| Reliability challenges in design of memristive memories P Pouyan, E Amat, A Rubio 2014 5th European Workshop on CMOS Variability (VARI), 1-6, 2014 | 61 | 2014 |
| Memristive Crossbar Memory Lifetime Evaluation and Reconfiguration Strategies P Pouyan, E Amat, A Rubio IEEE Transactions on Emerging Topics in Computing, 2016 | 33 | 2016 |
| A VLSI implementation of logarithmic and exponential functions using a novel parabolic synthesis methodology compared to the CORDIC algorithm P Pouyan, E Hertz, P Nilsson 2011 20th European Conference on Circuit Theory and Design (ECCTD), 709-712, 2011 | 30 | 2011 |
| Process variability-aware proactive reconfiguration technique for mitigating aging effects in nano scale SRAM lifetime P Pouyan, E Amat, A Rubio 2012 IEEE 30th VLSI Test Symposium (VTS), 240-245, 2012 | 25 | 2012 |
| RRAM variability and its mitigation schemes P Pouyan, E Amat, S Hamdioui, A Rubio 2016 26th international workshop on power and timing modeling, optimization …, 2016 | 24 | 2016 |
| Test and reliability of emerging non-volatile memories S Hamdioui, P Pouyan, H Li, Y Wang, A Raychowdhur, I Yoon 2017 IEEE 26th Asian Test Symposium (ATS), 175-183, 2017 | 19 | 2017 |
| Statistical lifetime analysis of memristive crossbar matrix P Pouyan, E Amat, A Rubio 2015 10th International Conference on Design & Technology of Integrated …, 2015 | 19 | 2015 |
| State of the art and challenges for test and reliability of emerging nonvolatile resistive memories EI Vatajelu, P Pouyan, S Hamdioui International Journal of Circuit Theory and Applications 46 (1), 4-28, 2018 | 15 | 2018 |
| Adaptive proactive reconfiguration: A technique for process-variability-and aging-aware SRAM cache design P Pouyan, E Amat, A Rubio IEEE Transactions on Very Large Scale Integration (VLSI) Systems 23 (9 …, 2014 | 11 | 2014 |
| New reliability mechanisms in memory design for sub-22nm technologies N Aymerich, A Asenov, A Brown, R Canal, B Cheng, J Figueras, ... 2011 IEEE 17th International On-Line Testing Symposium, 111-114, 2011 | 8 | 2011 |
| An experience with chalcogenide memristors, and implications on memory and computer applications M Escudero-López, E Amat, A Rubio, P Pouyan 2016 Conference on Design of Circuits and Integrated Systems (DCIS), 1-6, 2016 | 5 | 2016 |
| Reliability-aware memory design using advanced reconfiguration mechanisms P Pouyan Universitat Politècnica de Catalunya, 2015 | 4 | 2015 |
| Analysis and design of an adaptive proactive reconfiguration approach for memristive crossbar memories P Pouyan, E Amat, A Rubio Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale …, 2015 | 4 | 2015 |
| Insights to memristive memory cell from a reliability perspective P Pouyan, E Amat, A Rubio International Conference on Memristive Systems (MEMRISYS) 2015, 1-2, 2015 | 4 | 2015 |
| Reliability issues in RRAM ternary memories affected by variability and aging mechanisms A Rubio, M Escudero, P Pouyan 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017 | 3 | 2017 |
| Standards-based tools and services for building lifelong learning pathways C Sgouropoulou, I Voyiatzis, A Koutoumanos, S Hamdioui, P Pouyan, ... 2017 IEEE Global Engineering Education Conference (EDUCON), 1619-1621, 2017 | 3 | 2017 |
| Resistive random access memory variability and its mitigation schemes P Pouyan, E Amat, S Hamdioui, A Rubio Journal of Low Power Electronics 13 (1), 124-134, 2017 | 3 | 2017 |
| Design and implementation of an adaptive proactive reconfiguration technique for SRAM caches P Pouyan, E Amat, F Moll, A Rubio 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013 | 3 | 2013 |
| Monitoring SRAM BTI degradation by current-based tracking technique P Pouyan, E Amat, A Rubio 2016 14th IEEE International New Circuits and Systems Conference (NEWCAS), 1-4, 2016 | 2 | 2016 |
| Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme P Pouyan, E Amat, A Rubio 2015 European Conference on Circuit Theory and Design (ECCTD), 1-4, 2015 | 2 | 2015 |
Antonio RubioProfessor of Electrical Engineering (UPC)Verified email at upc.edu
