Abraham Arias León
Abraham Arias León
Dirección de correo verificada de uabc.edu.mx
Citado por
Citado por
Structural and optical properties of β-Ga2O3 thin films grown by plasma-assisted molecular beam epitaxy
S Ghose, MS Rahman, JS Rojas-Ramirez, M Caro, R Droopad, A Arias, ...
Journal of Vacuum Science & Technology B, Nanotechnology and …, 2016
Synthesis of high purity nickel oxide by a modified sol-gel method
D Mateos, B Valdez, JR Castillo, N Nedev, M Curiel, O Perez, A Arias, ...
Ceramics International 45 (9), 11403-11407, 2019
Structural and electrical characterization of multilayer Al2O3/ZnO nanolaminates grown by atomic layer deposition
JR Martinez-Castelo, J Lopez, D Dominguez, E Murillo, R Machorro, ...
Materials Science in Semiconductor Processing 71, 290-295, 2017
Structural, Optical, and Electrical Characterization of β-Ga2O3 Thin Films Grown by Plasma-Assisted Molecular Beam Epitaxy Suitable for UV Sensing
A Arias, N Nedev, S Ghose, JS Rojas-Ramirez, D Mateos, ...
Advances in Materials Science and Engineering 2018, 2018
Gold, copper and gold/copper bimetallic nanoparticles obtained by focused ion beam sputter deposition and rapid thermal annealing
OP Landeros, N Nedev, MC Alvarez, BV Salas, A Barajas, DM Anzaldo, ...
Vacuum 157, 166-172, 2018
Structural, compositional and electrical characterization of Si-rich SiO x layers suitable for application in light sensors
R Herrera, M Curiel, A Arias, D Nesheva, N Nedev, E Manolov, ...
Materials Science in Semiconductor Processing 37, 229-234, 2015
Application of Metal-Oxide-Semiconductor structures containing silicon nanocrystals in radiation dosimetry
D Nesheva, N Nedev, M Curiel, V Dzhurkov, A Arias, E Manolov, ...
Open Physics 13 (1), 2015
TEM and spectroscopic ellipsometry studies of multilayer gate dielectrics containing crystalline and amorphous Si nanoclusters
D Mateos, MA Curiel, N Nedev, D Nesheva, R Machorro, E Manolov, ...
Physica E: Low-dimensional Systems and Nanostructures 51, 111-114, 2013
UV Sensitivity of MOS Structures with Silicon Nanoclusters
M Curiel, N Nedev, J Paz, O Perez, B Valdez, D Mateos, A Arias, ...
Sensors 19 (10), 2277, 2019
MOS structures containing Si nanocrystals for applications in UV dosimeters
A Arias, N Nedev, D Nesheva, M Curiel, E Manolov, D Mateos, V Dzurkov, ...
Key Engineering Materials 605, 380-383, 2014
Selective photosensitivity of metal–oxide–semiconductor structures with SiO x layer annealed at high temperature
J Paz, N Nedev, D Nesheva, M Curiel, E Manolov, B Valdez, O Perez, ...
Journal of Materials Science: Materials in Electronics 31 (20), 17412-17421, 2020
UV Dosimeters Based on Metal-Oxide-Semiconductor Structures Containing Si Nanocrystals
A Arias, N Nedev, D Nesheva, M Curiel, E Manolov, D Mateos, V Dzurkov, ...
Sensor Letters 13 (7), 561-564, 2015
Electrical characterization of interface defects in MOS structures containing silicon nanoclusters
A Arias, N Nedev, M Curiel, D Nesheva, E Manolov, B Valdez, D Mateos, ...
Advanced Materials Research 976, 129-132, 2014
Metal-Oxide-Semiconductor Structures with Two and Three-Region Gate Dielectric Containing Silicon Nanocrystals: Structural, Infrared and Electrical Properties
D Mateos, A Arias, N Nedev, M Curiel, V Dzhurkov, E Manolov, ...
Technical Proceedings of the 2013 NSTI Nanotechnology Conference and Expo …, 2013
Electrical Characterization of MOS Structures with Silicon Nanocrystals Suitable for X-ray Detection
D Mateos, N Nedev, D Nesheva, M Curiel, E Manolov, A Arias, ...
Key Engineering Materials 543, 150-153, 2013
Application of Metal-Oxide-Semiconductor Structures for Visible and Near UV Light Sensing
A Arias, N Nedev, M Curiel, R Nedev, D Mateos, E Manolov, D Nesheva, ...
Sensor Letters 13 (7), 556-560, 2015
Visible light sensor based on metal-oxide-semiconductor structure
N Nedev, A Arias, M Curiel, R Nedev, D Mateos, E Manolov, D Nesheva, ...
Key Engineering Materials 605, 384-387, 2014
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–17