| Improving the reliability of SRAM-based PUFs under varying operation conditions and aging degradation P Saraza-Canflanca, H Carrasco-Lopez, A Santana-Andreo, P Brox, ... Microelectronics Reliability 118, 114049, 2021 | 11 | 2021 |
| A DRV-based bit selection method for SRAM PUF key generation and its impact on ECCs A Santana-Andreo, P Saraza-Canflanca, H Carrasco-Lopez, P Brox, ... Integration 85, 1-9, 2022 | 5 | 2022 |
| A smart SRAM-Cell array for the experimental study of variability phenomena in CMOS technologies P Saraza-Canflanca, H Carrasco-Lopez, A Santana-Andreo, ... 2022 IEEE International Reliability Physics Symposium (IRPS), P3-1-P3-5, 2022 | 3 | 2022 |
| A detailed, cell-by-cell look into the effects of aging on an SRAM PUF using a specialized test array A Santana-Andreo, P Saraza-Canflanca, H Carrasco-Lopez, ... 2023 19th International Conference on Synthesis, Modeling, Analysis and …, 2023 | 2 | 2023 |
| Impact of BTI and HCI on the reliability of a Majority Voter A Santana-Andreo, E Roca, R Castro-López, FV Fernández 2022 18th International Conference on Synthesis, Modeling, Analysis and …, 2022 | 1 | 2022 |
| Characterization and analysis of BTI and HCI effects in CMOS current mirrors A Santana-Andreo, P Martín-Lloret, E Roca, R Castro-López, ... 2022 18th International Conference on Synthesis, Modeling, Analysis and …, 2022 | 1 | 2022 |
| On the use of an RTN simulator to explore the quality trade-offs of a novel RTN-based PUF E Camacho-Ruiz, A Santana-Andreo, R Castro-López, E Roca, ... 2022 18th International Conference on Synthesis, Modeling, Analysis and …, 2022 | 1 | 2022 |
| Characterizing Aging Degradation of Integrated Circuits with a Versatile Custom Array of Reliability Test Structures A Santana-Andreo, P Martin-Lloret, E Roca, R Castro-Lopez, ... 2022 IEEE 34th International Conference on Microelectronic Test Structures …, 2022 | 1 | 2022 |
| Reliability improvement of SRAM PUFs based on a detailed experimental study into the stochastic effects of aging A Santana-Andreo, P Saraza-Canflanca, R Castro-Lopez, E Roca, ... AEU-International Journal of Electronics and Communications 176, 155147, 2024 | | 2024 |
| A Test Module for Aging Characterization of Digital Circuits JM Gata-Romero, A Santana-Andreo, E Roca, R Castro-Lopez, ... 2023 19th International Conference on Synthesis, Modeling, Analysis and …, 2023 | | 2023 |
Elisenda RocaInstituto de Microelectrónica de Sevilla, CNM, CSIC and Universidad de SevillaVerified email at imse-cnm.csic.es
