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Garima Gill
Garima Gill
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Robust compact model of high-voltage MOSFET’s drift region
G Pahwa, A Sharma, R Goel, G Gill, H Agarwal, YS Chauhan, C Hu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2022
122022
Compact modeling of impact ionization in high-voltage devices
G Gill, A Singhal, G Pahwa, C Hu, H Agarwal
IEEE Transactions on Electron Devices, 2023
52023
Comprehensive high-voltage parameter extraction strategy for BSIM-BULK HV model
G Gill, Y Machhiwar, G Pahwa, C Hu, H Agarwal
IEEE Transactions on Electron Devices, 2023
12023
An Improved Robust Infinitely Differentiable Drift Resistance Model for BSIM High Voltage Compact Model
A Singhal, G Gill, G Pahwa, C Hu, H Agarwal
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023
12023
Demonstration of On-Chip Test Decompression for EDT using Binary Encoded Neural Autoencoders
P Daniel, S Singh, G Gill, A Gangwar, B Ganesh, K Chakrabarti
2019 IEEE International Test Conference India (ITC India), 1-7, 2019
12019
Compact Modeling of LDMOS Transistors Over a Wide Temperature Range Including Cryogenics
Y Machhiwar, G Gill, KN Kaushal, NR Mohapatra, H Agarwal
IEEE Transactions on Electron Devices, 2023
2023
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