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Sven Tougaard
Sven Tougaard
Professor of physics, University of Southern Denmark
Dirección de correo verificada de sdu.dk
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Quantitative analysis of the inelastic background in surface electron spectroscopy
S Tougaard
Surface and Interface Analysis 11 (9), 453-472, 1988
6021988
Electronic and optical properties of Cu, CuO and Cu2O studied by electron spectroscopy
D Tahir, S Tougaard
Journal of physics: Condensed matter 24 (17), 175002, 2012
5642012
Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy
N Fairley, V Fernandez, M Richard‐Plouet, C Guillot-Deudon, J Walton, ...
Applied Surface Science Advances 5, 100112, 2021
5532021
Influence of elastic and inelastic scattering on energy spectra of electrons emitted from solids
S Tougaard, P Sigmund
Physical Review B 25 (7), 4452, 1982
5291982
Universality classes of inelastic electron scattering cross‐sections
S Tougaard
Surface and Interface Analysis: An International Journal devoted to the …, 1997
4271997
Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopy
S Tougaard, I Chorkendorff
Physical Review B 35 (13), 6570, 1987
3801987
Model for quantitative analysis of reflection-electron-energy-loss spectra
F Yubero, S Tougaard
Physical Review B 46 (4), 2486, 1992
3071992
Surface nanostructure determination by x‐ray photoemission spectroscopy peak shape analysis
S Tougaard
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (3 …, 1996
2651996
Inelastic-electron-scattering cross sections for Si, Cu, Ag, Au, Ti, Fe, and Pd
S Tougaard, J Kraaer
Physical Review B 43 (2), 1651, 1991
2601991
Model for quantitative analysis of reflection-electron-energy-loss spectra: Angular dependence
F Yubero, JM Sanz, B Ramskov, S Tougaard
Physical Review B 53 (15), 9719, 1996
2021996
Inelastic background correction and quantitative surface analysis
S Tougaard
Journal of Electron Spectroscopy and Related Phenomena 52, 243-271, 1990
1951990
Determination of the Cu 2p primary excitation spectra for Cu, Cu2O and CuO
N Pauly, S Tougaard, F Yubero
Surface Science 620, 17-22, 2014
1872014
Low energy inelastic electron scattering properties of noble and transition metals
S Tougaard
Solid state communications 61 (9), 547-549, 1987
1861987
Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging
S Tougaard
Journal of Electron Spectroscopy and Related Phenomena 178, 128-153, 2010
1722010
Background removal in x-ray photoelectron spectroscopy: Relative importance of intrinsic and extrinsic processes
S Tougaard
Physical Review B 34 (10), 6779, 1986
1511986
Comparison of validity and consistency of methods for quantitative XPS peak analysis
S Tougaard, C Jansson
Surface and Interface Analysis 20 (13), 1013-1046, 1993
1491993
Non‐destructive depth profiling through quantitative analysis of surface electron spectra
S Tougaard, HS Hansen
Surface and interface analysis 14 (11), 730-738, 1989
1261989
Quantitative model of electron energy loss in XPS
AC Simonsen, F Yubero, S Tougaard
Physical Review B 56 (3), 1612, 1997
1191997
Elastic electron backscattering from surfaces
A Jablonski, J Gryko, J Kraaer, S Tougaard
Physical Review B 39 (1), 61, 1989
1061989
Formalism for quantitative surface analysis by electron spectroscopy
S Tougaard
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 8 (3 …, 1990
1051990
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