| Apparatus and measurement procedure for the fast, quantitative, non-contact topographic investigation of semiconductor wafers and other mirror like surfaces IE Lukács, J Makai, L Pfitzner, F Riesz, B Szentpali US Patent 7,133,140, 2006 | 108 | 2006 |
| Geometrical optical model of the image formation in Makyoh (magic-mirror) topography F Riesz Journal of Physics D: Applied Physics 33 (23), 3033, 2000 | 72 | 2000 |
| Lattice misfit and relative tilt of lattice planes in semiconductor heterostructures A Pesek, K Hingerl, F Riesz, K Lischka Semiconductor science and technology 6 (7), 705, 1991 | 54 | 1991 |
| Crystallographic tilting in high‐misfit (100) semiconductor heteroepitaxial systems F Riesz Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 14 (2 …, 1996 | 48 | 1996 |
| Crystallographic tilting in lattice‐mismatched heteroepitaxy: A Dodson–Tsao relaxation approach F Riesz Journal of applied physics 79 (8), 4111-4117, 1996 | 38 | 1996 |
| A Transient Method for Measuring Current–Voltage Characteristics with Negative Differential Resistance Regions L Dozsa, F Riesz, J Karányi, V Van Tuyen, B Szentpáli, A Muller physica status solidi (a) 163 (1), R1-R2, 1997 | 34 | 1997 |
| Tilting of lattice planes in InP epilayers grown on miscut GaAs substrates: the effect of initial growth conditions F Riesz, K Lischka, K Rakennus, T Hakkarainen, A Pesek Journal of crystal growth 114 (1-2), 127-132, 1991 | 33 | 1991 |
| Makyoh topography: a simple yet powerful optical method for flatness and defect characterization of mirror-like surfaces F Riesz Optical Micro-and Nanometrology in Manufacturing Technology 5458, 86-100, 2004 | 30 | 2004 |
| Makyoh topography for the morphological study of compound semiconductor wafers and structures F Riesz Materials Science and Engineering: B 80 (1-3), 220-223, 2001 | 26 | 2001 |
| Ion implantation modified stainless steel as a substrate for hydroxyapatite deposition. Part I. Surface modification and characterization L Pramatarova, E Pecheva, V Krastev, F Riesz Journal of Materials Science: Materials in Medicine 18, 435-440, 2007 | 23 | 2007 |
| Thermal decomposition of bulk and heteroepitaxial (100) InP surfaces: A combined in situ scanning electron microscopy and mass spectrometric study F Riesz, L Dobos, J Karanyi Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1998 | 23 | 1998 |
| Mapping of Bragg-surface diffraction of InP/GaAs (1 0 0) structure LH Avanci, MA Hayashi, LP Cardoso, SL Morelhão, F Riesz, K Rakennus, ... Journal of crystal growth 188 (1-4), 220-224, 1998 | 21 | 1998 |
| Makyoh topography: curvature measurements and implications for the image formation J Szabó, FRF Riesz, BSB Szentpáli Japanese journal of applied physics 35 (2B), L258, 1996 | 21 | 1996 |
| Thermal decomposition of InP surfaces: volatile component loss, morphological changes, and pattern formation F Riesz, L Dobos, C Vignali, C Pelosi Materials Science and Engineering: B 80 (1-3), 54-59, 2001 | 20 | 2001 |
| Thermo-mechanical design and characterization of low dissipation micro-hotplates operated above 500° C F Biró, C Dücső, Z Hajnal, F Riesz, AE Pap, I Bársony Microelectronics Journal 45 (12), 1822-1828, 2014 | 19 | 2014 |
| Carrier profiling of a heterojunction bipolar transistor and p–i–n photodiode structures by electrochemical C–V technique R Kinder, Á Nemcsics, R Harman, F Riesz, B Pécz physica status solidi (a) 175 (2), 631-636, 1999 | 19 | 1999 |
| Rotated tilting in lattice-mismatched heteroepitaxial systems F Riesz Journal of crystal growth 140 (1-2), 213-218, 1994 | 19 | 1994 |
| Camera length and field of view in Makyoh-topography instruments F Riesz Review of Scientific Instruments 72 (2), 1591-1593, 2001 | 18 | 2001 |
| Makyoh Topography for the Study of Large‐Area Extended Defects in Semiconductors F Riesz physica status solidi (a) 171 (1), 403-409, 1999 | 18 | 1999 |
| Can epilayer tilt relieve misfit strain in lattice-mismatched heterostructures? F Riesz Vacuum 46 (8-10), 1021-1023, 1995 | 18 | 1995 |
