| The 2018 GaN power electronics roadmap H Amano, Y Baines, E Beam, M Borga, T Bouchet, PR Chalker, M Charles, ... Journal of Physics D: Applied Physics 51 (16), 163001, 2018 | 1060 | 2018 |
| A combined electro-optical method for the determination of the recombination parameters in InGaN-based light-emitting diodes M Meneghini, N Trivellin, G Meneghesso, E Zanoni, U Zehnder, B Hahn Journal of Applied Physics 106 (11), 2009 | 165 | 2009 |
| Phosphors for LED-based light sources: Thermal properties and reliability issues M Dal Lago, M Meneghini, N Trivellin, G Mura, M Vanzi, G Meneghesso, ... Microelectronics Reliability 52 (9-10), 2164-2167, 2012 | 81 | 2012 |
| Laser-based lighting: experimental analysis and perspectives N Trivellin, M Yushchenko, M Buffolo, C De Santi, M Meneghini, ... Materials 10 (10), 1166, 2017 | 67 | 2017 |
| Investigation of the deep level involved in InGaN laser degradation by deep level transient spectroscopy M Meneghini, C de Santi, N Trivellin, K Orita, S Takigawa, T Tanaka, ... Applied Physics Letters 99 (9), 2011 | 66 | 2011 |
| Degradation mechanisms of high-power LEDs for lighting applications: An overview M Meneghini, M Dal Lago, N Trivellin, G Meneghesso, E Zanoni IEEE Transactions on Industry Applications 50 (1), 78-85, 2013 | 65 | 2013 |
| Leakage current and reverse-bias luminescence in InGaN-based light-emitting diodes M Meneghini, N Trivellin, M Pavesi, M Manfredi, U Zehnder, B Hahn, ... Applied Physics Letters 95 (17), 2009 | 65 | 2009 |
| Analysis of diffusion-related gradual degradation of InGaN-based laser diodes K Orita, M Meneghini, H Ohno, N Trivellin, N Ikedo, S Takigawa, M Yuri, ... IEEE Journal of Quantum Electronics 48 (9), 1169-1176, 2012 | 62 | 2012 |
| Chip and package-related degradation of high power white LEDs M Meneghini, M Dal Lago, N Trivellin, G Mura, M Vanzi, G Meneghesso, ... Microelectronics Reliability 52 (5), 804-812, 2012 | 60 | 2012 |
| Thermally activated degradation of remote phosphors for application in LED lighting M Meneghini, M Dal Lago, N Trivellin, G Meneghesso, E Zanoni IEEE Transactions on Device and Materials Reliability 13 (1), 316-318, 2012 | 56 | 2012 |
| Degradation of InGaN-based laser diodes analyzed by means of electrical and optical measurements M Meneghini, N Trivellin, K Orita, S Takigawa, T Tanaka, D Ueda, ... Applied Physics Letters 97 (26), 2010 | 55 | 2010 |
| Analysis of defect-related localized emission processes in InGaN/GaN-based LEDs M Meneghini, S Vaccari, N Trivellin, D Zhu, C Humphreys, R Butendheich, ... IEEE transactions on electron devices 59 (5), 1416-1422, 2012 | 53 | 2012 |
| Extensive analysis of the degradation of Blu-Ray laser diodes M Meneghini, G Meneghesso, N Trivellin, E Zanoni, K Orita, M Yuri, ... IEEE Electron Device Letters 29 (6), 578-581, 2008 | 46 | 2008 |
| Defects and reliability of GaN‐based LEDs: review and perspectives M Buffolo, A Caria, F Piva, N Roccato, C Casu, C De Santi, N Trivellin, ... physica status solidi (a) 219 (8), 2100727, 2022 | 43 | 2022 |
| UV-based technologies for SARS-CoV2 inactivation: Status and perspectives N Trivellin, F Piva, D Fiorimonte, M Buffolo, C De Santi, VT Orlandi, ... Electronics 10 (14), 1703, 2021 | 38 | 2021 |
| CdTe solar cells: technology, operation and reliability M Barbato, E Artegiani, M Bertoncello, M Meneghini, N Trivellin, ... Journal of Physics D: Applied Physics 54 (33), 333002, 2021 | 35 | 2021 |
| Extensive analysis of the degradation of phosphor-converted LEDs M Meneghini, LR Trevisanello, F De Zuani, N Trivellin, G Meneghesso, ... Ninth International Conference on Solid State Lighting 7422, 82-93, 2009 | 35 | 2009 |
| Inactivating SARS-CoV-2 using 275 nm UV-C LEDs through a spherical irradiation box: Design, characterization and validation N Trivellin, M Buffolo, F Onelia, A Pizzolato, M Barbato, VT Orlandi, ... Materials 14 (9), 2315, 2021 | 33 | 2021 |
| Degradation mechanisms of high-power white LEDs activated by current and temperature M Dal Lago, M Meneghini, N Trivellin, G Meneghesso, E Zanoni Microelectronics Reliability 51 (9-11), 1742-1746, 2011 | 33 | 2011 |
| Degradation of InGaN-based laser diodes related to nonradiative recombination M Meneghini, N Trivellin, K Orita, S Takigawa, M Yuri, T Tanaka, D Ueda, ... IEEE electron device letters 30 (4), 356-358, 2009 | 29 | 2009 |
Matteo MeneghiniFull Professor at the University of PadovaDirección de correo verificada de dei.unipd.it
