Tomaš Stankevič
Tomaš Stankevič
Verified email at microsoft.com
Title
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Year
Two-dimensional epitaxial superconductor-semiconductor heterostructures: A platform for topological superconducting networks
J Shabani, M Kjśrgaard, HJ Suominen, Y Kim, F Nichele, K Pakrouski, ...
Physical Review B 93 (15), 155402, 2016
151*2016
Web-based biometric computer mouse advisory system to analyze a user's emotions and work productivity
A Kaklauskas, EK Zavadskas, M Seniut, G Dzemyda, V Stankevic, ...
Engineering Applications of Artificial Intelligence 24 (6), 928-945, 2011
512011
Field effect enhancement in buffered quantum nanowire networks
F Krizek, JE Sestoft, P Aseev, S Marti-Sanchez, S Vaitiekėnas, L Casparis, ...
Physical review materials 2 (9), 093401, 2018
502018
Pulsed magnetic field measurement system based on colossal magnetoresistance-B-scalar sensors for railgun investigation
T Stankevič, L Medišauskas, V Stankevič, S Balevičius, N Žurauskienė, ...
Review of Scientific Instruments 85 (4), 044704, 2014
342014
Structural properties of wurtzite InP–InGaAs nanowire core–shell heterostructures
M Heurlin, T Stankevic, S Mickevičius, S Yngman, D Lindgren, ...
Nano letters 15 (4), 2462-2467, 2015
33*2015
Recommender system to analyze student’s academic performance
A Kaklauskas, EK Zavadskas, M Seniut, V Stankevic, J Raistenskis, ...
Expert Systems with Applications 40 (15), 6150-6165, 2013
322013
Bragg coherent x-ray diffractive imaging of a single indium phosphide nanowire
D Dzhigaev, A Shabalin, T Stankevič, U Lorenz, RP Kurta, F Seiboth, ...
Journal of Optics 18 (6), 064007, 2016
302016
Strain mapping in an InGaN/GaN nanowire using a nano-focused x-ray beam
T Stankevič, D Dzhigaev, Z Bi, M Rose, A Shabalin, J Reinhardt, ...
Applied Physics Letters 107 (10), 103101, 2015
282015
Fast strain mapping of nanowire light-emitting diodes using nanofocused x-ray beams
T Stankeviˇc, E Hilner, F Seiboth, R Ciechonski, G Vescovi, O Kryliouk, ...
ACS nano 9 (7), 6978-6984, 2015
272015
X-ray bragg ptychography on a single InGaN/GaN core–shell nanowire
D Dzhigaev, T Stankevič, Z Bi, S Lazarev, M Rose, A Shabalin, ...
ACS nano 11 (7), 6605-6611, 2017
202017
Measurement of strain in InGaN/GaN nanowires and nanopyramids
T Stankevič, S Mickevičius, M Schou Nielsen, O Kryliouk, R Ciechonski, ...
Journal of Applied Crystallography 48 (2), 344-349, 2015
202015
Magnetic diffusion inside the rails of an electromagnetic launcher: Experimental and numerical studies
T Stankevič, M Schneider, S Balevičius
IEEE Transactions on Plasma Science 41 (10), 2790-2795, 2013
192013
Velocity-induced current profiles inside the rails of an electric launcher
O Liebfried, M Schneider, T Stankevič, S Balevičius, N Žurauskienė
IEEE Transactions on Plasma Science 41 (5), 1520-1525, 2013
152013
Nanofocused x-ray beams applied for mapping strain in core-shell nanowires
T Stankevič, D Dzhigaev, Z Bi, M Rose, A Shabalin, J Reinhardt, ...
X-Ray Nanoimaging: Instruments and Methods II 9592, 95920D, 2015
92015
Theoretical analysis of the strain mapping in a single core-shell nanowire by x-ray Bragg ptychography
D Dzhigaev, T Stankevič, I Besedin, S Lazarev, A Shabalin, ...
X-Ray Nanoimaging: Instruments and Methods II 9592, 95920S, 2015
92015
First x-ray nanoimaging experiments at NanoMAX
U Vogt, K Parfeniukas, T Stankevič, S Kalbfleisch, M Liebi, Z Matej, ...
X-Ray Nanoimaging: Instruments and Methods III 10389, 103890K, 2017
82017
Single pulse calibration of magnetic field sensors using mobile 43 kJ facility
A Grainys, J Novickij, T Stankevič, V Stankevič, V Novickij, N Žurauskienė
Measurement Science Review 15 (5), 244-247, 2015
72015
Initial operation of the NanoMAX beamline at MAX IV
U Johansson, D Carbone, S Kalbfleisch, A Bjorling, ...
Microscopy and Microanalysis 24 (S2), 250-251, 2018
52018
Self-assembled InN quantum dots on side facets of GaN nanowires
Z Bi, M Ek, T Stankevic, J Colvin, M Hjort, D Lindgren, F Lenrick, ...
Journal of Applied Physics 123 (16), 164302, 2018
52018
Interferometric characterization of rotation stages for X-ray nanotomography
T Stankevič, C Engblom, F Langlois, F Alves, A Lestrade, N Jobert, ...
Review of Scientific Instruments 88 (5), 053703, 2017
52017
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