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Kevin Muñoz Barón
Kevin Muñoz Barón
Dirección de correo verificada de ilh.uni-stuttgart.de
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Online monitoring of degradation sensitive electrical parameters in inverter operation for sic-mosfets
KM Barón, K Sharma, M Nitzsche, I Kallfass
2021 IEEE Applied Power Electronics Conference and Exposition (APEC), 1235-1241, 2021
122021
A robust approach for characterization of junction temperature of SiC power devices via quasi-threshold voltage as temperature sensitive electrical parameter
K Sharma, D Dayanand, KM Barón, J Ruthardt, F Münzenmayer, ...
2020 IEEE Applied Power Electronics Conference and Exposition (APEC), 1532-1536, 2020
112020
Characterization of the junction temperature of SiC power devices via quasi-threshold voltage as temperature sensitive electrical parameter
K Sharma, KM Baron, J Ruthardt, J Hueckelheim, D Koch, ...
CIPS 2020; 11th International Conference on Integrated Power Electronics …, 2020
92020
Dynamic ac power cycling with coupled inverters operating under application-oriented conditions
M Nitzsche, KM Baron, P Ziegler, F Wagner, J Roth-Stielow
CIPS 2020; 11th International Conference on Integrated Power Electronics …, 2020
72020
Online junction temperature measurement via internal gate resistance using the high frequency gate signal injection method
J Ruthardt, KM Baron, P Marx, K Sharma, M Nitzsche, M Fischer, ...
PCIM Europe 2019; International Exhibition and Conference for Power …, 2019
72019
Online junction temperature monitoring of wide bandgap power transistors using quasi turn-on delay as TSEP
K Sharma, KM Barón, J Ruthardt, I Kallfass
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2021
62021
Characterization of threshold voltage for application-oriented power cycling conditions for wide-bandgap power devices
KM Baron, K Sharma, M Nitzsche, P Ziegler, D Koch, I Kallfass
PCIM Europe digital days 2020; International Exhibition and Conference for …, 2020
62020
Characterization of Online Junction Temperature of the SiC power MOSFET by Combination of Four TSEPs using Neural Network
K Sharma, S Kamm, KM Barón, I Kallfass
2022 24th European Conference on Power Electronics and Applications (EPE'22 …, 2022
52022
Characterization of electrical parameters for health monitoring in sic mosfets during ac power cycling
KM Barón, K Sharma, M Nitzsche, I Kallfass
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2021
52021
Characterisation of the junction temperature of gallium-nitride power devices via quasi-threshold voltage as temperature sensitive electrical parameter
K Sharma, KM Barón, J Ruthardt, I Kallfass
The 10th International Conference on Power Electronics, Machines and Drives …, 2020
52020
Static and dynamic characterization of a monolithic integrated temperature sensor in a 600 v gan power ic
D Koch, S Moench, R Reiner, J Hueckelheim, KM Baron, P Waltereit, ...
PCIM Europe digital days 2020; International Exhibition and Conference for …, 2020
52020
Non-Destructive Failure Analysis of Power Devices via Time-Domain Reflectometry
K Sharma, S Kamm, V Afanasenko, KM Barón, I Kallfass
2021 IEEE 17th International Conference on Automation Science and …, 2021
42021
Analysis of a Transistor-Based On-State Voltage Measurement Circuit for Condition Monitoring of Power Transistors
KM Barón, MCJ Weiser, K Sharma, I Kallfass
2023 IEEE Applied Power Electronics Conference and Exposition (APEC), 2556-2562, 2023
32023
Application-oriented characterization of thermally optimized, asymmetrical single chip packages for 100 v gan hemts
D Koch, V Polezhaev, AB Sharma, KM Barón, T Huesgen, I Kallfass
2023 35th International Symposium on Power Semiconductor Devices and ICs …, 2023
22023
Letscope: Lifecycle extensions through software-defined predictive control of power electronics
A Chu, CM Hermann, J Silz, J Pfau, KM Barón, N Anantharajaiah, ...
IEEE EUROCON 2023-20th International Conference on Smart Technologies, 665-670, 2023
12023
Virtual Junction Temperature Estimation during Dynamic Power Cycling Tests
KM Barón, K Sharma, I Kallfass
2023 11th International Conference on Power Electronics and ECCE Asia (ICPE …, 2023
12023
A Fast ON-State Drain-to-Source Voltage Amplifier for the Dynamic Characterization of GaN Power Transistors
MCJ Weiser, KM Barón, T Fink, I Kallfass
2023 IEEE Applied Power Electronics Conference and Exposition (APEC), 637-644, 2023
12023
Online Health Monitoring in Power Modules for Inverter Topologies using Isolated Parameter Acquisition
KM Barón, K Sharma, M Nitzsche, I Kallfass
2021 IEEE Design Methodologies Conference (DMC), 1-6, 2021
12021
PCB-Integrated Pickup-Coil for Overcurrent Detection in High-Current, Paralleled GaN HEMTs
D Koch, T Fink, J Nuzzo, KM Barón, I Kallfass
2024 IEEE Applied Power Electronics Conference and Exposition (APEC), 555-560, 2024
2024
Digital Twin Approach for Accurate System-Level Simulation of Wide-Bandgap Power-Semiconductors using Temperature Dependent Parameters
O Solomakha, KM Baron, I Kallfass
PCIM Europe 2023; International Exhibition and Conference for Power …, 2023
2023
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