Sergio L. Morelhao
Sergio L. Morelhao
Institute of Physics, University of Sao Paulo, Brazil
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Cited by
Cited by
X-ray multiple diffraction phenomenon in the evaluation of semiconductor crystalline perfection
SL Morelhão, LP Cardoso
Journal of applied crystallography 29 (4), 446-456, 1996
Structural properties of heteroepitaxial systems using hybrid multiple diffraction in Renninger scans
SL Morelhão, LP Cardoso
Journal of applied physics 73 (9), 4218-4226, 1993
Structural properties of Bi2Te3 topological insulator thin films grown by molecular beam epitaxy on (111) BaF2 substrates
CI Fornari, PHO Rappl, SL Morelhão, E Abramof
Journal of Applied Physics 119 (16), 165303, 2016
Sensitivity of Bragg surface diffraction to analyze ion-implanted semiconductors
MA Hayashi, SL Morelhão, LH Avanci, LP Cardoso, JM Sasaki, LC Kretly, ...
Applied physics letters 71 (18), 2614-2616, 1997
Computer Simulation Tools for X-ray Analysis
SL Morelhão
Cham: Springer International Publishing, 2016
Hybrid multiple diffraction in Renninger scan for heteroepitaxial layers
SL Morelhão, LP Cardoso, JM Sasaki, MMG De Carvalho
Journal of applied physics 70 (5), 2589-2593, 1991
A versatile X-ray diffraction station at LNLS (Brazil)
C Cusatis, M Kobayashi Franco, E Kakuno, C Giles, S Morelhão, V Mello, ...
Journal of synchrotron radiation 5 (3), 491-493, 1998
Nanostructure of sol–gel films by x-ray specular reflectivity
SL Morelhao, GES Brito, E Abramof
Applied physics letters 80 (3), 407-409, 2002
Synchrotron X‐ray Renninger scanning for studying strain in InAs/GaAs quantum dot system
RO Freitas, TE Lamas, AA Quivy, SL Morelhão
physica status solidi (a) 204 (8), 2548-2554, 2007
Observation of coherent hybrid reflection with synchrotron radiation
SL Morelhao, LH Avanci, MA Hayashi, LP Cardoso, SP Collins
Applied physics letters 73 (15), 2194-2196, 1998
Hybrid reciprocal space for X-ray diffraction in epitaxic layers
SL Morelhao, JK Domagala
Journal of Applied Crystallography 40 (3), 546-551, 2007
Analysis of interfacial misfit dislocation by X-ray multiple diffraction
SL Morelhão, LP Cardoso
Solid state communications 88 (6), 465-469, 1993
Preservation of pristine Bi2Te3 thin film topological insulator surface after ex situ mechanical removal of Te capping layer
CI Fornari, PHO Rappl, SL Morelhão, TRF Peixoto, H Bentmann, ...
APL Materials 4 (10), 106107, 2016
An X-ray diffractometer for accurate structural invariant phase determination
SL Morelhao
Journal of synchrotron radiation 10 (3), 236-241, 2003
Strength tuning of multiple waves in crystals
SL Morelhão, LH Avanci
Acta Crystallographica Section A: Foundations of Crystallography 57 (2), 192-196, 2001
Nanoscale characterization of bismuth telluride epitaxial layers by advanced X-ray analysis
SL Morelhao, CI Fornari, PHO Rappl, E Abramof
Journal of Applied Crystallography 50 (2), 399-410, 2017
X-ray phase measurements as a probe of small structural changes in doped nonlinear optical crystals
SL Morelhão, CMR Remédios, RO Freitas, AO dos Santos
Journal of Applied Crystallography 44 (1), 93-101, 2011
X‐ray imaging in advanced studies of ophthalmic diseases
A Antunes, AMV Safatle, PSM Barros, SL Morelhão
Medical physics 33 (7Part1), 2338-2343, 2006
Enhanced X-ray phase determination by three-beam diffraction
SL Morelhão, S Kycia
Physical review letters 89 (1), 015501, 2002
Simulation of hybrid reflections in X-ray multiple diffraction experiments
SL Morelhão, LP Cardoso
Journal of crystal growth 110 (3), 543-552, 1991
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