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Masato Aketagawa
Masato Aketagawa
Professor Mechanical Engineering Nagaoka University of Technology
Dirección de correo verificada de vos.nagaokaut.ac.jp
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Año
Illuminating device
M Muraki, M Aketagawa, T Shiozawa
US Patent 4,974,919, 1990
1581990
Development of a roughness measurement standard with irregular surface topography for improving 3D surface texture measurement
K Nemoto, K Yanagi, M Aketagawa, I Yoshida, M Uchidate, T Miyaguchi, ...
Measurement Science and Technology 20 (8), 084023, 2009
692009
Exposure method and apparatus
N Sano, M Aketagawa, H Nakano, T Shiozawa
US Patent 5,121,160, 1992
641992
Concurrent measurement method of spindle radial, axial and angular motions using concentric circle grating and phase modulation interferometers
M Madden, M Aketagawa, T Kumagai, Y Maeda, E Okuyama
Measurement Science and Technology 25 (9), 094005, 2014
352014
Length measurement using a regular crystalline lattice and a dual tunnelling unit scanning tunnelling microscope in a thermo-stabilized cell
M Aketagawa, K Takada, K Kobayashi, N Takeshima, M Noro, ...
Measurement Science and Technology 9 (7), 1076, 1998
331998
Accurate displacement-measuring interferometer with wide range using an I2 frequency-stabilized laser diode based on sinusoidal frequency modulation
TT Vu, M Higuchi, M Aketagawa
Measurement Science and Technology 27 (10), 105201, 2016
312016
Measurement of air-refractive-index fluctuation from laser frequency shift with uncertainty of order 10− 9
TB Quoc, M Ishige, Y Ohkubo, M Aketagawa
Measurement Science and Technology 20 (12), 125302, 2009
302009
Exposure apparatus
M Aketagawa
US Patent 4,905,041, 1990
301990
Measurement of air-refractive-index fluctuation from frequency change using a phase modulation homodyne interferometer and an external cavity laser diode
M Ishige, M Aketagawa, TB Quoc, Y Hoshino
Measurement Science and Technology 20 (8), 084019, 2009
282009
Direct measurement instrument for lattice spacing on regular crystalline surfaces using a scanning tunneling microscope and laser interferometry
P Rerkkumsup, M Aketagawa, K Takada, T Watanabe, S Sadakata
Review of scientific instruments 74 (3), 1205-1210, 2003
282003
Optical encoder calibration using lattice spacing and optical fringe derived from a scanning tunnelling microscope and optical interferometer
M Aketagawa, Y Ikeda, N Tanyarat, M Ishige
Measurement Science and Technology 18 (2), 503, 2007
262007
Tracking and stepping control of the tip position of a scanning tunneling microscope by referring to atomic points and arrays on a regular crystalline surface
M Aketagawa, K Takada, Y Minao, Y Oka, JD Lee
Review of scientific instruments 70 (4), 2053-2059, 1999
261999
Comparison of length measurements provided by a femtosecond optical frequency comb
D Wei, M Aketagawa
Optics Express 22 (6), 7040-7045, 2014
252014
19-picometer mechanical step displacement measurement using heterodyne interferometer with phase-locked loop and piezoelectric driving flexure-stage
TD Nguyen, QA Duong, M Higuchi, TT Vu, D Wei, M Aketagawa
Sensors and Actuators A: Physical 304, 111880, 2020
242020
Iodine-frequency-stabilized laser diode and displacement-measuring interferometer based on sinusoidal phase modulation
QA Duong, TT Vu, M Higuchi, D Wei, M Aketagawa
Measurement Science and Technology 29 (6), 065204, 2018
222018
Correction of distorted STM image by using a regular crystalline lattice and 2D FFT
M Aketagawa, K Takada
Nanotechnology 6 (4), 105, 1995
211995
Two-dimensional encoder with picometre resolution using lattice spacing on regular crystalline surface as standard
M Aketagawa, H Honda, M Ishige, C Patamaporn
Measurement Science and Technology 18 (2), 342, 2007
192007
Long atomic imaging over a 5-μm-long region using an ultralow thermally drifted dual-tunneling-unit scanning tunneling microscope in a thermostabilized cell
M Aketagawa, K Takada, N Takeshima, K Yamada, JD Lee
Review of scientific instruments 70 (1), 133-136, 1999
191999
Highly stable atom-tracking scanning tunneling microscopy
P Rerkkumsup, M Aketagawa, K Takada, Y Togawa, NT Thinh, Y Kozuma
Review of scientific instruments 75 (4), 1061-1067, 2004
182004
Active suppression of air refractive index fluctuation using a Fabry–Perot cavity and a piezoelectric volume actuator
TQ Banh, Y Ohkubo, Y Murai, M Aketagawa
Applied Optics 50 (1), 53-60, 2011
172011
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20