandor, RFC Farrow
Nature 213 (5072), 171-172, 1967
1721967
Projection Electron-Beam Lithography: A New Approach
SD Berger, JM Gibson, RM Camarda, RC Farrow, HA Huggins, JA Liddle, ...
Journal Vacuum Science & Technology B 10, 2996, 1991
1461991
The subpicosecond Kerr effect in CS2
BI Greene, RC Farrow
Chemical Physics Letters 98 (3), 273-276, 1983
1211983
Subpicosecond time resolved multiphoton ionization: Excited state dynamics of cis‐stilbene under collision free conditions
BI Greene, RC Farrow
The Journal of Chemical Physics 78 (6), 3336-3338, 1983
1161983
Direct measurement of a subpicosecond birefringent response in CS2
BI Greene, RC Farrow
The Journal of Chemical Physics 77 (9), 4779-4780, 1982
831982
Crystal structure of cubic deuterium chloride
E Sandor, RFC Farrow
Nature 215 (5107), 1265-1266, 1967
721967
Microscopic dynamics in simple liquids by subpicosecond birefringences
BI Greene, PA Fleury, HL Carter Jr, RC Farrow
Physical Review A 29 (1), 271, 1984
701984
Alignment mark fabrication process to limit accumulation of errors in level to level overlay
RC Farrow, IC Kizilyalli
US Patent 6,440,816, 2002
542002
LWR Jr., AE White, K. Short, WF Peck, and T. Kometani
RJ Cava, B Batlogg, JJ Krajewski, R Farrow
Nature (London) 332, 814, 1988
521988
Structure and stability of metastable α‐Sn
MT Asom, AR Kortan, LC Kimerling, RC Farrow
Applied physics letters 55 (14), 1439-1441, 1989
511989
Laser‐assisted metalorganic molecular beam epitaxy of GaAs
VM Donnelly, CW Tu, JC Beggy, VR McCrary, MG Lamont, TD Harris, ...
Applied physics letters 52 (13), 1065-1067, 1988
511988
Correlation of structural quality with superconducting behavior in epitaxial thin films of Ba2YCu3O7−δ on LaAlO3(100)
MP Siegal, JM Phillips, AF Hebard, RB Dover, RC Farrow, TH Tiefel, ...
Journal of applied physics 70 (9), 4982-4988, 1991
421991
Particle–particle interaction effects in image projection lithography systems
SD Berger, DJ Eaglesham, RC Farrow, RR Freeman, JS Kraus, JA Liddle
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1993
381993
The Scalpel Lithography System
JA Liddle, SD Berger, C Biddick, MI Blakey, SW Bowler, K Brady, ...
Japan Journal of Applied Physics 34 (12B), 6663, 1995
36*1995
Method of forming nanotube vertical field effect transistor
RC Farrow, A Goyal
US Patent 7,736,979, 2010
352010
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