Structural and optical properties of β-Ga2O3 thin films grown by plasma-assisted molecular beam epitaxy S Ghose, MS Rahman, JS Rojas-Ramirez, M Caro, R Droopad, A Arias, ... Journal of Vacuum Science & Technology B 34 (2), 2016 | 82 | 2016 |
Synthesis of high purity nickel oxide by a modified sol-gel method D Mateos, B Valdez, JR Castillo, N Nedev, M Curiel, O Perez, A Arias, ... Ceramics International 45 (9), 11403-11407, 2019 | 47 | 2019 |
Structural, Optical, and Electrical Characterization of β-Ga2O3 Thin Films Grown by Plasma-Assisted Molecular Beam Epitaxy Suitable for UV Sensing A Arias, N Nedev, S Ghose, JS Rojas-Ramirez, D Mateos, ... Advances in Materials Science and Engineering 2018, 2018 | 22 | 2018 |
Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer deposition JR Martinez-Castelo, J Lopez, D Dominguez, E Murillo, R Machorro, ... Materials Science in Semiconductor Processing 71, 290-295, 2017 | 22 | 2017 |
Ultrahigh purity beta gallium oxide microstructures M Suárez, A Arias, JR Castillo-Saenz, M Curiel-Alvarez, ... Ceramics International, 2022 | 11 | 2022 |
UV Sensitivity of MOS Structures with Silicon Nanoclusters M Curiel, N Nedev, J Paz, O Perez, B Valdez, D Mateos, A Arias, ... Sensors 19 (10), 2277, 2019 | 10 | 2019 |
Gold, copper and gold/copper bimetallic nanoparticles obtained by focused ion beam sputter deposition and rapid thermal annealing OP Landeros, N Nedev, MC Alvarez, BV Salas, A Barajas, DM Anzaldo, ... Vacuum 157, 166-172, 2018 | 10 | 2018 |
Application of Metal-Oxide-Semiconductor structures containing silicon nanocrystals in radiation dosimetry D Nesheva, N Nedev, M Curiel, V Dzhurkov, A Arias, E Manolov, ... Open Physics 13 (1), 2015 | 9 | 2015 |
Structural, compositional and electrical characterization of Si-rich SiO x layers suitable for application in light sensors R Herrera, M Curiel, A Arias, D Nesheva, N Nedev, E Manolov, ... Materials Science in Semiconductor Processing 37, 229-234, 2015 | 7 | 2015 |
MOS structures containing Si nanocrystals for applications in UV dosimeters A Arias, N Nedev, D Nesheva, M Curiel, E Manolov, D Mateos, V Dzurkov, ... Key Engineering Materials 605, 380-383, 2014 | 7 | 2014 |
TEM and spectroscopic ellipsometry studies of multilayer gate dielectrics containing crystalline and amorphous Si nanoclusters D Mateos, MA Curiel, N Nedev, D Nesheva, R Machorro, E Manolov, ... Physica E: Low-dimensional Systems and Nanostructures 51, 111-114, 2013 | 6 | 2013 |
Selective photosensitivity of metal–oxide–semiconductor structures with SiOx layer annealed at high temperature J Paz, N Nedev, D Nesheva, M Curiel, E Manolov, B Valdez, O Perez, ... Journal of Materials Science: Materials in Electronics 31, 17412-17421, 2020 | 5 | 2020 |
Flexible Ultraviolet Sensor Based on Zinc Oxide Nanoparticle Powder NA Munguía-Fernández, JR Castillo-Saenz, OM Perez-Landeros, ... Crystals 13 (12), 1672, 2023 | 3 | 2023 |
High-performance broadband photodetectors based on sputtered NiOx/n-Si heterojunction diodes D Mateos-Anzaldo, R Nedev, O Perez-Landeros, M Curiel-Alvarez, ... Optical Materials 145, 114422, 2023 | 3 | 2023 |
UV Dosimeters Based on Metal-Oxide-Semiconductor Structures Containing Si Nanocrystals A Arias, N Nedev, D Nesheva, M Curiel, E Manolov, D Mateos, V Dzurkov, ... Sensor Letters 13 (7), 561-564, 2015 | 3 | 2015 |
β-Ga2O3 nanostructures for photocatalytic degradation of red amaranth toxic dye JR Castillo-Saenz, D Domínguez, A Arias, LA Arce, MH Farías, ... Nano Express 5 (2), 025005, 2024 | 2 | 2024 |
Electrical characterization of interface defects in MOS structures containing silicon nanoclusters A Arias, N Nedev, M Curiel, D Nesheva, E Manolov, B Valdez, D Mateos, ... Advanced Materials Research 976, 129-132, 2014 | 2 | 2014 |
Visible light sensor based on metal-oxide-semiconductor structure N Nedev, A Arias, M Curiel, R Nedev, D Mateos, E Manolov, D Nesheva, ... Key Engineering Materials 605, 384-387, 2014 | 2 | 2014 |
Metal-Oxide-Semiconductor Structures with Two and Three-Region Gate Dielectric Containing Silicon Nanocrystals: Structural, Infrared and Electrical Properties D Mateos, A Arias, N Nedev, M Curiel, V Dzhurkov, E Manolov, ... Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo …, 2013 | 2 | 2013 |
Electrical Characterization of MOS Structures with Silicon Nanocrystals Suitable for X-ray Detection D Mateos, N Nedev, D Nesheva, M Curiel, E Manolov, A Arias, ... Key Engineering Materials 543, 150-153, 2013 | 1 | 2013 |