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Celia Lopez-Ongil
Celia Lopez-Ongil
Dirección de correo verificada de ing.uc3m.es
Título
Citado por
Citado por
Año
Soft errors in modern electronic systems
M Nicolaidis
Springer Science & Business Media, 2010
3792010
Autonomous fault emulation: A new FPGA-based acceleration system for hardness evaluation
C Lopez-Ongil, M Garcia-Valderas, M Portela-Garcia, L Entrena
IEEE Transactions on Nuclear Science 54 (1), 252-261, 2007
1682007
Soft error sensitivity evaluation of microprocessors by multilevel emulation-based fault injection
L Entrena, M Garcia-Valderas, R Fernandez-Cardenal, A Lindoso, ...
IEEE Transactions on Computers 61 (3), 313-322, 2010
1462010
New techniques for speeding-up fault-injection campaigns
L Berrojo, I González, F Corno, MS Reorda, G Squillero, L Entrena, ...
Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002
1212002
Fault injection in modern microprocessors using on-chip debugging infrastructures
M Portela-Garcia, C Lopez-Ongil, MGG Valderas, L Entrena
IEEE Transactions on Dependable and Secure Computing 8 (2), 308-314, 2010
512010
A unified environment for fault injection at any design level based on emulation
C Lopez-Ongil, L Entrena, M Garcia-Valderas, M Portela, MA Aguirre, ...
IEEE Transactions on Nuclear Science 54 (4), 946-950, 2007
492007
An industrial environment for high-level fault-tolerant structures insertion and validation
L Berrojo, F Corno, L Entrena, I Gonzalez, C López, MS Reorda, ...
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 229-236, 2002
482002
SET emulation considering electrical masking effects
L Entrena, MG Valderas, RF Cardenal, MP Garcia, CL Ongil
IEEE Transactions on Nuclear Science 56 (4), 2021-2025, 2009
442009
Logic masking for SET mitigation using approximate logic circuits
A Sanchez-Clemente, L Entrena, M García-Valderas, C López-Ongil
2012 IEEE 18th International On-Line Testing Symposium (IOLTS), 176-181, 2012
422012
A rapid fault injection approach for measuring seu sensitivity in complex processors
M Portela-Garcia, C Lopez-Ongil, M Garcia-Valderas, L Entrena
13th IEEE International On-Line Testing Symposium (IOLTS 2007), 101-106, 2007
372007
On the use of embedded debug features for permanent and transient fault resilience in microprocessors
M Portela-García, M Grosso, M Gallardo-Campos, MS Reorda, L Entrena, ...
Microprocessors and Microsystems 36 (5), 334-343, 2012
362012
An on-line fault detection technique based on embedded debug features
M Grosso, MS Reorda, M Portela-Garcia, M García-Valderas, ...
2010 IEEE 16th International On-Line Testing Symposium, 167-172, 2010
332010
Embedded emotion recognition within cyber-physical systems using physiological signals
JAM Calero, R Marino, JM Lanza-Gutierrez, T Riesgo, M Garcia-Valderas, ...
2018 Conference on design of circuits and integrated systems (DCIS), 1-6, 2018
322018
Correlation-based fingerprint matching using FPGAs
A Lindoso, L Entrena, C López-Ongil, J Liu
Proceedings. 2005 IEEE International Conference on Field-Programmable …, 2005
322005
Emotion elicitation under audiovisual stimuli reception: Should artificial intelligence consider the gender perspective?
M Blanco-Ruiz, C Sainz-de-Baranda, L Gutiérrez-Martín, ...
International Journal of Environmental Research and Public Health 17 (22), 8534, 2020
292020
Fault injection-based reliability evaluation of SoPCs
MS Reorda, L Sterpone, M Violante, M Portela-García, C López-Ongil, ...
Eleventh IEEE European Test Symposium (ETS'06), 75-82, 2006
282006
Automatic insertion of fault-tolerant structures at the RT level
L Entrena, C López, E Olías
Proceedings Seventh International On-Line Testing Workshop, 48-50, 2001
272001
Autonomous transient fault emulation on FPGAs for accelerating fault grading
C López-Ongil, M García-Valderas, M Portela-Garcfa, L Entrena-Arrontes
11th IEEE International On-Line Testing Symposium, 43-48, 2005
252005
Solar energy harvesting to improve capabilities of wearable devices
A Páez-Montoro, M García-Valderas, E Olías-Ruíz, C López-Ongil
Sensors 22 (10), 3950, 2022
212022
SET emulation under a quantized delay model
M García Valderas, L Entrena, R Fernández Cardenal, C López Ongil, ...
Journal of Electronic Testing 25, 107-116, 2009
212009
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