Fulvio Corno
Título
Citado por
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Año
RT-level ITC'99 benchmarks and first ATPG results
F Corno, MS Reorda, G Squillero
IEEE Design & Test of computers 17 (3), 44-53, 2000
5592000
Dogont-ontology modeling for intelligent domotic environments
D Bonino, F Corno
International Semantic Web Conference, 790-803, 2008
2932008
Review of the state-of-the-art in patent information and forthcoming evolutions in intelligent patent informatics
D Bonino, A Ciaramella, F Corno
World Patent Information 32 (1), 30-38, 2010
1992010
Automatic test program generation: a case study
F Corno, E Sánchez, MS Reorda, G Squillero
IEEE Design & Test of Computers 21 (2), 102-109, 2004
1752004
GATTO: A genetic algorithm for automatic test pattern generation for large synchronous sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996
1671996
Low power BIST via non-linear hybrid cellular automata
F Corno, M Rebaudengo, MS Reorda, G Squillero, M Violante
Proceedings 18th IEEE VLSI Test Symposium, 29-34, 2000
1572000
A test pattern generation methodology for low power consumption
E Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 453-457, 1998
1351998
Home energy consumption feedback: A user survey
D Bonino, F Corno, L De Russis
Energy and Buildings 47, 383-393, 2012
1292012
Fully automatic test program generation for microprocessor cores
F Corno, G Cumani, MS Reorda, G Squillero
2003 Design, Automation and Test in Europe Conference and Exhibition, 1006-1011, 2003
1262003
Ontology driven semantic search
D Bonino, F Corno, L Farinetti, A Bosca
WSEAS Transaction on Information Science and Application 1 (6), 1597-1605, 2004
1242004
The DOG gateway: enabling ontology-based intelligent domotic environments
D Bonino, E Castellina, F Corno
IEEE transactions on consumer electronics 54 (4), 1656-1664, 2008
1202008
On the test of microprocessor IP cores
F Corno, MS Reorda, G Squillero, M Violante
Proceedings Design, Automation and Test in Europe. Conference and Exhibition …, 2001
1072001
Testability analysis and ATPG on behavioral RT-level VHDL
F Corno, P Prinetto, MS Reorda
Proceedings International Test Conference 1997, 753-759, 1997
1021997
New techniques for speeding-up fault-injection campaigns
L Berrojo, I González, F Corno, MS Reorda, G Squillero, L Entrena, ...
Proceedings 2002 Design, Automation and Test in Europe Conference and …, 2002
1002002
Intelligent energy optimization for user intelligible goals in smart home environments
F Corno, F Razzak
IEEE transactions on Smart Grid 3 (4), 2128-2135, 2012
882012
Fast sequential circuit test generation using high-level and gate-level techniques
EM Rudnick, R Vietti, A Ellis, F Corno, P Prinetto, MS Reorda
Proceedings Design, Automation and Test in Europe, 570-576, 1998
881998
The selfish gene algorithm: a new evolutionary optimization strategy
F Corno, MS Reorda, G Squillero
Proceedings of the 1998 ACM symposium on Applied Computing, 349-355, 1998
751998
New static compaction techniques of test sequences for sequential circuits
F Corno, P Prinetto, M Rebaudengo, MS Reorda
Proceedings European Design and Test Conference. ED & TC 97, 37-43, 1997
731997
A new BIST architecture for low power circuits
F Corno, M Rebaudengo, MS Reorda, M Violante
European Test Workshop 1999 (Cat. No. PR00390), 160-164, 1999
691999
Advanced techniques for GA-based sequential ATPGs
F Corno, P Prinetto, M Rebaudengo, MS Reorda, R Mosca
Proceedings ED&TC European Design and Test Conference, 375-379, 1996
681996
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