Jae Yeon Baek
Title
Cited by
Cited by
Year
High-performance Si microwire photovoltaics
MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ...
Energy & Environmental Science 4 (3), 866-871, 2011
2232011
Effects of dispersion conditions of single-walled carbon nanotubes on the electrical characteristics of thin film network transistors
SN Barman, MC LeMieux, J Baek, R Rivera, Z Bao
ACS applied materials & interfaces 2 (9), 2672-2678, 2010
382010
Energy Environ. Sci. 4, 866 (2011)
MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ...
11
Optimization of blended virtual and actual metrology schemes
JYC Baek, CJ Spanos
Metrology, Inspection, and Process Control for Microlithography XXVI 8324 …, 2012
102012
Optimal training and efficient model selection for parameterized large margin learning
Y Zhou, JY Baek, D Li, CJ Spanos
Pacific-Asia Conference on Knowledge Discovery and Data Mining, 52-64, 2016
52016
Energy Environ
MD Kelzenberg, DB Turner-Evans, MC Putnam, SW Boettcher, RM Briggs, ...
Sci 4, 866-871, 2011
52011
Real-time inspection system utilizing scatterometry pupil data
JY Baek, P Leray, AL Charley, CJ Spanos
Journal of Micro/Nanolithography, MEMS, and MOEMS 13 (4), 041403, 2014
42014
Predicting congressional votes based on campaign finance data
S Smith, JY Baek, Z Kang, D Song, L El Ghaoui, M Frank
2012 11th International Conference on Machine Learning and Applications 1 …, 2012
32012
Enhancing metrology by combining spatial variability and global inference
CJ Spanos, JY Baek
Metrology, Inspection, and Process Control for Microlithography XXVII 8681 …, 2013
22013
Pattern Analysis of Movement Behavior of Medaka (Oryzias latipes): A Decision Tree Approach
S Lee, J Kim, JY Baek, MW Han, S Kim, TS Chon
International Conference on Computer Analysis of Images and Patterns, 546-553, 2005
22005
Performance Evaluation of Blended Metrology Schemes Incorporating Virtual Metrology
JY Baek, CJ Spanos
IEEE transactions on semiconductor manufacturing 26 (4), 506-515, 2013
12013
Movement Analysis of Medaka (Oryzias Latipes) for an Insecticide Using Decision Tree
S Lee, J Kim, JY Baek, MW Han, CW Ji, TS Chon
International Conference on Discovery Science, 150-162, 2005
12005
Pattern Classification and Recognition of Movement Behavior of Medaka (Oryzias Latipes) Using Decision Tree
S Lee, J Kim, JY Baek, MW Han, TS Chon
International Conference on Fuzzy Systems and Knowledge Discovery, 186-195, 2005
12005
Finding the optimal guidance for enhancing anchored instruction
S McKenney, TC Reeves, S McKenney, TC Reeves, SF Akkerman, ...
Conducting Educational Design Research 81 (2), 1-3, 2019
2019
Modeling and Selection for Real-time Wafer-to-Wafer Fault Detection Applications
JY Baek
UC Berkeley, 2015
2015
2013 Index IEEE Transactions on Semiconductor Manufacturing Vol. 26
JY Baek, K Bandy, G Bano, H Bartolf, L Benfu, JP Bickford, J Blue, ...
IEEE Transactions on Semiconductor Manufacturing 26 (4), 629, 2013
2013
Effect of Periodic Virtual Metrology Recalibration on Blended Metrology Schemes
JYC Baek
2012
The system can't perform the operation now. Try again later.
Articles 1–17