| Deep learning for deflectometric inspection of specular surfaces D Maestro-Watson, J Balzategui, L Eciolaza, N Arana-Arexolaleiba The 13th International Conference on Soft Computing Models in Industrial and …, 2018 | 5 | 2018 |
| Deflectometric data segmentation for surface inspection: a fully convolutional neural network approach D Maestro-Watson, J Balzategui, L Eciolaza, N Arana-Arexolaleiba Journal of Electronic Imaging 29 (4), 041007, 2020 | 4 | 2020 |
| Semi-automatic quality inspection of solar cell based on convolutional neural networks J Balzategui, L Eciolaza, N Arana-Arexolaleiba, J Altube, JP Aguerre, ... 2019 24th IEEE International Conference on Emerging Technologies and Factory …, 2019 | 4 | 2019 |
| Deflectometric data segmentation based on fully convolutional neural networks D Maestro-Watson, J Balzategui, L Eciolaza, N Arana-Arexolaleiba Fourteenth International Conference on Quality Control by Artificial Vision …, 2019 | 4 | 2019 |
| Defect detection on Polycrystalline solar cells using Electroluminescence and Fully Convolutional Neural Networks J Balzategui, L Eciolaza, N Arana-Arexolaleiba 2020 IEEE/SICE International Symposium on System Integration (SII), 949-953, 2020 | | 2020 |
Luka Eciolaza EcheverriaMondragon UniversityDirección de correo verificada de mondragon.edu
