| RHEED intensity oscillations with extra maxima Z Mitura, M Stróżak, M Jałochowski Surface science 276 (1-3), L15-L18, 1992 | 43 | 1992 |
| Phase of RHEED oscillations Z Mitura, SL Dudarev, MJ Whelan Physical Review B 57 (11), 6309, 1998 | 42 | 1998 |
| Analysis of reflection high energy electron diffraction azimuthal plots Z Mitura, PA Maksym Physical review letters 70 (19), 2904, 1993 | 42 | 1993 |
| Computer simulation of x-ray spectra of metallic superlattices Z Mitura, P Mikolajczak Journal of Physics F: Metal Physics 18 (2), 183, 1988 | 40 | 1988 |
| Studies on RHEED oscillations at low glancing angles Z Mitura, A Daniluk Surface science 277 (1-2), 229-233, 1992 | 31 | 1992 |
| Thixoforming technology of high carbon X210CrW12 steel J Dutkiewicz, Ł Rogal, K Sołek, A Mitura International Journal of Material Forming 2, 753-756, 2009 | 17 | 2009 |
| RHEED from epitaxially grown thin films Z Mitura Surface Review and Letters 6 (03n04), 497-516, 1999 | 16 | 1999 |
| Thixoforming of spray formed M2 tool steel J Dutkiewicz, Ł Rogal, K Sołek, Z Mitura, P Kapranos International Journal of Material Forming 3, 755-758, 2010 | 14 | 2010 |
| The small terrace size approximation in the theory of RHEED oscillations Z Mitura, SL Dudarev, LM Peng, G Gladyszewski, MJ Whelan Journal of crystal growth 235 (1-4), 79-88, 2002 | 13 | 2002 |
| Interpretation of reflection high-energy electron diffraction oscillation phase Z Mitura, SL Dudarev, MJ Whelan Journal of crystal growth 198, 905-910, 1999 | 13 | 1999 |
| In situ characterization of epitaxially grown thin layers Z Mitura, P Mazurek, K Paprocki, P Mikol, JL Beeby Physical Review B 53 (15), 10200, 1996 | 13 | 1996 |
| Theoretical studies on the quantitative interpretation of RHEED data Z Mitura, JL Beeby Journal of Physics: Condensed Matter 8 (45), 8717, 1996 | 12 | 1996 |
| A study of the Ag/Cu and Au/Cu interfaces G Gładyszewski, Z Mitura Surface Science 231 (1-2), 90-94, 1990 | 11 | 1990 |
| Modelling thixocasting with precise accounting of moving front of material K Sołek, T Stuczyński, A Białobrzeski, R Kuziak, Z Mitura Materials Science and Technology 21 (5), 551-558, 2005 | 10 | 2005 |
| Iterative method of calculating reflection-high-energy-electron-diffraction intensities Z Mitura Physical Review B 59 (7), 4642, 1999 | 10 | 1999 |
| Investigation of a new method to control thin-film growth Z Mitura, P Marzurek, K Paprocki, P Mikolajczak Applied Physics A 60, 227-231, 1995 | 10 | 1995 |
| An Analysis of Kikuchi Lines Observed with a RHEED Apparatus for a TiO2-Terminated SrTiO3 (001) Crystal J Pawlak, M Przybylski, Z Mitura Materials 14 (22), 7077, 2021 | 9 | 2021 |
| The use of ADINA software to simulate thixocasting processes KP Sołek, Z Mitura, R Kuziak, P Kapranos Solid State Phenomena 116, 626-629, 2006 | 9 | 2006 |
| Theoretical analysis of RHEED intensities for growing surfaces Z Mitura, SL Dudarev, MJ Whelan Surface Review and Letters 5 (03n04), 701-709, 1998 | 9 | 1998 |
| Growth of the Bi-Sb superlattice G Gladyszewski, P Mikolajczak, Z Mitura, M Subotowicz Journal of Physics: Condensed Matter 1 (42), 7795, 1989 | 9 | 1989 |
